title: Single-particle evanescent light scattering simulations for total internal reflection microscopy.
abstract: We simulate and measure light scattering of a micrometer-sized spherical particle suspended in solution close to a glass substrate. The model, based on the discrete sources method, is developed to describe the experimental situation of total internal reflection microscopy experiments; i.e., the particle is illuminated by an evanescent light field originating from the glass-solvent interface. In contrast to the well-established assumption of a simple exponential decay of the scattering intensity with distance, we demonstrate significant deviations for a certain range of penetration depths and polarization states of the incident light.
authors.affiliation: Physikalisches Institut, Universität Stuttgart, Stuttgart, Germany. L.Helden@physik.uni-stuttgart.de
authors.forename: Laurent
authors.initials: L
authors.lastname: Helden
authors.forename: Elena
authors.initials: E
authors.lastname: Eremina
authors.forename: Norbert
authors.initials: N
authors.lastname: Riefler
authors.forename: Christopher
authors.initials: C
authors.lastname: Hertlein
authors.forename: Clemens
authors.initials: C
authors.lastname: Bechinger
authors.forename: Yuri
authors.initials: Y
authors.lastname: Eremin
authors.forename: Thomas
authors.initials: T
authors.lastname: Wriedt
mesh_terms: D000465:Algorithms; D003102:Colloids / Q000737:chemistry*; D003198:Computer Simulation; D007089:Image Enhancement / Q000379:methods*; D007090:Image Interpretation, Computer-Assisted / Q000379:methods*; D008027:Light; D008853:Microscopy / Q000379:methods*; D008956:Models, Chemical; D010316:Particle Size; D012031:Refractometry / Q000379:methods*; D015203:Reproducibility of Results; D012542:Scattering, Radiation; D012680:Sensitivity and Specificity
chemical_list: D003102:Colloids