title: Manipulation, dissection, and lithography using modified tapping mode atomic force microscope.
abstract: A modified tapping mode of the atomic force microscope (AFM) was introduced for manipulation, dissection, and lithography. By sufficiently decreasing the amplitude of AFM tip in the normal tapping mode and adjusting the setpoint, the tip-sample interaction can be efficiently controlled. This modified tapping mode has some characteristics of the AFM contact mode and can be used to manipulate nanoparticles, dissect biomolecules, and make lithographs on various surfaces. This method did not need any additional equipment and it can be applied to any AFM system.
authors.affiliation: State Key Laboratory of Electroanalytical Chemistry, Changchun Institute of Applied Chemistry, Graduate School of the Chinese Academy of Sciences, Chinese Academy of Sciences, Changchun, China.
authors.forename: Zhiguo
authors.initials: Z
authors.lastname: Liu
authors.forename: Zhuang
authors.initials: Z
authors.lastname: Li
authors.forename: Gang
authors.initials: G
authors.lastname: Wei
authors.forename: Yonghai
authors.initials: Y
authors.lastname: Song
authors.forename: Li
authors.initials: L
authors.lastname: Wang
authors.forename: Lanlan
authors.initials: L
authors.lastname: Sun
mesh_terms: D004210:Dissection; D006046:Gold; D018625:Microscopy, Atomic Force / Q000379:methods*; D049329:Nanostructures / Q000648:ultrastructure*; D036103:Nanotechnology / Q000379:methods*; D010957:Plasmids / Q000648:ultrastructure; D011137:Polystyrenes
chemical_list: D011137:Polystyrenes; D006046:Gold