Slanted hole array beam profiler (SHArP)-a high-resolution portable beam profiler based on a linear aperture array.
We demonstrate a novel high-resolution portable beam profiler based on a slanted linear array of small apertures, termed a slanted hole array beam profiler (SHArP). The apertures are directly fabricated on a metal-coated CMOS imaging sensor. With a single linear scan, the aperture array can establish a virtual grid of sampling points for beam profiling. With our prototype, we demonstrate beam profiling of Gaussian beams over an area of 66.5 microm x 66.5 microm with a resolution of 0.8 microm (compare with the CMOS pixel size of 10 microm). The resolution can be improved into the range of submicrometers by fabricating smaller apertures. The good correspondence between the measured and calculated beam profiles proves the fidelity of our new beam profiling scheme.
Cui
Xiquan
X
Department of Electrical Engineering, California Institute of Technology, Pasadena, California 91125, USA. xiqua@caltech.edu
Heng
Xin
X
Wu
Jigang
J
Yaqoob
Zahid
Z
Scherer
Axel
A
Psaltis
Demetri
D
Yang
Changhuei
C