title: Strategies for data collection and calibration with a pinhole-geometry SAXS instrument on a synchrotron beamline.
abstract: Undulator X-ray sources on third-generation synchrotrons have pushed small-angle X-ray scattering (SAXS) to the forefront of techniques in nanoscience and technology. With higher X-ray fluxes and improved focusing, it is usually the scattered intensity detector that places the most serious limitations on the overall capabilities of the instrument. Incorporating relatively simple components like point detectors, scattering standards, masking filters and in-line sample visualization into the flight tube of a pinhole-geometry SAXS camera can do much to mitigate these limitations. How these enhancements can be incorporated into routine data collection is demonstrated on the ChemMatCARS SAXS instrument, which utilizes pinhole geometry with an undulator insertion device at sector 15 of the Advanced Photon Source. In addition, with an X-ray energy range of 6-32 keV (2.0-0.4 A) and an energy resolution of 10(-4) DeltaE/E, this instrument can measure anomalous SAXS over a wide variety of atom species, with reliable normalization of scattered data.
authors.affiliation: ChemMatCARS, Advanced Photon Source, Argonne National Laboratory, Argonne, IL, USA. cookson@cars.uchicago.edu
authors.forename: David
authors.initials: D
authors.lastname: Cookson
authors.forename: Nigel
authors.initials: N
authors.lastname: Kirby
authors.forename: Robert
authors.initials: R
authors.lastname: Knott
authors.forename: Myungae
authors.initials: M
authors.lastname: Lee
authors.forename: David
authors.initials: D
authors.lastname: Schultz
mesh_terms: D002138:Calibration; D016208:Databases, Factual; D005374:Filtration / Q000295:instrumentation* / Q000592:standards; D016247:Information Storage and Retrieval / Q000379:methods* / Q000592:standards; D055095:Optics and Photonics / Q000295:instrumentation*; D015203:Reproducibility of Results; D053838:Scattering, Small Angle; D012680:Sensitivity and Specificity; D017356:Synchrotrons / Q000295:instrumentation* / Q000592:standards; D014961:X-Ray Diffraction / Q000295:instrumentation* / Q000379:methods / Q000592:standards