title: Atomic force microscopy of microbial cells: application to nanomechanical properties, surface forces and molecular recognition forces.
abstract: In recent years, the physical properties and interaction forces of microbial cell surfaces have been extensively studied using atomic force microscopy (AFM). A variety of AFM force spectroscopy approaches have been developed for investigating native cell surfaces with piconewton (nanonewton) sensitivity and nanometer lateral resolution, providing novel information on the nanomechanical properties of cell walls, on surface forces such as van der Waals and electrostatic forces, solvation and steric/bridging forces, and on the forces and localization of molecular recognition events. The intention of this article is to survey these different applications and to discuss related methodologies (how to prepare tips and samples, how to record and interpret force curves).
authors.affiliation: Laboratoire de Chimie Physique et Microbiologie pour l'Environnement, Nancy-Université, CNRS, 405 rue de Vandoeuvre, F-54600 Villers-lès-Nancy, France. gaboriaud@lcpme.cnrs-nancy.fr
authors.forename: Fabien
authors.initials: F
authors.lastname: Gaboriaud
authors.forename: Yves F
authors.initials: YF
authors.lastname: Dufrêne
mesh_terms: D000818:Animals; D001422:Bacterial Adhesion; D018625:Microscopy, Atomic Force / Q000295:instrumentation* / Q000379:methods*; D049329:Nanostructures / Q000648:ultrastructure*; D012441:Saccharomyces cerevisiae / Q000648:ultrastructure; D020614:Shewanella putrefaciens / Q000648:ultrastructure; D013499:Surface Properties