title: Patterning of cantilevers with inverted dip-pen nanolithography: efforts toward combinatorial AFM.
abstract: We report patterning of AFM cantilevers by inverted dip-pen nanolithography, thereby markedly enhancing the development of combinatorial AFM as a high-throughput force-measuring instrument capable of determining interactions between opposing libraries of biomolecules.
authors.affiliation: Department of Chemistry, University of Alberta, Edmonton, Alberta CanadaT6G-2G2.
authors.forename: Shiau-Yin
authors.initials: SY
authors.lastname: Wu
authors.forename: Richard
authors.initials: R
authors.lastname: Berkenbosch
authors.forename: Andrea
authors.initials: A
authors.lastname: Lui
authors.forename: John-Bruce D
authors.initials: JB
authors.lastname: Green
mesh_terms: D004867:Equipment Design; D018625:Microscopy, Atomic Force / Q000295:instrumentation* / Q000379:methods; D008855:Microscopy, Electron, Scanning; D036103:Nanotechnology; D013499:Surface Properties