Patterning of cantilevers with inverted dip-pen nanolithography: efforts toward combinatorial AFM.
We report patterning of AFM cantilevers by inverted dip-pen nanolithography, thereby markedly enhancing the development of combinatorial AFM as a high-throughput force-measuring instrument capable of determining interactions between opposing libraries of biomolecules.
Wu
Shiau-Yin
SY
Department of Chemistry, University of Alberta, Edmonton, Alberta CanadaT6G-2G2.
Berkenbosch
Richard
R
Lui
Andrea
A
Green
John-Bruce D
JB
D004867:Equipment Design; D018625:Microscopy, Atomic Force / Q000295:instrumentation* / Q000379:methods; D008855:Microscopy, Electron, Scanning; D036103:Nanotechnology; D013499:Surface Properties