Transient charge accumulation in a capacitive self-assembled monolayer.
Charge accumulation in an organosilane monolayer self-assembled on silicon is studied using electron-spectroscopy-based chemically resolved electrical measurements (CREM). By resolving the net electrical response of the organic layer, a significant capability of holding extra charge is indicated. Quantum size effects at a molecularly thin layer and the role of competing discharge mechanisms, including defect-assisted leakage currents, are discussed.
Cohen
Hagai
H
Department of Chemical Research Support, The Weizmann Institiute of Science, Rehovot 76100, Israel. hagai.cohen@weizmann.ac.il
Maoz
Rivka
R
Sagiv
Jacob
J
D004553:Electric Conductivity; D004563:Electrochemistry; D008422:Materials Testing; D008567:Membranes, Artificial; D010316:Particle Size; D012680:Sensitivity and Specificity; D012821:Silanes / Q000737:chemistry*; D012825:Silicon / Q000737:chemistry*; D013053:Spectrophotometry / Q000295:instrumentation / Q000379:methods; D013499:Surface Properties; D013997:Time Factors; D014965:X-Rays
D008567:Membranes, Artificial; D012821:Silanes; D012825:Silicon