title: Structural contributions to charge transport across Ni-octanedithiol multilayer junctions.
abstract: We report the fabrication and characterization of multilayer thin films incorporating 1,8-octanedithiols and Ni atoms. Low-temperature charge transport measurements exhibit inelastic co-tunneling and resonant tunneling features that correspond energetically to vibrational excitations of the molecular multilayer. Several junctions exhibit changes in conductance features characteristic of charge defect-gating. Transport through our junctions is shown to be dominated by the intrinsic properties of the multilayer.
authors.affiliation: National Institute of Standards and Technology, Gaithersburg, Maryland 20899, USA.
authors.forename: Lam H
authors.initials: LH
authors.lastname: Yu
authors.forename: Christopher D
authors.initials: CD
authors.lastname: Zangmeister
authors.forename: James G
authors.initials: JG
authors.lastname: Kushmerick
mesh_terms: D004579:Electron Transport; D008567:Membranes, Artificial; D016252:Microscopy, Scanning Tunneling; D009532:Nickel / Q000737:chemistry*; D009942:Organometallic Compounds / Q000737:chemistry*; D012680:Sensitivity and Specificity; D013053:Spectrophotometry / Q000379:methods; D017550:Spectroscopy, Fourier Transform Infrared / Q000379:methods; D013438:Sulfhydryl Compounds / Q000737:chemistry*; D013696:Temperature; D014732:Vibration; D014965:X-Rays
chemical_list: D008567:Membranes, Artificial; D009942:Organometallic Compounds; D013438:Sulfhydryl Compounds; D009532:Nickel; C516316:1,8-octanedithiol