A method of combining STEM image with parallel beam diffraction and electron-optical conditions for diffractive imaging.
We describe a method of combining STEM imaging functionalities with nanoarea parallel beam electron diffraction on a modern TEM. This facilitates the search for individual particles whose diffraction patterns are needed for diffractive imaging or structural studies of nanoparticles. This also lays out a base for 3D diffraction data collection.
He
Haifeng
H
Department of Physics and Astronomy, Arizona State University, Tempe, AZ 85287-1504, USA. haifenghe@gmail.com
Nelson
Chris
C