title: Preparation and characterization of copper-doped cobalt oxide electrodes.
abstract: Cobalt oxide (Co3O4) and copper-doped cobalt oxide (CuxCo(3-x)O4) films have been prepared onto titanium support by the thermal decomposition method. The electrodes have been characterized by different techniques such as cyclic voltammetry, scanning electron microscopy, X-ray diffraction, and X-ray photoelectron spectroscopy (XPS). The effect on the electrochemical and crystallographic properties and surface morphology of the amount of copper in the oxide layer has been analyzed. The XPS spectra correspond to a characteristic monophasic Cu-Co spinel oxides when x is below 1. However, when the copper content exceeds that for the stoichiometric CuCo2O4 spinel, a new CuO phase segregates at the surface. The analysis of the surface cation distribution indicates that Cu(II) has preference for octahedral sites.
authors.affiliation: Departamento de Química Física e Instituto Universitario de Materiales, Universidad de Alicante, Apartado 99, E-03080 Alicante, Spain.
authors.forename: A La
authors.initials: AL
authors.lastname: Rosa-Toro
authors.forename: R
authors.initials: R
authors.lastname: Berenguer
authors.forename: C
authors.initials: C
authors.lastname: Quijada
authors.forename: F
authors.initials: F
authors.lastname: Montilla
authors.forename: E
authors.initials: E
authors.lastname: Morallón
authors.forename: J L
authors.initials: JL
authors.lastname: Vazquez
mesh_terms: D002413:Cations, Divalent; D003035:Cobalt / Q000737:chemistry*; D003300:Copper / Q000737:chemistry*; D004563:Electrochemistry; D004566:Electrodes; D004577:Electron Probe Microanalysis; D008855:Microscopy, Electron, Scanning; D036103:Nanotechnology / Q000379:methods*; D010087:Oxides / Q000737:chemistry*; D013052:Spectrometry, X-Ray Emission; D014961:X-Ray Diffraction
chemical_list: D002413:Cations, Divalent; D010087:Oxides; D003035:Cobalt; D003300:Copper; C000520:cuprous oxide; C060728:cobalt oxide