title: Emission factors of air toxics from semiconductor manufacturing in Korea.
abstract: The development of local, accurate emission factors is very important for the estimation of reliable national emissions and air quality management. For that, this study is performed for pollutants released to the atmosphere with source-specific emission tests from the semiconductor manufacturing industry. The semiconductor manufacturing industry is one of the major sources of air toxics or hazardous air pollutants (HAPs); thus, understanding the emission characteristics of the emission source is a very important factor in the development of a control strategy. However, in Korea, there is a general lack of information available on air emissions from the semiconductor industry. The major emission sources of air toxics examined from the semiconductor manufacturing industry were wet chemical stations, coating applications, gaseous operations, photolithography, and miscellaneous devices in the wafer fabrication and semiconductor packaging processes. In this study, analyses of emission characteristics, and the estimations of emission data and factors for air toxics, such as acids, bases, heavy metals, and volatile organic compounds from the semiconductor manufacturing process have been performed. The concentration of hydrogen chloride from the packaging process was the highest among all of the processes. In addition, the emission factor of total volatile organic compounds (TVOCs) for the packaging process was higher than that of the wafer fabrication process. Emission factors estimated in this study were compared with those of Taiwan for evaluation, and they were found to be of similar level in the case of TVOCs and fluorine compounds.
authors.affiliation: Division of Air Pollution Engineering, Department of Air Quality Research, National Institute of Environmental Research, Ministry of Environment, Incheon, Republic of Korea.
authors.forename: Yun-Sung
authors.initials: YS
authors.lastname: Eom
authors.forename: Ji-Hyung
authors.initials: JH
authors.lastname: Hong
authors.forename: Suk-Jo
authors.initials: SJ
authors.lastname: Lee
authors.forename: Eun-Jung
authors.initials: EJ
authors.lastname: Lee
authors.forename: Jun-Seok
authors.initials: JS
authors.lastname: Cha
authors.forename: Dae-Gyun
authors.initials: DG
authors.lastname: Lee
authors.forename: Sun-Ae
authors.initials: SA
authors.lastname: Bang
mesh_terms: D000393:Air Pollutants / Q000032:analysis*; D000397:Air Pollution / Q000517:prevention & control; D004784:Environmental Monitoring / Q000379:methods; D007221:Industry / Q000592:standards; D007723:Korea; D012666:Semiconductors
chemical_list: D000393:Air Pollutants