title: Electron-beam-induced topographical, chemical, and structural patterning of amorphous titanium oxide films.
abstract: Electrolytically deposited amorphous TiO2 films on steel are remarkably sensitive to electron beam (e-beam) irradiation at moderate energies at 20 keV, resulting in controlled local oxide reduction and crystallization, opening the possibility for local topographical, chemical, and structural modifications within a biocompatible, amorphous, and semiconducting matrix. The sensitivity is shown to vary significantly with the annealing temperature of as-deposited films. Well-defined irradiation conditions in terms of probe current IP (5 microA) and beam size were achieved with an electron probe microanalyzer. As shown by atomic force and optical microscopy, micro-Raman spectroscopy, wavelength-dispersive X-ray (WDX), and Auger analyses, e-beam exposure below 1 Acm-2 immediately leads to electron-stimulated oxygen desorption, resulting in a well-defined volume loss primarily limited to the irradiated zone under the electron probe and in a blue color shift in this zone because of the presence of Ti2O3. Irradiation at 5 Acm(-2) (IP = 5 microA) results in local crystallization into anatase phase within 1 s of exposure and in reduction to TiO after an extended exposure of 60 s. Further reduction to the metallic state could be observed after 60 s of exposure at approximately 160 Acm(-2). The local reduction could be qualitatively sensed with WDX analysis and Auger line scans. An estimation of the film temperature in the beam center indicates that crystallization occurs at less than 150 degrees C, well below the atmospheric crystallization temperature of the present films. The high e-beam sensitivity in combination with the well-defined volume loss from oxygen desorption allows for precise electron lithographic topographical patterning of the present oxides. Irradiation effects leading to the observed reduction and crystallization phenomena under moderate electron energies are discussed.
authors.affiliation: Empa, Materials Technology Laboratory, Feuerwerkerstrasse 39, CH-3602 Thun, Switzerland. philippe.kern@empa.ch
authors.forename: P
authors.initials: P
authors.lastname: Kern
authors.forename: Y
authors.initials: Y
authors.lastname: Müller
authors.forename: J
authors.initials: J
authors.lastname: Patscheider
authors.forename: J
authors.initials: J
authors.lastname: Michler
mesh_terms: D001672:Biocompatible Materials / Q000737:chemistry*; D003460:Crystallization; D004583:Electrons; D008422:Materials Testing; D018625:Microscopy, Atomic Force; D008855:Microscopy, Electron, Scanning; D010084:Oxidation-Reduction; D010100:Oxygen / Q000737:chemistry; D013499:Surface Properties; D013696:Temperature; D014025:Titanium / Q000737:chemistry*; D014961:X-Ray Diffraction
chemical_list: D001672:Biocompatible Materials; C009495:titanium dioxide; D014025:Titanium; D010100:Oxygen