title: Inverse scattering for high-resolution interferometric microscopy.
abstract: We extend the applicability of inverse scattering for optical coherence tomography (OCT) to the case of high numerical aperture focusing optics. We include the effects of tight focusing so that the approach is applicable to any interferometric microscopy method. The applicability to modalities, such as OCT and optical coherence microscopy, enables computed reconstruction of three-dimensional volumes from en face temporal ranging data. Simulations show that the computed structure outside of the focal plane exhibits spatially invariant resolution on par with the resolution achieved at the focal plane.
authors.affiliation: Beckman Institute for Advanced Science and Technology, Department of Electrical and Computer Engineering, University of Illinois at Urbana-Champaign, Urbana, Illinois 61801, USA. tralston@engineering.uiuc.edu
authors.forename: Tyler S
authors.initials: TS
authors.lastname: Ralston
authors.forename: Daniel L
authors.initials: DL
authors.lastname: Marks
authors.forename: Stephen A
authors.initials: SA
authors.lastname: Boppart
authors.forename: P Scott
authors.initials: PS
authors.lastname: Carney
mesh_terms: D000465:Algorithms; D007089:Image Enhancement / Q000379:methods*; D007090:Image Interpretation, Computer-Assisted / Q000379:methods*; D021621:Imaging, Three-Dimensional / Q000379:methods*; D008857:Microscopy, Interference / Q000379:methods*; D015203:Reproducibility of Results; D012542:Scattering, Radiation; D012680:Sensitivity and Specificity; D041623:Tomography, Optical Coherence / Q000379:methods*