title: Polarization multiplexing and demultiplexing for appearance-based modeling.
abstract: Polarization has been used in numerous prior studies for separating diffuse and specular reflectance components, but in this work we show that it also can be used to separate surface reflectance contributions from individual light sources. Our approach is called polarization multiplexing and it has a significant impact in appearance modeling where the image as a function of illumination direction is needed. Multiple unknown light sources can illuminate the scene simultaneously, and the individual contributions to the overall surface reflectance are estimated. Polarization multiplexing relies on the relationship between the light source direction and the intensity modulation. Inverting this transformation enables the individual intensity contributions to be estimated. In addition to polarization multiplexing, we show that phase histograms from the intensity modulations can be used to estimate scene properties including the number of light sources.
authors.affiliation: Johnson & Johnson, CPCW, Skillman, NJ 08558, USA. oanacula@caip.rutgers.edu
authors.forename: Oana G
authors.initials: OG
authors.lastname: Cula
authors.forename: Kristin J
authors.initials: KJ
authors.lastname: Dana
authors.forename: Dinesh K
authors.initials: DK
authors.lastname: Pai
authors.forename: Dongsheng
authors.initials: D
authors.lastname: Wang
mesh_terms: D000465:Algorithms; D007089:Image Enhancement / Q000379:methods*; D007090:Image Interpretation, Computer-Assisted / Q000379:methods*; D021621:Imaging, Three-Dimensional / Q000379:methods*; D008029:Lighting / Q000379:methods*; D008859:Microscopy, Polarization / Q000379:methods*; D010783:Photometry / Q000379:methods*; D012031:Refractometry / Q000379:methods