title: Pattern projection for subpixel resolved imaging in microscopy.
abstract: In this paper, we present a new approach providing super resolved images exceeding the geometrical limitation given by the detector pixel size of the imaging camera. The concept involves the projection of periodic patterns on top of the sample, which are then investigated under a microscope. Combining spatial scanning together with proper digital post-processing algorithm yields the improved geometrical resolution enhancement. This new method is especially interesting for microscopic imaging when the resolution of the detector is lower than the resolution due to diffraction.
authors.affiliation: School of Engineering, Bar-Ilan University, Ramat-Gan 52900, Israel.
authors.forename: Dror
authors.initials: D
authors.lastname: Fixler
authors.forename: Javier
authors.initials: J
authors.lastname: Garcia
authors.forename: Zeev
authors.initials: Z
authors.lastname: Zalevsky
authors.forename: Aryeh
authors.initials: A
authors.lastname: Weiss
authors.forename: Mordechai
authors.initials: M
authors.lastname: Deutsch