title: Characterization of disorder in semiconductors via single-photon interferometry.
abstract: The method of angular photonic correlations of spontaneous emission is introduced as an experimental, purely optical scheme to characterize disorder in semiconductor nanostructures. The theoretical expression for the angular correlations is derived and numerically evaluated for a model system. The results demonstrate how the proposed experimental method yields direct information about the spatial distribution of the relevant states and thus on the disorder present in the system.
authors.affiliation: Department of Physics and Material Sciences Center, Philipps-Universität Marburg, D-35032, Marburg, Germany.
authors.forename: P
authors.initials: P
authors.lastname: Bozsoki
authors.forename: P
authors.initials: P
authors.lastname: Thomas
authors.forename: M
authors.initials: M
authors.lastname: Kira
authors.forename: W
authors.initials: W
authors.lastname: Hoyer
authors.forename: T
authors.initials: T
authors.lastname: Meier
authors.forename: S W
authors.initials: SW
authors.lastname: Koch
authors.forename: K
authors.initials: K
authors.lastname: Maschke
authors.forename: I
authors.initials: I
authors.lastname: Varga
authors.forename: H
authors.initials: H
authors.lastname: Stolz