title: Real time observation of GeSi/Si(001) island shrinkage due to surface alloying during Si capping.
abstract: The Si capping of Ge/Si(001) islands was observed by in situ time-resolved transmission electron microscopy. During the initial stages of the Si deposition, islands were observed not only to flatten but also to shrink in volume. This unexpected shrinkage is explained by taking into account the intermixing of the deposited Si with the wetting layer and a consequently induced diffusion of Ge from the islands into the wetting layer. A model of the capping process which takes into account Ge diffusion is presented which is in good agreement with the experimental data.
authors.affiliation: Department of Materials, University of Oxford, Parks Road, Oxford OX1 3PH, United Kingdom.
authors.forename: C
authors.initials: C
authors.lastname: Lang
authors.forename: S
authors.initials: S
authors.lastname: Kodambaka
authors.forename: F M
authors.initials: FM
authors.lastname: Ross
authors.forename: D J H
authors.initials: DJ
authors.lastname: Cockayne