title: Fluorescent image correlation for nanoscale deformation measurements.
authors.affiliation: Department of Theoretical and Applied Mechanics, University of Illinois Urbana-Champaign, Urbana, IL 61801, USA.
authors.forename: Thomas A
authors.initials: TA
authors.lastname: Berfield
authors.forename: Jay K
authors.initials: JK
authors.lastname: Patel
authors.forename: Robert G
authors.initials: RG
authors.lastname: Shimmin
authors.forename: Paul V
authors.initials: PV
authors.lastname: Braun
authors.forename: John
authors.initials: J
authors.lastname: Lambros
authors.forename: Nancy R
authors.initials: NR
authors.lastname: Sottos
mesh_terms: D000465:Algorithms; D004548:Elasticity; D006245:Hardness Tests / Q000379:methods*; D007090:Image Interpretation, Computer-Assisted / Q000379:methods*; D008422:Materials Testing / Q000379:methods*; D008856:Microscopy, Fluorescence / Q000379:methods*; D049329:Nanostructures / Q000737:chemistry* / Q000648:ultrastructure*; D013314:Stress, Mechanical