title: Investigating the effects of reduced size on the properties of ferroelectrics.
abstract: A series of experiments has been undertaken to understand more about the fundamental origin of the thickness-induced permittivity collapse often observed in conventional thin film ferroelectric heterostructures. The various experiments are discussed, highlighting the eventual need to examine permittivity collapse in thin film single crystal material. It has been seen that dielectric collapse is not a direct consequence of reduced size, and neither is it a consequence of unavoidable physics associated with the ferroelectric-electrode boundary. Research on three-dimensional shape-constrained ferroelectrics, emphasizing self-assembled structures based on nanoporous alumina templates and on FIB-milled single crystals, is also presented, and appears to represent an exciting area for ongoing research.
authors.affiliation: Department of Physics and Astrononmy, Queen's University Belfast, Belfast, BT71NN, UK.
authors.forename: Mohamed M
authors.initials: MM
authors.lastname: Saad
authors.forename: Paul
authors.initials: P
authors.lastname: Baxter
authors.forename: Jonny
authors.initials: J
authors.lastname: McAneney
authors.forename: Akeela
authors.initials: A
authors.lastname: Lookman
authors.forename: Lesley J
authors.initials: LJ
authors.lastname: Sinnamon
authors.forename: Paul
authors.initials: P
authors.lastname: Evans
authors.forename: Alina
authors.initials: A
authors.lastname: Schilling
authors.forename: Tim
authors.initials: T
authors.lastname: Adams
authors.forename: Xinhua
authors.initials: X
authors.lastname: Zhu
authors.forename: Robert J
authors.initials: RJ
authors.lastname: Pollard
authors.forename: Robert M
authors.initials: RM
authors.lastname: Bowman
authors.forename: J Marty
authors.initials: JM
authors.lastname: Gregg
authors.forename: Dong Jin
authors.initials: DJ
authors.lastname: Jung
authors.forename: Finlay D
authors.initials: FD
authors.lastname: Morrison
authors.forename: James F
authors.initials: JF
authors.lastname: Scott
mesh_terms: D003198:Computer Simulation; D017097:Electric Impedance; D004563:Electrochemistry / Q000295:instrumentation / Q000379:methods*; D004574:Electromagnetic Fields; D008422:Materials Testing; D008956:Models, Chemical; D049329:Nanostructures / Q000737:chemistry* / Q000528:radiation effects / Q000648:ultrastructure*; D010316:Particle Size