title: Near-edge X-ray absorption fine structure spectroscopy as a tool for investigating nanomaterials.
abstract: We have demonstrated near-edge X-ray absorption fine structure (NEXAFS) spectroscopy as a particularly useful and effective technique for simultaneously probing the surface chemistry, surface molecular orientation, degree of order, and electronic structure of carbon nanotubes and related nanomaterials. Specifically, we employ NEXAFS in the study of single-walled carbon nanotube and multi-walled carbon nanotube powders, films, and arrays, as well as of boron nitride nanotubes. We have focused on the advantages of NEXAFS as an exciting, complementary tool to conventional microscopy and spectroscopy for providing chemical and structural information about nanoscale samples.
authors.affiliation: Department of Chemistry, State University of New York at Stony Brook, Stony Brook, NY 11794-3400, USA.
authors.forename: Tirandai
authors.initials: T
authors.lastname: Hemraj-Benny
authors.forename: Sarbajit
authors.initials: S
authors.lastname: Banerjee
authors.forename: Sharadha
authors.initials: S
authors.lastname: Sambasivan
authors.forename: Mahalingam
authors.initials: M
authors.lastname: Balasubramanian
authors.forename: Daniel A
authors.initials: DA
authors.lastname: Fischer
authors.forename: Gyula
authors.initials: G
authors.lastname: Eres
authors.forename: Alexander A
authors.initials: AA
authors.lastname: Puretzky
authors.forename: David B
authors.initials: DB
authors.lastname: Geohegan
authors.forename: Douglas H
authors.initials: DH
authors.lastname: Lowndes
authors.forename: Weiqiang
authors.initials: W
authors.lastname: Han
authors.forename: James A
authors.initials: JA
authors.lastname: Misewich
authors.forename: Stanislaus S
authors.initials: SS
authors.lastname: Wong
mesh_terms: D003461:Crystallography / Q000379:methods*; D008422:Materials Testing / Q000379:methods*; D008968:Molecular Conformation; D049329:Nanostructures / Q000737:chemistry* / Q000648:ultrastructure*; D036103:Nanotechnology / Q000379:methods*; D053838:Scattering, Small Angle; D013052:Spectrometry, X-Ray Emission / Q000379:methods*; D013499:Surface Properties