KTa0.6Nb0.4O3 ferroelectric thin film behavior at microwave frequencies for tunable applications.
In this study about the relationships between structural and microwave electrical properties of KTa(1-x)NbxO3 (KTN) ferroelectric materials, a KTN thin film was deposited on different substrates to investigate how KTN growth affects the microwave behavior. Interdigital capacitors and stubs were made on these films through a simple engraving process. Microwave measurements under a static electric field showed the importance of the substrate on the circuit behavior and, notably, on the tuning factor.
Laur
Vincent
V
LEST-UBO/ENSTBr, UMR CNRS 6165, 29238 Brest, France. vincent.laur@univ-brest.fr
Rousseau
Anthony
A
Tanné
Gérard
G
Laurent
Paul
P
Députier
Stéphanie
S
Guilloux-Viry
Maryline
M
Huret
Fabrice
F
D017610:Calcium Compounds / Q000737:chemistry* / Q000528:radiation effects*; D017097:Electric Impedance; D004563:Electrochemistry / Q000295:instrumentation* / Q000379:methods; D004574:Electromagnetic Fields; D004867:Equipment Design; D019544:Equipment Failure Analysis; D008422:Materials Testing; D008567:Membranes, Artificial; D008872:Microwaves; D049329:Nanostructures / Q000737:chemistry* / Q000528:radiation effects* / Q000648:ultrastructure; D010087:Oxides / Q000737:chemistry* / Q000528:radiation effects*; D010316:Particle Size; D014025:Titanium / Q000737:chemistry* / Q000528:radiation effects*
D017610:Calcium Compounds; D008567:Membranes, Artificial; D010087:Oxides; C059910:perovskite; D014025:Titanium