title: Verifying DiffEXAFS measurements with differential X-ray diffraction.
abstract: Differential EXAFS (DiffEXAFS) is a novel technique for measuring atomic perturbations on a local scale. Here a complementary technique for such studies is presented: differential X-ray diffraction (DiffXRD), which may be used to independently verify DiffEXAFS results whilst using exactly the same experimental apparatus and measurement technique. A test experiment has been conducted to show that DiffXRD can be used to successfully determine the thermal expansion coefficient of SrF(2).
authors.affiliation: Department of Physics, University of Warwick, Coventry CV4 7AL, UK. m.p.ruffoni@warwick.ac.uk
authors.forename: M P
authors.initials: MP
authors.lastname: Ruffoni
authors.forename: R F
authors.initials: RF
authors.lastname: Pettifer
authors.forename: S
authors.initials: S
authors.lastname: Pascarelli
authors.forename: O
authors.initials: O
authors.lastname: Mathon
mesh_terms: D015203:Reproducibility of Results; D012542:Scattering, Radiation; D012680:Sensitivity and Specificity; D014961:X-Ray Diffraction / Q000379:methods*