Verifying DiffEXAFS measurements with differential X-ray diffraction.
Differential EXAFS (DiffEXAFS) is a novel technique for measuring atomic perturbations on a local scale. Here a complementary technique for such studies is presented: differential X-ray diffraction (DiffXRD), which may be used to independently verify DiffEXAFS results whilst using exactly the same experimental apparatus and measurement technique. A test experiment has been conducted to show that DiffXRD can be used to successfully determine the thermal expansion coefficient of SrF(2).
Ruffoni
M P
MP
Department of Physics, University of Warwick, Coventry CV4 7AL, UK. m.p.ruffoni@warwick.ac.uk
Pettifer
R F
RF
Pascarelli
S
S
Mathon
O
O
D015203:Reproducibility of Results; D012542:Scattering, Radiation; D012680:Sensitivity and Specificity; D014961:X-Ray Diffraction / Q000379:methods*