title: Rapid and accurate measurement for phase-change optical recording bits.
abstract: Conducting atomic force microscopy (CAFM) and scanning surface potential microscopy (SSPM) have been used to image the phase-change optical recording bits. Commercially available digital versatile discs (DVD) + rewritable (RW) with initialization process were measured in experiments. Comparing the measurement results of both, the measurement resolution of CAFM is far superior to that of SSPM. With the DVD + RW disc rotating at a linear speed of 3.5 m/s, appropriate writing laser power range, may be precisely identified by CAFM as 10-15 mW. This is sufficient to verify the high-resolution recording bits research method. This new method may also be applied to the development of new types of phase-change recording materials.
authors.affiliation: Department of Applied Physics, National Chiayi University, Chiayi, Taiwan, Republic of China. shchen@mail.ncyu.edu.tw
authors.forename: Sy-Hann
authors.initials: SH
authors.lastname: Chen
mesh_terms: D007091:Image Processing, Computer-Assisted / Q000295:instrumentation / Q000379:methods*; D007834:Lasers; D018625:Microscopy, Atomic Force / Q000379:methods*; D020527:Microscopy, Scanning Probe / Q000295:instrumentation / Q000379:methods*