title: Sputtering of C(60) fullerenes physisorbed on Ar, Xe, H(2)O, O(2), and C(8)F(18) matrix films studied with time-of-flight secondary ion mass spectrometry.
abstract: The ionization and fragmentation of C(60) fullerenes were investigated using matrix films covered with C(60) molecules and bombarded with 1.5-KeV He(+) ions. C(+), C(60)(+), and C(60)(++) ions were sputtered from the C(60) molecules that were physisorbed on Ar and Xe matrix films, whereas the sputtering of C(60) on the O(2) and C(8)F(18) matrix films induced an additional emission of ion adducts, such as (OC(60))(+) and (FC(60))(+), as well as the fragment ions, C(60-2n)(+) (n = 1-10). Very few ions were sputtered from the C(60) molecules that were adsorbed on the H(2)O matrix film and the Ni(111) substrate. The ions are thought to be created at the surface when C (C(60)) collides with the Ar, Xe, O, and F species via the electron-promotion mechanism, and the formation of quasi-molecules is manifested from the emission of the ion adducts. The fragmentation occurs during the interaction with the reactive species at the surface, and the delayed ionization/fragmentation of the internally excited C(60) molecules in the gas phase has negligible contribution in the present experiment. The matrix effect arises from the suppressed neutralization of the C(60)(+) ion because of the localization of a valence hole. The C(60)(+) ion undergoes neutralization on the H(2)O film because the hydrogen bond has some covalent character.
authors.affiliation: Nanoscale Materials Center, National Institute for Materials Science, 1-1 Namiki, Tsukuba, Ibaraki 305-0044, Japan. SOUDA.Ryutaro@nims.go.jp
authors.forename: Ryutaro
authors.initials: R
authors.lastname: Souda