title: Intravesical Cu-T emigration: an atypical and infrequent cause of vesical calculus.
abstract: Transuterine transvesical emigration of an intrauterine contraceptive device is a rare and uncommonly described complication of an intrauterine device. We report and describe the clinical outcome and management of one such case of intravesical intrauterine device that had become calcified leading to the erroneous diagnosis of a vesical calculus. The diagnosis was confirmed after cystoscopic visualization, lithoclasty and extraction of the calcified plaque consisting of the Cu-T. A migrated IUD is a rare and infrequent cause for the formation of secondary vesical calculi. The treating surgeon should be aware of the possibility of such episodic cases of vesical calculi occurring in the women presenting with recurrent unexplained urinary sepsis.
authors.affiliation: Professor & Senior Consultant Urologist, Division of Urology, Department of Surgery, University College of Medical Sciences, GTB Hospital, F-14 South Extension Part-2, New Delhi, India. iqbalsinghp@yahoo.co.uk
authors.forename: Iqbal
authors.initials: I
authors.lastname: Singh
mesh_terms: D000328:Adult; D005260:Female; D005548:Foreign-Body Migration / Q000150:complications*; D006801:Humans; D007435:Intrauterine Devices, Copper / Q000009:adverse effects*; D001743:Urinary Bladder; D001744:Urinary Bladder Calculi / Q000209:etiology*