Portable total reflection X-ray fluorescence spectrometer for nanogram Cr detection limit.
A portable total reflection X-ray fluorescence spectrometer is presented. The present spectrometer mainly consists of a 1.5-W X-ray tube, a waveguide type slit, a detector, and a sample carrier (a quartz optical flat), and these components are contained in an attache case-type box. Continuum X-rays emitted from the low-power X-ray tube are used for the excitation of the X-ray fluorescence, and the minimum detection limit for Cr is a few nanograms or the level of 1013 atoms/cm2.
Kunimura
Shinsuke
S
Department of Materials Science and Engineering, Kyoto University, Sakyo-ku, Kyoto, Japan. kunimur@0715.mbox.media.kyoto-u.ac.jp
Kawai
Jun
J