title: A new spectroscopic tool for surface layer analysis: multiple-angle incidence resolution spectrometry.
abstract: A series of application studies of infrared multiple-angle incidence resolution spectrometry (IR-MAIRS) have been reported since it was first proposed as a unique technique for analyzing molecular orientation in thin films on an optically transparent substrate, and both expected and unexpected benefits of IR-MAIRS have been revealed. In this review, cutting-edge application studies are summarized systematically, and the principle of MAIRS is explained from a new point of view.
authors.affiliation: Department of Chemistry, Graduate School of Science and Engineering, Tokyo Institute of Technology, 2-12-1 Ookayama, Meguro-ku, Tokyo, 152-8551, Japan. hasegawa@chem.titech.ac.jp
authors.forename: Takeshi
authors.initials: T
authors.lastname: Hasegawa