Time-of-flight secondary-ion mass spectrometry for the surface characterization of solid-state pharmaceuticals.
Time-of-flight secondary-ion mass spectrometry (ToF-SIMS) is a highly surface sensitive analytical method for surface chemical identification and surface chemical distribution analysis (mapping). Here we have explored the application of ToF-SIMS for the characterization of solid-state pharmaceuticals and highlight specific case studies concerning the distribution and stability of pharmaceutical actives within solid matrices (pellets and polymeric carriers) and the face-specific properties of pharmaceutical crystals.
Prestidge
Clive A
CA
Ian Wark Research Institute, The Australian Research Council Special Research Centre for Particle and Material Interfaces, University of South Australia, Mawson Lakes, SA 5095, Australia. clive.prestidge@unisa.edu.au
Barnes
Timothy J
TJ
Skinner
William
W
D016503:Drug Delivery Systems; D004364:Pharmaceutical Preparations / Q000737:chemistry*; D018629:Spectrometry, Mass, Secondary Ion / Q000295:instrumentation / Q000379:methods*; D013499:Surface Properties; D013678:Technology, Pharmaceutical / Q000295:instrumentation / Q000379:methods
D004364:Pharmaceutical Preparations