Spatially dispersive displacement sensor utilizing a semiconductor gain chip.
We demonstrate the development of a simply equipped displacement sensor utilizing spatially dispersive confocal technology. It feeds the amplified spontaneous emission (ASE) of a laser diode to a wavelength-selective feedback structure that corresponds to the position of a measured surface. The displacement sensor has a detecting range of 4 microm and precision of less than 2 nm, as proven by the analysis of the spectral shifts of the multipassed amplified output ASE. As compared with traditional sensors, the displacement sensor presented in our study requires fewer components and has as high precision as complex systems and a higher measurement rate due to the simpler strategy of displacement determination.
Horng
Ji-Bin
JB
Laser Application Technology Center, Industrial Technology Research Institute, Tainan County, Taiwan.
Chou
Wei-Yang
WY
Tsau
Seth
S
Liao
Jay
J
Hsu
Shih-Ming
SM
Chen
Chih-Li
CL
Chang
Kun-Chieh
KC
Su
Yan-Kuin
YK