title: Weissenberg reflection high-energy electron diffraction for surface crystallography.
abstract: The principle of a Weissenberg camera is applied to surface crystallographic analysis by reflection high-energy electron diffraction. By removing inelastic electrons and measuring hundreds of patterns as a function of sample rotation angle phi, kinematical analysis can be performed over a large volume of reciprocal space. The data set is equivalent to a three-dimensional stack of Weissenberg photographs. The method is applied to analysis of an Si(111)-square root of 3 x square root of 3-Ag surface, and the structural data obtained are in excellent agreement with the known atomic structure.
authors.affiliation: Institute of Multidisciplinary Research for Advanced Material, Tohoku University, Sendai 980-8577, Japan. abukawa@tagen.tohoku.ac.jp
authors.forename: Tadashi
authors.initials: T
authors.lastname: Abukawa
authors.forename: Tomoyuki
authors.initials: T
authors.lastname: Yamazaki
authors.forename: Kentaro
authors.initials: K
authors.lastname: Yajima
authors.forename: Koji
authors.initials: K
authors.lastname: Yoshimura