title: Noise Analysis of MREIT at 3T and 11T Field Strength.
abstract: In Magnetic Resonance Electrical Impedance Tomography (MREIT), we measure the induced magnetic flux density inside an imaging object subject to an external injection current. The magnetic flux density is contaminated with noise and this ultimately limits the quality of reconstructed conductivity and current density images. By using two methods to analyze amounts of noise in 3T and 11T MREIT systems, we found that a carefully designed MREIT study will be able to reduce the noise level below 0.1 nT.
authors.affiliation: Department of Biomedical Engineering, University of Florida, Gainesville, Florida, USA.
authors.forename: R
authors.initials: R
authors.lastname: Sadleir
authors.forename: S
authors.initials: S
authors.lastname: Zhang
authors.forename: S
authors.initials: S
authors.lastname: Grant
authors.forename: S
authors.initials: S
authors.lastname: Oh
authors.forename: B
authors.initials: B
authors.lastname: Lee
authors.forename: H
authors.initials: H
authors.lastname: Pyo
authors.forename: C
authors.initials: C
authors.lastname: Park
authors.forename: E
authors.initials: E
authors.lastname: Woo
authors.forename: S
authors.initials: S
authors.lastname: Lee
authors.forename: J
authors.initials: J
authors.lastname: Seo
authors.forename: O
authors.initials: O
authors.lastname: Kwon