title: Modeling of multilayer microholographic data storage.
abstract: We focus on the investigation of multilayer recording in microholographic data storage. We have developed a numerical model for calculating the electromagnetic scattering from thick microholographic gratings using the Born approximation and the direct volume integral. The signal-to-noise ratio and bit error rate were calculated to estimate the noise arising from interlayer and interhologram cross talk. Measurements were done to prove the validity of the model. The results of our calculations and the measurements show good agreement. We present the application of the model to the investigation of confocal filtering at the image plane and to the evaluation of positioning and wavelength tolerances.
authors.affiliation: Department of Atomic Physics, Budapest University of Technology and Economics, Budapest, Hungary. nagy.zsolt@winger.bme.hu
authors.forename: Zsolt
authors.initials: Z
authors.lastname: Nagy
authors.forename: Pál
authors.initials: P
authors.lastname: Koppa
authors.forename: Enrico
authors.initials: E
authors.lastname: Dietz
authors.forename: Sven
authors.initials: S
authors.lastname: Frohmann
authors.forename: Susanna
authors.initials: S
authors.lastname: Orlic
authors.forename: Emoke
authors.initials: E
authors.lastname: Lorincz