title: Time-of-flight secondary-ion mass spectrometry for the surface characterization of solid-state pharmaceuticals.
abstract: Time-of-flight secondary-ion mass spectrometry (ToF-SIMS) is a highly surface sensitive analytical method for surface chemical identification and surface chemical distribution analysis (mapping). Here we have explored the application of ToF-SIMS for the characterization of solid-state pharmaceuticals and highlight specific case studies concerning the distribution and stability of pharmaceutical actives within solid matrices (pellets and polymeric carriers) and the face-specific properties of pharmaceutical crystals.
authors.affiliation: Ian Wark Research Institute, The Australian Research Council Special Research Centre for Particle and Material Interfaces, University of South Australia, Mawson Lakes, SA 5095, Australia. clive.prestidge@unisa.edu.au
authors.forename: Clive A
authors.initials: CA
authors.lastname: Prestidge
authors.forename: Timothy J
authors.initials: TJ
authors.lastname: Barnes
authors.forename: William
authors.initials: W
authors.lastname: Skinner
mesh_terms: D016503:Drug Delivery Systems; D004364:Pharmaceutical Preparations / Q000737:chemistry*; D018629:Spectrometry, Mass, Secondary Ion / Q000295:instrumentation / Q000379:methods*; D013499:Surface Properties; D013678:Technology, Pharmaceutical / Q000295:instrumentation / Q000379:methods
chemical_list: D004364:Pharmaceutical Preparations