Modeling of multilayer microholographic data storage.
We focus on the investigation of multilayer recording in microholographic data storage. We have developed a numerical model for calculating the electromagnetic scattering from thick microholographic gratings using the Born approximation and the direct volume integral. The signal-to-noise ratio and bit error rate were calculated to estimate the noise arising from interlayer and interhologram cross talk. Measurements were done to prove the validity of the model. The results of our calculations and the measurements show good agreement. We present the application of the model to the investigation of confocal filtering at the image plane and to the evaluation of positioning and wavelength tolerances.
Nagy
Zsolt
Z
Department of Atomic Physics, Budapest University of Technology and Economics, Budapest, Hungary. nagy.zsolt@winger.bme.hu
Koppa
Pál
P
Dietz
Enrico
E
Frohmann
Sven
S
Orlic
Susanna
S
Lorincz
Emoke
E