title: Imaging electromigration during the formation of break junctions.
abstract: Using a scanning electron microscope, we make real-time movies of gold nanowires during the process of electromigration. We confirm the importance of using a small series resistance when employing electromigration to make controlled nanometer-scale gaps suitable for molecular-electronics studies. We are also able to estimate the effective temperature experienced by molecular adsorbates on the nanowire during the electromigration process.
authors.affiliation: Laboratory of Atomic and Solid State Physics, Cornell University, Ithaca, New York 14853, USA.
authors.forename: Thiti
authors.initials: T
authors.lastname: Taychatanapat
authors.forename: Kirill I
authors.initials: KI
authors.lastname: Bolotin
authors.forename: Ferdinand
authors.initials: F
authors.lastname: Kuemmeth
authors.forename: Daniel C
authors.initials: DC
authors.lastname: Ralph