title: Measurement of contrast transfer function in super-resolution microscopy using two-color fluorescence dip spectroscopy.
abstract: The contrast transfer function (CTF) of super-resolution microscopy was quantitatively investigated using a fluorescent scale. The scale has minute fluorescent line patterns, finer than 100 nm, and is suitable for measuring CTF in super-resolution microscopy. The measured CTF shows that super-resolution microscopy can indeed improve the optical properties of fluorescent images and enable us to observe a structure with the spatial resolution overcoming the diffraction limit. From the CTF, it has been found that super-resolution microcopy can resolve a 100 nm line-and-space pattern and provides a contrast of 10%. The CTF corresponds to a PSF with a full-width at half-maximum (FWHM) of 130 nm. An evaluation using a 100 nmphi fluorescent bead consistently supports the results given by the CTF for super-resolution microscopy.
authors.affiliation: Olympus Corporation, 2-3 Kuboyama-cho, Hachioji, 192-8512, Japan. y_iketaki@ot.olympus.co.jp
authors.forename: Yoshinori
authors.initials: Y
authors.lastname: Iketaki
authors.forename: Takeshi
authors.initials: T
authors.lastname: Watanabe
authors.forename: Nándor
authors.initials: N
authors.lastname: Bokor
authors.forename: Takashige
authors.initials: T
authors.lastname: Omatsu
authors.forename: Takashi
authors.initials: T
authors.lastname: Hiraga
authors.forename: Kimihisa
authors.initials: K
authors.lastname: Yamamoto
authors.forename: Masaaki
authors.initials: M
authors.lastname: Fujii
mesh_terms: D004867:Equipment Design; D019544:Equipment Failure Analysis; D007089:Image Enhancement / Q000295:instrumentation* / Q000379:methods*; D036641:Microscopy, Fluorescence, Multiphoton / Q000295:instrumentation* / Q000379:methods*; D015203:Reproducibility of Results; D012680:Sensitivity and Specificity