Imaging electromigration during the formation of break junctions.
Using a scanning electron microscope, we make real-time movies of gold nanowires during the process of electromigration. We confirm the importance of using a small series resistance when employing electromigration to make controlled nanometer-scale gaps suitable for molecular-electronics studies. We are also able to estimate the effective temperature experienced by molecular adsorbates on the nanowire during the electromigration process.
Taychatanapat
Thiti
T
Laboratory of Atomic and Solid State Physics, Cornell University, Ithaca, New York 14853, USA.
Bolotin
Kirill I
KI
Kuemmeth
Ferdinand
F
Ralph
Daniel C
DC