Electromagnetic field for a tightly focused beam incident upon ordinary and layered plane surfaces.
A solution procedure is developed for the determination of the electromagnetic field that results from the interaction of a tightly focused beam with a plane surface with and without a layer. The effects of angle of incidence, relative index of refraction, polarization, layer thickness, and incident beam profile on the resulting electromagnetic field distribution are demonstrated.
Barton
John P
JP
Department of Mechanical Engineering, College of Engineering, University of Nebraska-Lincoln, Lincoln, Nebraska 68588-0656, USA. jbarton@unlserve.unl.edu