Four-point probe resistance measurements using PtIr-coated carbon nanotube tips.
We performed four-terminal conductivity measurements on a CoSi2 nanowire (NW) at room temperature by using PtIr-coated carbon nanotube (CNT) tips in a four-tip scanning tunneling microscope. The physical stability and high aspect ratio of the CNT tips made it possible to reduce the probe spacing down to ca. 30 nm. The probe-spacing dependence of resistance showed diffusive transport even at 30 nm and no current leakage to the Si substrate.
Yoshimoto
Shinya
S
Department of Physics, School of Science, University of Tokyo, 7-3-1 Hongo, Bunkyo-ku, Tokyo 113-0033, Japan. yoshimoto@surface.phys.s.u-tokyo.ac.jp
Murata
Yuya
Y
Kubo
Keisuke
K
Tomita
Kazuhiro
K
Motoyoshi
Kenji
K
Kimura
Takehiko
T
Okino
Hiroyuki
H
Hobara
Rei
R
Matsuda
Iwao
I
Honda
Shin-Ichi
S
Katayama
Mitsuhiro
M
Hasegawa
Shuji
S
D017097:Electric Impedance; D004563:Electrochemistry / Q000295:instrumentation* / Q000379:methods; D004867:Equipment Design; D019544:Equipment Failure Analysis / Q000295:instrumentation* / Q000379:methods; D007495:Iridium / Q000737:chemistry*; D008422:Materials Testing / Q000295:instrumentation* / Q000379:methods; D008839:Microelectrodes; D037742:Nanotubes, Carbon / Q000737:chemistry* / Q000648:ultrastructure; D010984:Platinum / Q000737:chemistry*
D037742:Nanotubes, Carbon; D007495:Iridium; D010984:Platinum