title: Four-point probe resistance measurements using PtIr-coated carbon nanotube tips.
abstract: We performed four-terminal conductivity measurements on a CoSi2 nanowire (NW) at room temperature by using PtIr-coated carbon nanotube (CNT) tips in a four-tip scanning tunneling microscope. The physical stability and high aspect ratio of the CNT tips made it possible to reduce the probe spacing down to ca. 30 nm. The probe-spacing dependence of resistance showed diffusive transport even at 30 nm and no current leakage to the Si substrate.
authors: Department of Physics, School of Science, University of Tokyo, 7-3-1 Hongo, Bunkyo-ku, Tokyo 113-0033, Japan. yoshimoto@surface.phys.s.u-tokyo.ac.jp
authors: Shinya
authors: S
authors: Yoshimoto
authors: Yuya
authors: Y
authors: Murata
authors: Keisuke
authors: K
authors: Kubo
authors: Kazuhiro
authors: K
authors: Tomita
authors: Kenji
authors: K
authors: Motoyoshi
authors: Takehiko
authors: T
authors: Kimura
authors: Hiroyuki
authors: H
authors: Okino
authors: Rei
authors: R
authors: Hobara
authors: Iwao
authors: I
authors: Matsuda
authors: Shin-Ichi
authors: S
authors: Honda
authors: Mitsuhiro
authors: M
authors: Katayama
authors: Shuji
authors: S
authors: Hasegawa
mesh_terms: D017097:Electric Impedance; D004563:Electrochemistry / Q000295:instrumentation* / Q000379:methods; D004867:Equipment Design; D019544:Equipment Failure Analysis / Q000295:instrumentation* / Q000379:methods; D007495:Iridium / Q000737:chemistry*; D008422:Materials Testing / Q000295:instrumentation* / Q000379:methods; D008839:Microelectrodes; D037742:Nanotubes, Carbon / Q000737:chemistry* / Q000648:ultrastructure; D010984:Platinum / Q000737:chemistry*
chemical_list: D037742:Nanotubes, Carbon; D007495:Iridium; D010984:Platinum