title: High-speed, sub-15 nm feature size thermochemical nanolithography.
abstract: We report a nanolithography technique that allows simultaneous direct control of the local chemistry and topography of thin polymer films. Specifically, a heated atomic force microscope (AFM) tip can write sub-15 nm hydrophilic features onto a hydrophobic polymer at the rate of 1.4 mm per s. The thermally activated chemical reactions and topography changes depend on the chemical composition of the polymer, the raster speed, the temperature at the AFM tip/sample interface, and the normal load. This method is conceptually simple, direct, extremely rapid, achievable in a range of environments, and potentially adaptable to other materials systems.
authors: School of Physics and Center for Organic Photonics and Electronics, Georgia Institute of Technology, Atlanta, Georgia 30332, USA.
authors: Robert
authors: R
authors: Szoszkiewicz
authors: Takashi
authors: T
authors: Okada
authors: Simon C
authors: SC
authors: Jones
authors: Tai-De
authors: TD
authors: Li
authors: William P
authors: WP
authors: King
authors: Seth R
authors: SR
authors: Marder
authors: Elisa
authors: E
authors: Riedo
mesh_terms: D003460:Crystallization / Q000379:methods*; D006358:Hot Temperature; D046911:Macromolecular Substances / Q000737:chemistry; D008422:Materials Testing; D008567:Membranes, Artificial; D018625:Microscopy, Atomic Force / Q000379:methods*; D008968:Molecular Conformation; D049329:Nanostructures / Q000737:chemistry* / Q000648:ultrastructure*; D036103:Nanotechnology / Q000379:methods*; D010316:Particle Size; D013499:Surface Properties; D013997:Time Factors
chemical_list: D046911:Macromolecular Substances; D008567:Membranes, Artificial