title: Scanning near-field optical microscopy signal processing and resolution.
abstract: To increase the signal-to-noise ratio and to remove the spatially slow varying signals, a lock-in amplifier is often used in scanning probe microscopy. The signal reconstructed from the lock-in data contains the contributions of the evanescent and homogeneous waves that are mixed in the near-field zone (i.e., at a very short distance). The resolution is determined and a method is given to suppress the useless background information. Experimental images of nanoparticles are processed.
authors.affiliation: Laboratoire de Nanotechonologie et d'Instrumentation Optique, Institut Charles Delaunay, Université de Technologie de Troyes, Troyes Cedex, France. thomas.grosgges@utt.fr
authors.forename: Thomas
authors.initials: T
authors.lastname: Grosges
authors.forename: Dominique
authors.initials: D
authors.lastname: Barchiesi
mesh_terms: D000465:Algorithms; D007089:Image Enhancement / Q000379:methods*; D007090:Image Interpretation, Computer-Assisted / Q000379:methods*; D016247:Information Storage and Retrieval / Q000379:methods; D020527:Microscopy, Scanning Probe / Q000379:methods*; D049329:Nanostructures / Q000648:ultrastructure*; D015203:Reproducibility of Results; D012680:Sensitivity and Specificity; D012815:Signal Processing, Computer-Assisted