title: Artificial submicron or nanometer speckle fabricating technique and electron microscope speckle photography.
abstract: In this article, a novel artificial submicro- or nanometer speckle fabricating technique is proposed by taking advantage of submicro or nanometer particles. In the technique, submicron or nanometer particles were adhered to an object surface by using ultrasonic dispersing technique. The particles on the object surface can be regarded as submicro or nanometer speckle by using a scanning electronic microscope at a special magnification. In addition, an electron microscope speckle photography (EMSP) method is developed to measure in-plane submicron or nanometer deformation of the object coated with the artificial submicro or nanometer speckles. The principle of artificial submicro or nanometer speckle fabricating technique and the EMSP method are discussed in detail in this article. Some typical applications of this method are offered. The experimental results verified that the artificial submicro or nanometer speckle fabricating technique and EMSP method is feasible.
authors.affiliation: Department of Mechanics, School of Science, Beijing Institute of Technology, Beijing 100081, China.
authors.forename: Zhanwei
authors.initials: Z
authors.lastname: Liu
authors.forename: Huimin
authors.initials: H
authors.lastname: Xie
authors.forename: Daining
authors.initials: D
authors.lastname: Fang
authors.forename: Fulong
authors.initials: F
authors.lastname: Dai
authors.forename: Weining
authors.initials: W
authors.lastname: Wang
authors.forename: Yan
authors.initials: Y
authors.lastname: Fang
mesh_terms: D008854:Microscopy, Electron / Q000379:methods*; D053758:Nanoparticles; D010781:Photography / Q000379:methods*