General three-dimensional image simulation and surface reconstruction in scanning probe microscopy using a dexel representation.
The ability to image complex general three-dimensional (3D) structures, including reentrant surfaces and undercut features using scanning probe microscopy, is becoming increasing important in many small length-scale applications. This paper presents a dexel data representation and its algorithm implementation for scanning probe microscope (SPM) image simulation (morphological dilation) and surface reconstruction (erosion) on such general 3D structures. Validation using simulations, some of which are modeled upon actual atomic force microscope data, demonstrates that the dexel representation can efficiently simulate SPM imaging and reconstruct the sample surface from measured images, including those with reentrant surfaces and undercut features.
Qian
Xiaoping
X
Mechanical and Aerospace Engineering, Illinois Institute of Technology, Chicago, IL 60613, USA. qian@iit.edu
Villarrubia
J S
JS