title: Electronic excitations in synthetic eumelanin aggregates probed by soft X-ray spectroscopies.
abstract: Electronic excitations of condensed phase eumelanin aggregates are investigated with soft X-ray spectroscopies. Resonant photoemission data indicate that mechanisms of charge delocalization may occur when electrons are excited about 3 eV above the first unoccupied electronic level. An average, lower limit value of 1.6 fs was estimated for the lifetime of the excited C 1s-pi* states.
authors: Dipartimento di Matematica e Fisica, UniversitA Cattolica, via dei Musei 41, 25121 Brescia, Italy.
authors: L
authors: L
authors: Sangaletti
authors: S
authors: S
authors: Pagliara
authors: P
authors: P
authors: Vilmercati
authors: C
authors: C
authors: Castellarin-Cudia
authors: P
authors: P
authors: Borghetti
authors: P
authors: P
authors: Galinetto
authors: R
authors: R
authors: Gebauer
authors: A
authors: A
authors: Goldoni
mesh_terms: D008543:Melanins / Q000737:chemistry*; D015394:Molecular Structure; D013052:Spectrometry, X-Ray Emission / Q000379:methods
chemical_list: D008543:Melanins; C041877:eumelanin