title: New tomographic atom probe at University of Muenster, Germany.
abstract: Currently atom probe tomography provides the highest spatial resolution compared to all other volume analysis techniques. Owing to its single atom sensitivity, it is specially suited to study nano-structured materials. Therefore, a new atom probe was installed at the Institute for Material Physics at University of Muenster, Germany, to study thin film reactions. Since the available budget was rather limited, a cost-effective non-commercial atom probe was constructed. The instrument is based on a 2D delay line detector system of 120 mm diameter. To achieve a large collecting angle and thus large volumes of analysis, a straight flight tube without a reflectron is used. This way, the flight distance may be reduced down to 160 mm. However, the variable chamber layout allows using a reflectron as an alternative. Furthermore, a laser system is implemented that delivers pulses in the 500 ps range to make possible laser-assisted evaporation of atoms. The article describes instrumental details and presents first characteristic data.
authors: Institute of Material Physics, Westf. Willhelms-Universität Münster, Willhelm-Klemm-Str. 10, D-48149 Münster, Germany.
authors: P
authors: P
authors: Stender
authors: C
authors: C
authors: Oberdorfer
authors: M
authors: M
authors: Artmeier
authors: P
authors: P
authors: Pelka
authors: F
authors: F
authors: Spaleck
authors: G
authors: G
authors: Schmitz