title: Tuning the exchange bias in NiFe/Fe-oxide bilayers by way of different Fe-oxide based mixtures made with an ion-beam deposition technique.
abstract: We have investigated the structural and magnetic properties of ion-beam deposited polycrystalline NiFe (25 nm)/Fe-oxide (35 nm) bilayers. A film prepared with an assist beam O2 to Ar gas ratio of 0% during deposition had a bottom layer that consisted of pure b.c.c. Fe (a = 2.87 A) whereas films prepared with 19%O2/Ar and 35%O2/Ar had either Fe3O4 (a = 8.47 angstroms) or alpha-Fe2O3 (a = 5.04 angstroms, c = 13.86 angstroms) bottom layers, respectively. Cross-sectional transmission electron microscopy revealed a smooth interface between the top nano-columnar NiFe and bottom nano-columnar Fe-oxide layer for all films. At room temperature, the observed coercivity (Hc approximately 25 Oe) for a film prepared with 19% O2/Ar indicates the existence of a magnetically hard ferrimagnetic Fe3O4 phase that is enhancing the plain NiFe (Hc approximately 2 Oe) by way of exchange coupling. A significant amount of exchange bias is observed below 50 K, and at 10 K the size of exchange bias hysteresis loops shift increases with increasing oxygen in the films. Furthermore, the strongest exchange coupling (H(ex) approximately 135 Oe at 10 K) is with alpha-Fe2O3 (35% O2/Ar) as the bottom film layer. This indicates that the pure antiferromagnetic phases work better than ferrimagnetic phases when in contact with ferromagnetic NiFe. H(ex) (T) is well described by an effective AF domain wall energy that creates an exchange field with a (1 - T/T(crit)) temperature dependence. Hc (T) exhibits three distinct regimes of constant temperature that may indicate the existence of different AF spin populations that couple to the FM layer at different temperatures.
authors: Department of Materials Engineering, National Chung Hsing University, Taichung 402, Taiwan.
authors: K W
authors: KW
authors: Lin
authors: P H
authors: PH
authors: Kol
authors: Z Y
authors: ZY
authors: Guo
authors: H
authors: H
authors: Ouyang
authors: J
authors: J
authors: van Lierop
mesh_terms: D004563:Electrochemistry / Q000379:methods*; D005290:Ferric Compounds / Q000737:chemistry*; D007477:Ions; D007501:Iron / Q000737:chemistry*; D008280:Magnetics; D046529:Microscopy, Electron, Transmission; D036103:Nanotechnology / Q000295:instrumentation / Q000379:methods*; D009532:Nickel / Q000737:chemistry*; D010087:Oxides / Q000737:chemistry*; D010100:Oxygen / Q000737:chemistry; D013696:Temperature; D014961:X-Ray Diffraction
chemical_list: D005290:Ferric Compounds; D007477:Ions; D010087:Oxides; C000499:ferric oxide; D009532:Nickel; D007501:Iron; D010100:Oxygen