title: Characterization of pyramidal inversion boundaries in Sb2O3-doped ZnO by using electron back-scattered diffraction (EBSD).
abstract: The composition planes of the inversion boundary induced by the addition of Sb2O3 to ZnO ceramics were analyzed crystallographically by the application of electron back-scattered diffraction (EBSD) analysis and stereographic projection techniques. The inversion boundary was determined to consist of three discrete composition planes, {0001}, {1011}, {1010}.
authors: Department of Materials Science and Engineering, Seoul National University, Seoul 151-744, Korea. whdnr01@snu.ac.kr
authors: Wook
authors: W
authors: Jo
authors: Chan
authors: C
authors: Park
authors: Doh-Yeon
authors: DY
authors: Kim
mesh_terms: D000965:Antimony / Q000737:chemistry*; D002516:Ceramics / Q000737:chemistry*; D008855:Microscopy, Electron, Scanning; D015034:Zinc Oxide / Q000737:chemistry*
chemical_list: D000965:Antimony; C037554:antimony trioxide; D015034:Zinc Oxide