title: Application of glancing-emergent-angle fluorescence for polarized XAFS studies of single crystals.
abstract: X-ray absorption fine-structure (XAFS) data were obtained for the V K-edge for a series of anisotropic single crystals of (Cr(x)V(1-x))(2)O(3). The data and the results were compared for the as-prepared bulk single crystals (measured in fluorescence in two different orientations) and those ground to powder (measured in transmission). For the bulk single crystals, the glancing-emergent-angle (GEA) method was used to minimize fluorescence distortion. The reliability of the GEA technique was tested by comparing the polarization-weighted single-crystal XAFS data with the experimental powder data. These data were found to be in excellent agreement throughout the entire energy range. Thus, it was possible to reliably measure individual V-V contributions parallel and perpendicular to the c axis of the single crystals, i.e. those unavailable by powder data XAFS analysis. These experiments demonstrate that GEA is a premiere method for non-destructive high-photon-count in situ studies of local structure in bulk single crystals.
authors: Department of Physics, Yeshiva University, New York, NY 10016, USA. frenkel@bnl.gov
authors: A I
authors: AI
authors: Frenkel
authors: D M
authors: DM
authors: Pease
authors: J I
authors: JI
authors: Budnick
authors: P
authors: P
authors: Shanthakumar
authors: T
authors: T
authors: Huang