Electronic excitations in synthetic eumelanin aggregates probed by soft X-ray spectroscopies.
Electronic excitations of condensed phase eumelanin aggregates are investigated with soft X-ray spectroscopies. Resonant photoemission data indicate that mechanisms of charge delocalization may occur when electrons are excited about 3 eV above the first unoccupied electronic level. An average, lower limit value of 1.6 fs was estimated for the lifetime of the excited C 1s-pi* states.
Sangaletti
L
L
Dipartimento di Matematica e Fisica, UniversitA Cattolica, via dei Musei 41, 25121 Brescia, Italy.
Pagliara
S
S
Vilmercati
P
P
Castellarin-Cudia
C
C
Borghetti
P
P
Galinetto
P
P
Gebauer
R
R
Goldoni
A
A
D008543:Melanins / Q000737:chemistry*; D015394:Molecular Structure; D013052:Spectrometry, X-Ray Emission / Q000379:methods
D008543:Melanins; C041877:eumelanin