EBSD image quality mapping.
Image quality (IQ) maps constructed from electron backscatter diffraction data provide useful visualizations of microstructure. The contrast in these maps arises from a variety of sources, including phase, strain, topography, and grain boundaries. IQ maps constructed using various IQ metrics are compared to identify the most prominent contrast mechanism for each metric. The conventional IQ metric was found to provide the superior grain boundary and strain contrast, whereas an IQ metric based on the average overall intensity of the diffraction patterns was found to provide better topological and phase contrast.
Wright
Stuart I
SI
EDAX-TSL, 392 East 12300 South, Draper, Utah 84020, USA.
Nowell
Matthew M
MM
D000537:Aluminum Oxide / Q000737:chemistry; D003300:Copper / Q000737:chemistry; D004583:Electrons; D019277:Entropy; D007091:Image Processing, Computer-Assisted / Q000379:methods*; D008854:Microscopy, Electron; D015203:Reproducibility of Results; D012680:Sensitivity and Specificity
D003300:Copper; D000537:Aluminum Oxide; C030973:cupric oxide