Atom probe specimen fabrication methods using a dual FIB/SEM.
A dual FIB/SEM provides solutions to many challenges in atom probe specimen preparation. When combined with an in situ lift-out capability, the versatility of this tool allows almost any region of interest, in almost any geometry, to be placed at the apex of a specimen tip. Several preparation techniques have been developed in response to specific application requirements; for example, in cases where materials are not suitable for electropolishing, or where site-specific analysis is required. Two general techniques, with wide-ranging potential applications, are described in detail here. The first is a 'cut-out' technique that provides a relatively quick means of micro-tip specimen preparation from bulk material samples. The second method is a 'lift-out' technique that can be used in an in situ or ex situ mode and does not require the preparation of pre-sharpened mounting points.
Saxey
D W
DW
Australian Key Centre for Microscopy & Microanalysis, University of Sydney, Sydney, NSW 2006, Australia. david.saxey@emu.usyd.edu.au
Cairney
J M
JM
McGrouther
D
D
Honma
T
T
Ringer
S P
SP