title: Atom probe specimen fabrication methods using a dual FIB/SEM.
abstract: A dual FIB/SEM provides solutions to many challenges in atom probe specimen preparation. When combined with an in situ lift-out capability, the versatility of this tool allows almost any region of interest, in almost any geometry, to be placed at the apex of a specimen tip. Several preparation techniques have been developed in response to specific application requirements; for example, in cases where materials are not suitable for electropolishing, or where site-specific analysis is required. Two general techniques, with wide-ranging potential applications, are described in detail here. The first is a 'cut-out' technique that provides a relatively quick means of micro-tip specimen preparation from bulk material samples. The second method is a 'lift-out' technique that can be used in an in situ or ex situ mode and does not require the preparation of pre-sharpened mounting points.
authors.affiliation: Australian Key Centre for Microscopy & Microanalysis, University of Sydney, Sydney, NSW 2006, Australia. david.saxey@emu.usyd.edu.au
authors.forename: D W
authors.initials: DW
authors.lastname: Saxey
authors.forename: J M
authors.initials: JM
authors.lastname: Cairney
authors.forename: D
authors.initials: D
authors.lastname: McGrouther
authors.forename: T
authors.initials: T
authors.lastname: Honma
authors.forename: S P
authors.initials: SP
authors.lastname: Ringer