Buried interfacial layer of highly oriented molecules in copper phthalocyanine thin films on polycrystalline gold.
The growth of copper phthalocyanine thin films evaporated on polycrystalline gold is examined in detail using near edge x-ray absorption fine structure spectroscopy and surface sensitive x-ray photoemission spectroscopy. The combination of both methods allows distinguishing between the uppermost layers and buried interface layers in films up to approximately 3 nm thickness. An interfacial layer of approximately 3 ML of molecules with an orientation parallel to the substrate surface was found, whereas the subsequent molecules are perpendicular to the metal surface. It was shown that even if the preferred molecular orientation in thin films is perpendicular, the buried interfacial layer can be oriented differently.
Biswas
Indro
I
Institut für Physikalische und Theoretische Chemie, Universität Tübingen, Auf der Morgenstelle 8, 72076 Tübingen, Germany.
Peisert
Heiko
H
Nagel
Mathias
M
Casu
Maria Benedetta
MB
Schuppler
Stefan
S
Nagel
Peter
P
Pellegrin
Eric
E
Chassé
Thomas
T