title: WSXM: a software for scanning probe microscopy and a tool for nanotechnology.
abstract: In this work we briefly describe the most relevant features of WSXM, a freeware scanning probe microscopy software based on MS-Windows. The article is structured in three different sections: The introduction is a perspective on the importance of software on scanning probe microscopy. The second section is devoted to describe the general structure of the application; in this section the capabilities of WSXM to read third party files are stressed. Finally, a detailed discussion of some relevant procedures of the software is carried out.
authors.affiliation: Nanotec Electrónica S.L., Centro Empresarial Euronova 3, Ronda de Poniente 2, Edificio 2-1a Planta Oficina A, 28760 Tres Cantos, E-28049 Madrid, Spain.
authors.forename: I
authors.initials: I
authors.lastname: Horcas
authors.forename: R
authors.initials: R
authors.lastname: Fernández
authors.forename: J M
authors.initials: JM
authors.lastname: Gómez-Rodríguez
authors.forename: J
authors.initials: J
authors.lastname: Colchero
authors.forename: J
authors.initials: J
authors.lastname: Gómez-Herrero
authors.forename: A M
authors.initials: AM
authors.lastname: Baro
mesh_terms: D007089:Image Enhancement; D018625:Microscopy, Atomic Force / Q000379:methods; D036103:Nanotechnology / Q000379:methods; D012984:Software