Tightly focused epimicroscope technique for submicrometer-resolved highly sensitive refractive index measurement of an optical waveguide.
We introduce a very sensitive new configuration, to the best of our knowledge, in an optical microscope system that utilizes two detectors: one is to measure the power of a low reflected signal from a sample, and the other is only to monitor the confocal geometry of the system. With this new configuration, we could effectively remove measurement noise associated with small perturbation in measurement conditions such as surface curvature, tilt, and vibration in a microscope system. We have obtained a high-resolution relative index precision of 9x10(-5) by employing this novel technique with two detectors.
Youk
Youngchun
Y
Department of Information and Communication, Gwangju Institute of Science and Technology, 1 Oryong-dong, Buk-gu, Gwangju 500-712, Korea. ycyouk@gist.ac.kr
Kim
Dug Young
DY