title: [XPS research on thymine implanted by low energy N+].
abstract: The induced variation mechanism of low energy ion beam implantation into a creature has attracted a great attention. DNA was the target of radiation. XPS analysis of thymine sample implanted by low energy N+ was studied. It was found that the relative content of C, N and O changed in the implanted samples. The content of N and O decreased, while that of C increased. Subtle structure of C, N and O was studied. It was found that the peak location of O(1s) shifted. The peak number of N(1s) changed from one to three, while that of C(1s) changed from two to one. The results indicated that the chemical environment and physical structure changed greatly by implantation. N+ implantation could lead to destruction and change of thymine molecular structure.
authors.affiliation: Henan Province Ion Beam Bioengineering Laboratory, Zhengzhou University, Zhengzhou 450052, China.
authors.forename: Yun-hong
authors.initials: YH
authors.lastname: Gu
authors.forename: Wei-dong
authors.initials: WD
authors.lastname: Wang
authors.forename: Guang-yong
authors.initials: GY
authors.lastname: Qin
authors.forename: Yu-ping
authors.initials: YP
authors.lastname: Huo
mesh_terms: D009584:Nitrogen / Q000737:chemistry*; D056951:Photoelectron Spectroscopy; D013941:Thymine / Q000032:analysis* / Q000737:chemistry
chemical_list: D009584:Nitrogen; D013941:Thymine