Highly sensitive nitric oxide detection using X-ray photoelectron spectroscopy.
Dubey
Manish
M
Department of Chemistry, Princeton University, Princeton, New Jersey 08544, USA.
Bernasek
Steven L
SL
Schwartz
Jeffrey
J
D006427:Hemin / Q000737:chemistry*; D009569:Nitric Oxide / Q000032:analysis*; D012680:Sensitivity and Specificity; D012822:Silicon Dioxide / Q000737:chemistry*; D013057:Spectrum Analysis / Q000379:methods*; D013499:Surface Properties
D009569:Nitric Oxide; D006427:Hemin; D012822:Silicon Dioxide