title: Discontinuous change in the smectic layer thickness in ferrielectric liquid crystals.
abstract: The temperature dependence of the thickness of thick free-standing films is studied using a high-resolution film thickness measurement technique. A small discontinuity in the temperature dependence of the smectic layer thickness at every phase transition between ferro-, ferri-, and antiferroelectric phases is observed. We show that the major contribution to it arises from a change in the smectic tilt angle.
authors.affiliation: Department of Electronic and Electrical Engineering, Trinity College, University of Dublin, Dublin 2, Ireland.
authors.forename: V P
authors.initials: VP
authors.lastname: Panov
authors.forename: J K
authors.initials: JK
authors.lastname: Vij
authors.forename: Yu P
authors.initials: YP
authors.lastname: Panarin
authors.forename: C
authors.initials: C
authors.lastname: Blanc
authors.forename: V
authors.initials: V
authors.lastname: Lorman
authors.forename: J W
authors.initials: JW
authors.lastname: Goodby