title: Discrete retardance second harmonic generation ellipsometry.
abstract: A new instrument was constructed to perform discrete retardance nonlinear optical ellipsometry (DR-NOE). The focus of the design was to perform second harmonic generation NOE while maximizing sample and application flexibility and minimizing data acquisition time. The discrete retardance configuration results in relatively simple computational algorithms for performing nonlinear optical ellipsometric analysis. NOE analysis of a disperse red 19 monolayer yielded results that were consistent with previously reported values for the same surface system, but with significantly reduced acquisition times.
authors.affiliation: Department of Chemistry, Purdue University, 560 Oval Drive, West Lafayette, Indiana 47907, USA.
authors.forename: Christopher J
authors.initials: CJ
authors.lastname: Dehen
authors.forename: R Michael
authors.initials: RM
authors.lastname: Everly
authors.forename: Ryan M
authors.initials: RM
authors.lastname: Plocinik
authors.forename: Hartmut G
authors.initials: HG
authors.lastname: Hedderich
authors.forename: Garth J
authors.initials: GJ
authors.lastname: Simpson
mesh_terms: D000465:Algorithms; D017711:Nonlinear Dynamics; D055095:Optics and Photonics