Discontinuous change in the smectic layer thickness in ferrielectric liquid crystals.
The temperature dependence of the thickness of thick free-standing films is studied using a high-resolution film thickness measurement technique. A small discontinuity in the temperature dependence of the smectic layer thickness at every phase transition between ferro-, ferri-, and antiferroelectric phases is observed. We show that the major contribution to it arises from a change in the smectic tilt angle.
Panov
V P
VP
Department of Electronic and Electrical Engineering, Trinity College, University of Dublin, Dublin 2, Ireland.
Vij
J K
JK
Panarin
Yu P
YP
Blanc
C
C
Lorman
V
V
Goodby
J W
JW