WSXM: a software for scanning probe microscopy and a tool for nanotechnology.
In this work we briefly describe the most relevant features of WSXM, a freeware scanning probe microscopy software based on MS-Windows. The article is structured in three different sections: The introduction is a perspective on the importance of software on scanning probe microscopy. The second section is devoted to describe the general structure of the application; in this section the capabilities of WSXM to read third party files are stressed. Finally, a detailed discussion of some relevant procedures of the software is carried out.
Horcas
I
I
Nanotec Electrónica S.L., Centro Empresarial Euronova 3, Ronda de Poniente 2, Edificio 2-1a Planta Oficina A, 28760 Tres Cantos, E-28049 Madrid, Spain.
Fernández
R
R
Gómez-Rodríguez
J M
JM
Colchero
J
J
Gómez-Herrero
J
J
Baro
A M
AM
D007089:Image Enhancement; D018625:Microscopy, Atomic Force / Q000379:methods; D036103:Nanotechnology / Q000379:methods; D012984:Software