title: Approach for simultaneous measurement of two-dimensional angular distribution of charged particles. III. Fine focusing of wide-angle beams in multiple lens systems.
abstract: This paper provides a way of focusing wide-angle charged-particle beams in multiple lens systems. In previous papers [H. Matsuda, Phys. Rev. E 71, 066503 (2005); 74, 036501 (2006)], it was shown that an ellipsoidal mesh, combined with electrostatic lenses, enables correction of spherical aberration over wide acceptance angles up to +/-60 degrees . In this paper, practical situations where ordinary electron lenses are arranged behind the wide-angle electrostatic lenses are taken into account using ray tracing calculation. For practical realization of the wide-angle lens systems, the acceptance angle is set to +/-50 degrees . We note that the output beams of the wide-angle electrostatic lenses have somewhat large divergence angles which cause unacceptable or non-negligible spherical aberration in additional lenses. A solution to this problem is presented showing that lens combinations to cancel spherical aberration are available, whereby wide-angle charged-particle beams can be finely focused with considerably reduced divergence angles less than +/-5 degrees .
authors.affiliation: Graduate School of Materials Science, Nara Institute of Science and Technology, 8916-5 Takayama, Ikoma, Nara 630-0192, Japan.
authors.forename: Hiroyuki
authors.initials: H
authors.lastname: Matsuda
authors.forename: Hiroshi
authors.initials: H
authors.lastname: Daimon
authors.forename: László
authors.initials: L
authors.lastname: Tóth
authors.forename: Fumihiko
authors.initials: F
authors.lastname: Matsui