title: Design and performance of a curved-crystal x-ray emission spectrometer.
abstract: A curved-crystal x-ray emission spectrometer has been designed and built to measure 2-5 keV x-ray fluorescence resulting from a core-level excitation of gas phase species. The spectrometer can rotate 180 degrees, allowing detection of emitted x rays with variable polarization angles, and is capable of collecting spectra over a wide energy range (20 eV wide with 0.5 eV resolution at the Cl K edge) simultaneously. In addition, the entire experimental chamber can be rotated about the incident-radiation axis by nearly 360 degrees while maintaining vacuum, permitting measurements of angular distributions of emitted x rays.
authors.affiliation: University of Nevada, Las Vegas, NV 89154, USA.
authors.forename: A C
authors.initials: AC
authors.lastname: Hudson
authors.forename: W C
authors.initials: WC
authors.lastname: Stolte
authors.forename: D W
authors.initials: DW
authors.lastname: Lindle
authors.forename: R
authors.initials: R
authors.lastname: Guillemin
mesh_terms: D004867:Equipment Design; D019544:Equipment Failure Analysis; D012031:Refractometry / Q000295:instrumentation* / Q000379:methods; D015203:Reproducibility of Results; D012680:Sensitivity and Specificity; D013052:Spectrometry, X-Ray Emission / Q000295:instrumentation* / Q000379:methods*