Multi-wavelength heterodyne-detected scattering-type scanning near-field optical microscopy.
We report on the implementation of a scattering-type scanning near-field optical microscope based on a heterodyne detection scheme, which has the ability to record near-field optical images at multiple wavelengths simultaneously. It is used to map out local field distribution and to investigate the dispersion behavior of plasmon created by nanometer-scale metallic structures. It opens up an unprecedented opportunity to study nano-photonics.
Chu
Jen-You
JY
Material and Chemical Research Laboratories, Industrial Technology Research Institute, Hsin-Chu 310, Taiwan, Republic of China.
Wang
Tien-Jen
TJ
Chang
You-Chia
YC
Lin
Ming-Wei
MW
Yeh
Jyi-Tyan
JT
Wang
Juen-Kai
JK