title: Compact variable-temperature scanning force microscope.
abstract: A compact design for a cryogenic variable-temperature scanning force microscope using a fiber-optic interferometer to measure cantilever deflection is presented. The tip-sample coarse approach and the lateral tip positioning are performed by piezoelectric positioners in situ. The microscope has been operated at temperatures between 6 and 300 K. It is designed to fit into an 8 T superconducting magnet with the field applied in the out-of-plane direction. The results of scanning in various modes are demonstrated, showing contrast based on magnetic field gradients or surface potentials.
authors.affiliation: Department of Physics, University of Texas, Austin, TX 78712, USA.
authors.forename: Tien-Ming
authors.initials: TM
authors.lastname: Chuang
authors.forename: Alex
authors.initials: A
authors.lastname: de Lozanne
mesh_terms: D004867:Equipment Design; D019544:Equipment Failure Analysis; D005336:Fiber Optic Technology / Q000295:instrumentation*; D007368:Interferometry / Q000295:instrumentation* / Q000379:methods; D018625:Microscopy, Atomic Force / Q000295:instrumentation* / Q000379:methods; D008904:Miniaturization; D055100:Optical Fibers; D015203:Reproducibility of Results; D012680:Sensitivity and Specificity; D013048:Specimen Handling / Q000295:instrumentation* / Q000379:methods; D013696:Temperature