Image processing for resonance frequency mapping in atomic force modulation microscopy.
It has been demonstrated that the resonance frequency of the cantilever in atomic force modulation microscopy can be used to study local mechanical properties. We developed a numerical method to achieve mapping of the resonance frequency without significant modification of the device. By making the assumption that the resonance spectrum can be approximated by a Lorentzian curve, we established analytical expressions of the resonance frequency and the width of the curve (damping) depending on the real and imaginary parts of the vibration at a single frequency. Then, resonance frequency and damping images were produced from the recording of both the real and imaginary part images of the complex amplitude. The results on a standard high-impact polystyrene sample are shown.
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Laboratoire d'Analyse des Interfaces et de Nanophysique (LAIN), UMR CNRS 5011, Université Montpellier II, CC 082, Place E. Bataillon, 34095 Montpellier Cedex, France. arinero@lain.univ-montp2.fr
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