title: Image processing for resonance frequency mapping in atomic force modulation microscopy.
abstract: It has been demonstrated that the resonance frequency of the cantilever in atomic force modulation microscopy can be used to study local mechanical properties. We developed a numerical method to achieve mapping of the resonance frequency without significant modification of the device. By making the assumption that the resonance spectrum can be approximated by a Lorentzian curve, we established analytical expressions of the resonance frequency and the width of the curve (damping) depending on the real and imaginary parts of the vibration at a single frequency. Then, resonance frequency and damping images were produced from the recording of both the real and imaginary part images of the complex amplitude. The results on a standard high-impact polystyrene sample are shown.
authors.affiliation: Laboratoire d'Analyse des Interfaces et de Nanophysique (LAIN), UMR CNRS 5011, Université Montpellier II, CC 082, Place E. Bataillon, 34095 Montpellier Cedex, France. arinero@lain.univ-montp2.fr
authors.forename: R
authors.initials: R
authors.lastname: Arinéro
authors.forename: G
authors.initials: G
authors.lastname: Lévêque
authors.forename: P
authors.initials: P
authors.lastname: Girard
authors.forename: J Y
authors.initials: JY
authors.lastname: Ferrandis