PRAXIS--combined mu-Raman and mu-XRF spectrometers in the examination of forensic samples.
Recently, two analytical techniques--Raman and XRF spectroscopy--have been often applied in criminalistic examinations of different kinds of trace evidences. In this paper, the application of the new combined mu-Raman and mu-XRF spectrometer in analysis of multilayer paint chips, modern inks, plastics and fibres was evaluated. It was ascertained that the apparatus possesses real advantages and could be helpful in the identification of examined materials after some modifications, i.e. by adding an extra laser and decreasing the spot size of the X-ray beam.
Zieba-Palus
Janina
J
Institute of Forensic Research, Westerplatte 9, 31-033, Cracow, Poland. jzieba@ies.krakow.pl
Borusiewicz
Rafał
R
Kunicki
Marcin
M