title: Optical and physical properties of solgel-derived GeO2:SiO2 films in photonic applications.
abstract: The functionality of optical components relies heavily on the composition-dependent properties of germanosilicate materials, which include the refractive index, photosensitivity, and microstructural properties. Recent studies and parallel developments are presented of germanosilicate films with composition x of Ge content (i.e., xGeO(2):(1-x)SiO(2)) that were synthesized by the solgel process for various integrated photonic applications undertaken. The following novel aspects are discussed with respect to the effect of composition of the glassy films (0.05</=x</=0.40): determination of spectral optical properties, UV imprinting of optical waveguides with relatively large index change (Dn), and quantum-well intermixing enhancement observed in InGaAs(P)/InP quantum-well optical devices. The implications of the results are discussed.
authors.affiliation: Photonics Research Centre, School of Electrical and Electronic Engineering, Nanyang Technological University, 50 Nanyang Avenue, Singapore 639798.
authors.forename: Charles K F
authors.initials: CK
authors.lastname: Ho
authors.forename: Rajni
authors.initials: R
authors.lastname: Pal
authors.forename: H S
authors.initials: HS
authors.lastname: Djie
authors.forename: Kantisara
authors.initials: K
authors.lastname: Pita
authors.forename: Nam Quoc
authors.initials: NQ
authors.lastname: Ngo
authors.forename: T
authors.initials: T
authors.lastname: Osipowicz