title: Preferential orientation of a chiral semiconducting carbon nanotube on the locally depassivated Si(100)-2 x 1:H surface identified by scanning tunneling microscopy.
authors.affiliation: Department of Electrical and Computer Engineering, Beckman Institute for Advanced Science and Technology, University of Illinois, Urbana, IL 61801, USA. albrecht@engineering.uiuc.edu
authors.forename: Peter M
authors.initials: PM
authors.lastname: Albrecht
authors.forename: Salvador
authors.initials: S
authors.lastname: Barraza-Lopez
authors.forename: Joseph W
authors.initials: JW
authors.lastname: Lyding
mesh_terms: D016880:Anisotropy; D003460:Crystallization / Q000379:methods*; D004553:Electric Conductivity; D007536:Isomerism; D046911:Macromolecular Substances / Q000737:chemistry; D008422:Materials Testing; D016252:Microscopy, Scanning Tunneling; D008968:Molecular Conformation; D036103:Nanotechnology / Q000379:methods*; D043942:Nanotubes / Q000737:chemistry* / Q000648:ultrastructure*; D010316:Particle Size; D012666:Semiconductors; D012825:Silicon / Q000737:chemistry*; D013499:Surface Properties
chemical_list: D046911:Macromolecular Substances; D012825:Silicon