Preferential orientation of a chiral semiconducting carbon nanotube on the locally depassivated Si(100)-2 x 1:H surface identified by scanning tunneling microscopy.
Albrecht
Peter M
PM
Department of Electrical and Computer Engineering, Beckman Institute for Advanced Science and Technology, University of Illinois, Urbana, IL 61801, USA. albrecht@engineering.uiuc.edu
Barraza-Lopez
Salvador
S
Lyding
Joseph W
JW
D016880:Anisotropy; D003460:Crystallization / Q000379:methods*; D004553:Electric Conductivity; D007536:Isomerism; D046911:Macromolecular Substances / Q000737:chemistry; D008422:Materials Testing; D016252:Microscopy, Scanning Tunneling; D008968:Molecular Conformation; D036103:Nanotechnology / Q000379:methods*; D043942:Nanotubes / Q000737:chemistry* / Q000648:ultrastructure*; D010316:Particle Size; D012666:Semiconductors; D012825:Silicon / Q000737:chemistry*; D013499:Surface Properties
D046911:Macromolecular Substances; D012825:Silicon