title: Easy and direct method for calibrating atomic force microscopy lateral force measurements.
abstract: We have designed and tested a new, inexpensive, easy-to-make and easy-to-use calibration standard for atomic force microscopy (AFM) lateral force measurements. This new standard simply consists of a small glass fiber of known dimensions and Young's modulus, which is fixed at one end to a substrate and which can be bent laterally with the AFM tip at the other end. This standard has equal or less error than the commonly used method of using beam mechanics to determine a cantilever's lateral force constant. It is transferable, thus providing a universal tool for comparing the calibrations of different instruments. It does not require knowledge of the cantilever dimensions and composition or its tip height. This standard also allows direct conversion of the photodiode signal to force and, thus, circumvents the requirement for a sensor response (sensitivity) measurement.
authors.affiliation: Department of Physics, Wake Forest University, Winston-Salem, NC 27109, USA.
authors.forename: Wenhua
authors.initials: W
authors.lastname: Liu
authors.forename: Keith
authors.initials: K
authors.lastname: Bonin
authors.forename: Martin
authors.initials: M
authors.lastname: Guthold
mesh_terms: D000465:Algorithms; D002138:Calibration; D019544:Equipment Failure Analysis / Q000379:methods* / Q000592:standards; D008365:Manometry / Q000295:instrumentation* / Q000379:methods / Q000592:standards; D018625:Microscopy, Atomic Force / Q000295:instrumentation* / Q000379:methods / Q000592:standards; D015203:Reproducibility of Results; D012680:Sensitivity and Specificity; D014159:Transducers; D014481:United States