Atomic-scale imaging in real and energy space developed in ultrafast electron microscopy.
In this contribution, we report the development of ultrafast electron microscopy (UEM) with atomic-scale real-, energy-, and Fourier-space resolutions. This second-generation UEM provides images, diffraction patterns, and electron energy spectra, and here we demonstrate its potential with applications for nanostructured materials and organometallic crystals. We clearly resolve the separation between atoms in the direct images and the Bragg spots/Debye-Scherrer rings in diffraction and obtain the electronic structure and elemental energies in the electron energy loss spectra (EELS) and energy filtered transmission electron microscopy (EFTEM).
Park
Hyun Soon
HS
Physical Biology Center for Ultrafast Science and Technology, Arthur Amos Noyes Laboratory of Chemical Physics, California Institute of Technology, Pasadena, California 91125, USA.
Baskin
J Spencer
JS
Kwon
Oh-Hoon
OH
Zewail
Ahmed H
AH
D003199:Computer Systems; D004867:Equipment Design; D007089:Image Enhancement / Q000295:instrumentation* / Q000379:methods*; D008854:Microscopy, Electron / Q000295:instrumentation* / Q000379:methods* / Q000639:trends; D053758:Nanoparticles / Q000648:ultrastructure*