Locally linear regression for pose-invariant face recognition.
The variation of facial appearance due to the viewpoint (/pose) degrades face recognition systems considerably, which is one of the bottlenecks in face recognition. One of the possible solutions is generating virtual frontal view from any given nonfrontal view to obtain a virtual gallery/probe face. Following this idea, this paper proposes a simple, but efficient, novel locally linear regression (LLR) method, which generates the virtual frontal view from a given nonfrontal face image. We first justify the basic assumption of the paper that there exists an approximate linear mapping between a nonfrontal face image and its frontal counterpart. Then, by formulating the estimation of the linear mapping as a prediction problem, we present the regression-based solution, i.e., globally linear regression. To improve the prediction accuracy in the case of coarse alignment, LLR is further proposed. In LLR, we first perform dense sampling in the nonfrontal face image to obtain many overlapped local patches. Then, the linear regression technique is applied to each small patch for the prediction of its virtual frontal patch. Through the combination of all these patches, the virtual frontal view is generated. The experimental results on the CMU PIE database show distinct advantage of the proposed method over Eigen light-field method.
Chai
Xiujuan
X
Harbin Institute of Technology, Harbin 150001, China. xjchai@jdl.ac.cn
Shan
Shiguang
S
Chen
Xilin
X
Gao
Wen
W
D000465:Algorithms; D001185:Artificial Intelligence; D001699:Biometry / Q000379:methods*; D003198:Computer Simulation; D005145:Face / Q000033:anatomy & histology*; D005149:Facial Expression; D006801:Humans; D007089:Image Enhancement / Q000379:methods; D007090:Image Interpretation, Computer-Assisted / Q000379:methods*; D016014:Linear Models; D008954:Models, Biological; D015233:Models, Statistical; D010363:Pattern Recognition, Automated / Q000379:methods*; D012044:Regression Analysis; D015203:Reproducibility of Results; D012680:Sensitivity and Specificity