title: Atomic-scale imaging in real and energy space developed in ultrafast electron microscopy.
abstract: In this contribution, we report the development of ultrafast electron microscopy (UEM) with atomic-scale real-, energy-, and Fourier-space resolutions. This second-generation UEM provides images, diffraction patterns, and electron energy spectra, and here we demonstrate its potential with applications for nanostructured materials and organometallic crystals. We clearly resolve the separation between atoms in the direct images and the Bragg spots/Debye-Scherrer rings in diffraction and obtain the electronic structure and elemental energies in the electron energy loss spectra (EELS) and energy filtered transmission electron microscopy (EFTEM).
authors.affiliation: Physical Biology Center for Ultrafast Science and Technology, Arthur Amos Noyes Laboratory of Chemical Physics, California Institute of Technology, Pasadena, California 91125, USA.
authors.forename: Hyun Soon
authors.initials: HS
authors.lastname: Park
authors.forename: J Spencer
authors.initials: JS
authors.lastname: Baskin
authors.forename: Oh-Hoon
authors.initials: OH
authors.lastname: Kwon
authors.forename: Ahmed H
authors.initials: AH
authors.lastname: Zewail
mesh_terms: D003199:Computer Systems; D004867:Equipment Design; D007089:Image Enhancement / Q000295:instrumentation* / Q000379:methods*; D008854:Microscopy, Electron / Q000295:instrumentation* / Q000379:methods* / Q000639:trends; D053758:Nanoparticles / Q000648:ultrastructure*