RF sputter deposited nanocrystalline (110) magnetite thin film from alpha-Fe2O3 target.
Nanocrystalline magnetite thin film was prepared on to fused quartz substrate by sputtering at an rf power of 50 W. X-ray diffraction study showed that the sputtered film was (110) oriented. The stoichiometry in the thin film has been confirmed through a variety of characterization techniques. The room temperature spontaneous magnetization value (4piMs) of the film was 5100 G. This is about 85% of the bulk value. The resistivity of the film showed a sharp change around 120 K, indicative of the Verwey transition.
Bohra
Murtaza
M
Department of Physics, Indian Institute of Technology Bombay, Mumbai 400076, India.
Venkataramani
N
N
Prasad
Shiva
S
Kumar
Naresh
N
Misra
D S
DS
Sahoo
S C
SC
Krishnan
R
R