[Study on extracting raman spectra of single component and structure from impure amorphous spectra].
X-ray diffraction and Raman spectra show that the used amorphous SiC and GaN samples are impure. Adopting the new subtracting method with weighted impurity spectra, we obtained amorphous SiC and GaN Raman spectra involving only single component and structure. The good fitting between the calculated phonon density of states (PDOS) and the reduced Raman spectra confirms that the purified Raman spectra is really the amorphous Raman spectra, and the adopted spectral subtracting method with weighted impurity spectra is successful.
Gao
Min
M
School of Physics, Peking University, Beijing 100871, China. mgao@aphy.iphy.ac.cn
Liu
Wei
W
Yang
Jun-tao
JT
Zhang
Shu-lin
SL
Guo
Hui
H
Zhang
Guo-yi
GY