title: Single-shot terahertz pulse characterization via two-dimensional electro-optic imaging with dual echelons.
abstract: A single-shot measurement of terahertz electromagnetic pulses is implemented using two-dimensional electro-optic imaging with dual echelon optics. The reported embodiment produces sequentially delayed multiprobe beamlets, routinely providing a time window of >10 ps with ~25 fs temporal step sizes. Because of its simplicity and robustness, the technique is ideally suited for real-time ultrashort relativistic electron bunch characterization.
authors.affiliation: Center for Integrated Nanotechnologies, Los Alamos National Laboratory, Los Alamos, New Mexico 87545, USA. kykim@lanl.gov
authors.forename: K Y
authors.initials: KY
authors.lastname: Kim
authors.forename: B
authors.initials: B
authors.lastname: Yellampalle
authors.forename: A J
authors.initials: AJ
authors.lastname: Taylor
authors.forename: G
authors.initials: G
authors.lastname: Rodriguez
authors.forename: J H
authors.initials: JH
authors.lastname: Glownia