Multilayers of oppositely charged SiO2 nanoparticles: effect of surface charge on multilayer assembly.
The growth behavior of all-silica nanoparticle multilayer thin films assembled via layer-by-layer deposition of oppositely charged SiO2 nanoparticles was studied as a function of assembly conditions. Amine-functionalized SiO2 nanoparticles were assembled into multilayers through the use of three different sizes of negatively charged SiO2 nanoparticles. The assembly pH of the nanoparticle suspensions needed to achieve maximum growth for each system was found to be different. However, the surface charge /z/ of the negatively charged silica nanoparticles at the optimal assembly pH was approximately the same, indicating the importance of this parameter in determining the growth behavior of all-nanoparticle multilayers. When /z/ of the negatively charged nanoparticles lies between 0.6z(0) and 1.2z(0) (where z(0) is the pH-independent value of the zeta-potential of the positively charged nanoparticles used in this study), the multilayers show maximum growth for each system. The effect of particle size on the film structure was also investigated. Although nanoparticle size significantly influenced the average bilayer thickness of the multilayers, the porosity and refractive index of multilayers made from nanoparticles of different sizes varied by a small amount. For example, the porosity of the different multilayer systems ranged from 42 to 49%. This study further demonstrates that one-component all-nanoparticle multilayers can be assembled successfully by depositing nanoparticles of the same material but with opposite surface charge.
Lee
Daeyeon
D
Department of Chemical Engineering, Massachusetts Institute of Technology, 77 Massachusetts Avenue, Cambridge, Massachusetts 02139, USA.
Gemici
Zekeriyya
Z
Rubner
Michael F
MF
Cohen
Robert E
RE
D055598:Chemical Phenomena; D002627:Chemistry, Physical; D018625:Microscopy, Atomic Force; D053758:Nanoparticles / Q000737:chemistry* / Q000648:ultrastructure*; D012822:Silicon Dioxide / Q000737:chemistry*; D013499:Surface Properties
D012822:Silicon Dioxide