title: Development of a tabletop time-of-flight mass spectrometer with an ion attachment ionization technique.
abstract: We report a new type of mass spectrometry based on a time-of-flight mass spectrometer combined with an ion attachment ionization technique (IA-TOF). In contrast to electron ionization mass spectra, IA-TOF mass spectra are not complicated by peaks due to fragmentation of the molecular ion; the adduct ion formed in IA does not fragment. We developed a tabletop IA-TOF system and evaluated its performance by analyzing specimens originally in the gas, liquid, and solid phases. We obtained fragment-free spectra covering a mass range up to m/z 3400 with a mass resolution of about 4700. Our IA-TOF system realizes accurate and versatile real-time mass spectrometry.
authors.affiliation: Research Institute of Instrumentation Frontier, National Institute of Advanced Industrial Science and Technology, Central 2, Tsukuba, 305-8568, Japan. naoaki.saito@aist.go.jp
authors.forename: Naoaki
authors.initials: N
authors.lastname: Saito
authors.forename: Jyun-ichi
authors.initials: J
authors.lastname: Nanjyo
authors.forename: Yasuyuki
authors.initials: Y
authors.lastname: Taneda
authors.forename: Yoshiro
authors.initials: Y
authors.lastname: Shiokawa
authors.forename: Mitsumori
authors.initials: M
authors.lastname: Tanimoto