Single-shot terahertz pulse characterization via two-dimensional electro-optic imaging with dual echelons.
A single-shot measurement of terahertz electromagnetic pulses is implemented using two-dimensional electro-optic imaging with dual echelon optics. The reported embodiment produces sequentially delayed multiprobe beamlets, routinely providing a time window of >10 ps with ~25 fs temporal step sizes. Because of its simplicity and robustness, the technique is ideally suited for real-time ultrashort relativistic electron bunch characterization.
Kim
K Y
KY
Center for Integrated Nanotechnologies, Los Alamos National Laboratory, Los Alamos, New Mexico 87545, USA. kykim@lanl.gov
Yellampalle
B
B
Taylor
A J
AJ
Rodriguez
G
G
Glownia
J H
JH