title: High-resolution line-scanning optical coherence microscopy.
abstract: An optical coherence microscopy system based on line illumination and detection is demonstrated. The system uses a Linnik-type interferometer illuminated by a broadband Ti:sapphire laser and detected by a high-speed, line-scan CCD camera. This approach is less sensitive to incoherent scattering and sample motion than full-field imaging. Spatial resolutions of approximately 2 microm x approximately 3 microm(transverse x axial) are achieved. The sensitivity of the system is 93 dB with averaging over 30 line scans. En face real time, cellular-level imaging of biological tissues is demonstrated at approximately 2 frames/s.
authors.affiliation: Department of Electrical Engineering and Computer Science and Research Laboratory of Electronics, Massachusetts Institute of Technology, Cambridge, Massachusetts 02139, USA. chen-yu@mit.edu
authors.forename: Yu
authors.initials: Y
authors.lastname: Chen
authors.forename: Shu-Wei
authors.initials: SW
authors.lastname: Huang
authors.forename: Aaron D
authors.initials: AD
authors.lastname: Aguirre
authors.forename: James G
authors.initials: JG
authors.lastname: Fujimoto
mesh_terms: D000537:Aluminum Oxide; D003106:Colon / Q000473:pathology*; D004867:Equipment Design; D006801:Humans; D007834:Lasers; D008857:Microscopy, Interference / Q000379:methods*; D018715:Microscopy, Video; D055095:Optics and Photonics; D015203:Reproducibility of Results; D012680:Sensitivity and Specificity; D014025:Titanium; D041623:Tomography, Optical Coherence / Q000379:methods*
chemical_list: D014025:Titanium; D000537:Aluminum Oxide