title: [Study on extracting raman spectra of single component and structure from impure amorphous spectra].
abstract: X-ray diffraction and Raman spectra show that the used amorphous SiC and GaN samples are impure. Adopting the new subtracting method with weighted impurity spectra, we obtained amorphous SiC and GaN Raman spectra involving only single component and structure. The good fitting between the calculated phonon density of states (PDOS) and the reduced Raman spectra confirms that the purified Raman spectra is really the amorphous Raman spectra, and the adopted spectral subtracting method with weighted impurity spectra is successful.
authors.affiliation: School of Physics, Peking University, Beijing 100871, China. mgao@aphy.iphy.ac.cn
authors.forename: Min
authors.initials: M
authors.lastname: Gao
authors.forename: Wei
authors.initials: W
authors.lastname: Liu
authors.forename: Jun-tao
authors.initials: JT
authors.lastname: Yang
authors.forename: Shu-lin
authors.initials: SL
authors.lastname: Zhang
authors.forename: Hui
authors.initials: H
authors.lastname: Guo
authors.forename: Guo-yi
authors.initials: GY
authors.lastname: Zhang