Dual-wedge scanning confocal reflectance microscope.
A confocal reflectance microscope has been developed that incorporates a dual-wedge scanner to reduce the size of the device relative to current raster scanning instruments. The scanner is implemented with two prisms that are rotated about the optical axis. Spiral and rosette scans are performed by rotating the prisms in the same or opposite directions, respectively. Experimental measurements show an on-axis lateral resolution of 1.6 microm and optical sectioning of 4.7 microm, which compares with a diffraction-limited resolution of 0.8 and 1.9 microm, respectively.
Department of Electrical and Computer Engineering, The Bernard M. Gordon Center for Subsurface Sensing and ImagingSystems (Gordon-CenSSIS), Northeastern University, Boston, Massachusetts 02115, USA. wwarger@ece.neu.edu
William C
WC
Warger
Charles A
CA
DiMarzio