Active mechanical noise cancellation scanning tunneling microscope.
We present the design and performance of an active mechanical noise cancellation scanning tunneling microscope (STM). This system features two key parts: a "twin-tip" scanner and an active mechanical noise cancellation algorithm. The twin-tip scanner functions as two independent STMs which share nearly the same mechanical transfer function, allowing both STMs to sense nearly identical background mechanical noise. Based on an adaptive digital signal processing technique, the active mechanical noise cancellation algorithm applies the noise sensed by the first STM to concurrently cancel the noise in the second STM and hence allows the second STM to acquire spectroscopy with a significantly improved signal to noise ratio. This system demonstrates long-term stability of the tip-sample tunnel junction and improved spectroscopy measurement in a mechanically noisy environment.
Liu
H
H
Beijing National Laboratory for Condensed Matter Physics, Institute of Physics, Chinese Academy of Sciences, Beijing 100080, China.
Meng
Y
Y
Zhao
H W
HW
Chen
D M
DM
D016477:Artifacts; D004581:Electronics / Q000295:instrumentation*; D004867:Equipment Design; D019544:Equipment Failure Analysis; D016252:Microscopy, Scanning Tunneling / Q000295:instrumentation* / Q000379:methods; D015203:Reproducibility of Results; D012680:Sensitivity and Specificity; D012815:Signal Processing, Computer-Assisted / Q000295:instrumentation*; D014159:Transducers