Stress-corrosion crack growth of Si-Na-K-Mg-Ca-P-O bioactive glasses in simulated human physiological environment.
This paper describes research on the stress-corrosion crack growth (SCCG) behavior of a new series of bioactive glasses designed to fabricate coatings on Ti and Co-Cr-based implant alloys. These glasses should provide improved implant fixation between implant and exhibit good mechanical stability in vivo. It is then important to develop an understanding of the mechanisms that control environmentally assisted crack growth in this new family of glasses and its effect on their reliability. Several compositions have been tested in both static and cyclic loading in simulated body fluid. These show only small dependences of SCCG behavior on the composition. Traditional SCCG mechanisms for silicate glasses appear to be operative for the new bioactive glasses studied here. At higher velocities, hydrodynamic effects reduce growth rates under conditions that would rarely pertain for small natural flaws in devices.
Bloyer
Don R
DR
Materials Sciences Division, Lawrence Berkeley National Laboratory, Berkeley, CA 94720, USA.
McNaney
James M
JM
Cannon
Rowland M
RM
Saiz
Eduardo
E
Tomsia
Antoni P
AP
Ritchie
Robert O
RO
D001672:Biocompatible Materials / Q000737:chemistry*; D002118:Calcium / Q000737:chemistry*; D003035:Cobalt / Q000737:chemistry; D004867:Equipment Design; D005898:Glass / Q000737:chemistry*; D006108:Graphite / Q000737:chemistry; D006801:Humans; D007477:Ions; D008274:Magnesium / Q000737:chemistry*; D008422:Materials Testing; D010100:Oxygen / Q000737:chemistry*; D010758:Phosphorus / Q000737:chemistry*; D011188:Potassium / Q000737:chemistry*; D012825:Silicon / Q000737:chemistry*; D012964:Sodium / Q000737:chemistry*; D013314:Stress, Mechanical; D013499:Surface Properties; D014025:Titanium / Q000737:chemistry
D001672:Biocompatible Materials; D007477:Ions; D010758:Phosphorus; D003035:Cobalt; D006108:Graphite; D012964:Sodium; D014025:Titanium; D008274:Magnesium; D011188:Potassium; D010100:Oxygen; D002118:Calcium; D012825:Silicon
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