title: Probing atomic displacements with thermal differential EXAFS.
abstract: Differential extended X-ray absorption fine structure (DiffEXAFS) is a novel technique for the study of small atomic strains. Here the development of this technique to the measurement of thermally induced strain is presented. Thermal DiffEXAFS measurements have been performed on alpha-Fe and SrF(2), yielding alpha = (11.6 +/- 0.4) x 10(-6) K(-1) and (19 +/- 2) x 10(-6) K(-1), respectively. These are in good agreement with accepted values, proving the viability of the technique. Analysis has revealed sensitivity to mean atomic displacements of 0.3 fm.
authors: Department of Physics, University of Warwick, Coventry CV4 7AL, UK. ruffoni@esrf.fr
authors: M P
authors: MP
authors: Ruffoni
authors: R F
authors: RF
authors: Pettifer
authors: S
authors: S
authors: Pascarelli
authors: A
authors: A
authors: Trapananti
authors: O
authors: O
authors: Mathon