title: Evaluation of top, angle, and side cleaned FIB samples for TEM analysis.
abstract: TEM specimens of a LaAlO(3)/SrTiO(3) multilayer are prepared by FIB with internal lift out. Using a Ga(+1) beam of 5 kV, a final cleaning step yielding top, top-angle, side, and bottom-angle cleaning is performed. Different cleaning procedures, which can be easily implemented in a dual beam FIB system, are described and compared; all cleaning types produce thin lamellae, useful for HRTEM and HAADF-STEM work up to atomic resolution. However, the top cleaned lamellae are strongly affected by the curtain effect. Top-angle cleaned specimens show an amorphous layer of around 5 nm at the specimen surfaces, due to damage and redeposition. Furthermore, it is observed that the LaAlO(3) layers are preferentially destroyed and transformed into amorphous material, during the thinning process.
authors.affiliation: EMAT, University of Antwerp, Groenenborgerlaan 171, B-2020 Antwerp, Belgium. Eduardo.montoyarossi@ua.ac.be
authors.forename: Eduardo
authors.initials: E
authors.lastname: Montoya
authors.forename: Sara
authors.initials: S
authors.lastname: Bals
authors.forename: Marta D
authors.initials: MD
authors.lastname: Rossell
authors.forename: Dominique
authors.initials: D
authors.lastname: Schryvers
authors.forename: Gustaaf
authors.initials: G
authors.lastname: Van Tendeloo
mesh_terms: D000497:Alloys; D046529:Microscopy, Electron, Transmission / Q000295:instrumentation* / Q000379:methods; D013048:Specimen Handling / Q000379:methods*
chemical_list: D000497:Alloys