title: Invited review article: a review of techniques for attaching micro- and nanoparticles to a probe's tip for surface force and near-field optical measurements.
abstract: Cantilevers with single micro- or nanoparticle probes have been widely used for atomic force microscopy surface force measurements and apertureless scanning near-field optical microscopy applications. In this article, I critically review the particle attachment and modification techniques currently available, to help researchers choose the appropriate techniques for specific applications.
authors.affiliation: Chemical Engineering, School of Engineering, University of Newcastle, Callaghan, NSW, Australia. yang_gan@yahoo.com
authors.forename: Yang
authors.initials: Y
authors.lastname: Gan
mesh_terms: D000327:Adsorption; D008422:Materials Testing / Q000295:instrumentation* / Q000379:methods*; D020527:Microscopy, Scanning Probe / Q000295:instrumentation* / Q000379:methods*; D008863:Microspheres; D015336:Molecular Probe Techniques / Q000295:instrumentation*; D053758:Nanoparticles / Q000737:chemistry* / Q000648:ultrastructure; D055095:Optics and Photonics / Q000295:instrumentation; D013314:Stress, Mechanical; D013499:Surface Properties