Atomic Force Microscope Studies of Fullerene Films: Highly Stable C60 fcc (311) Free Surfaces.
Atomic force microscopy and x-ray diffractometry were used to study 1500 A-thick films of pure C(60) grown by sublimation in ultrahigh vacuum onto a CaF(2) (111) substrate. Topographs of the films did not reveal the expected close-packed structures, but they showed instead large regions that correspond to a face-centered cubic (311) surface and distortions of this surface. The open (311) structure may have a relatively low free energy because the low packing density contributes to a high entropy of the exposed surface.
Snyder
E J
EJ
Anderson
M S
MS
Tong
W M
WM
Williams
R S
RS
Anz
S J
SJ
Alvarez
M M
MM
Rubin
Y
Y
Diederich
F N
FN
Whetten
R L
RL