Elemental sensitivity in soft x-ray imaging with a laser-plasma source and a color center detector.
Elemental sensitivity in soft x-ray imaging of thin foils with known thickness is observed using an ultrafast laser-plasma source and a LiF crystal as detector. Measurements are well reproduced by a simple theoretical model. This technique can be exploited for high spatial resolution, wide field of view imaging in the soft x-ray region, and it is suitable for the characterization of thin objects with thicknesses ranging from hundreds down to tens of nanometers.
Calegari
F
F
National Laboratory for Ultrafast and Ultraintense Optical Science, CNR-INFM, Politecnico, Milan, Italy.
Valentini
G
G
Vozzi
C
C
Benedetti
E
E
Cabanillas-Gonzalez
J
J
Faenov
A
A
Gasilov
S
S
Pikuz
T
T
Poletto
L
L
Sansone
G
G
Villoresi
P
P
Nisoli
M
M
De Silvestri
S
S
Stagira
S
S