title: Iterative image-based modeling and control for higher scanning probe microscope performance.
abstract: In this article, we develop an image-based approach to model and control the dynamics of scanning probe microscopes (SPMs) during high-speed operations. SPMs are key enabling tools in the experimental investigation and manipulation of nano- and subnanoscale phenomena; however, the speed at which the SPM probe can be positioned over the sample surface is limited due to adverse dynamic effects. It is noted that SPM speed can be increased using model-based control techniques. Modeling the SPM dynamics is, however, challenging because currently available sensing methods do not measure the SPM tip directly. Additionally, the resolution of currently available sensing methods is limited by noise at higher bandwidth. Our main contribution is an iterative image-based modeling method which overcomes these modeling difficulties (caused by sensing limitations). The method is applied to model an experimental scanning tunneling microscope (STM) system and to achieve high-speed imaging. Specifically, we model the STM up to a frequency of 2000 Hz (corresponds to approximately 23 of the resonance frequency of our system) and achieve approximately 1.2% error in 1 nm square images at that same frequency.
authors.affiliation: Department of Mechanical Engineering, University of Washington, Seattle, WA 98195, USA. gclayton@u.washington.edu
authors.forename: G M
authors.initials: GM
authors.lastname: Clayton
authors.forename: S
authors.initials: S
authors.lastname: Devasia
mesh_terms: D000465:Algorithms; D003198:Computer Simulation; D005246:Feedback; D007089:Image Enhancement / Q000379:methods*; D007090:Image Interpretation, Computer-Assisted / Q000379:methods*; D020527:Microscopy, Scanning Probe / Q000295:instrumentation* / Q000379:methods*; D008962:Models, Theoretical; D015203:Reproducibility of Results; D012680:Sensitivity and Specificity