title: Novel method for characterizing relativistic electron beams in a harsh laser-plasma environment.
abstract: Particle pulses generated by laser-plasma interaction are characterized by ultrashort duration, high particle density, and sometimes a very strong accompanying electromagnetic pulse (EMP). Therefore, beam diagnostics different from those known from classical particle accelerators such as synchrotrons or linacs are required. Easy to use single-shot techniques are favored, which must be insensitive towards the EMP and associated stray light of all frequencies, taking into account the comparably low repetition rates and which, at the same time, allow for usage in very space-limited environments. Various measurement techniques are discussed here, and a space-saving method to determine several important properties of laser-generated electron bunches simultaneously is presented. The method is based on experimental results of electron-sensitive imaging plate stacks and combines these with Monte Carlo-type ray-tracing calculations, yielding a comprehensive picture of the properties of particle beams. The total charge, the energy spectrum, and the divergence can be derived simultaneously for a single bunch.
authors.affiliation: Institut für Laser- und Plasmaphysik, Heinrich-Heine-Universität Düsseldorf, 40225, Düsseldorf, Germany.
authors.forename: B
authors.initials: B
authors.lastname: Hidding
authors.forename: G
authors.initials: G
authors.lastname: Pretzler
authors.forename: M
authors.initials: M
authors.lastname: Clever
authors.forename: F
authors.initials: F
authors.lastname: Brandl
authors.forename: F
authors.initials: F
authors.lastname: Zamponi
authors.forename: A
authors.initials: A
authors.lastname: Lübcke
authors.forename: T
authors.initials: T
authors.lastname: Kämpfer
authors.forename: I
authors.initials: I
authors.lastname: Uschmann
authors.forename: E
authors.initials: E
authors.lastname: Förster
authors.forename: U
authors.initials: U
authors.lastname: Schramm
authors.forename: R
authors.initials: R
authors.lastname: Sauerbrey
authors.forename: E
authors.initials: E
authors.lastname: Kroupp
authors.forename: L
authors.initials: L
authors.lastname: Veisz
authors.forename: K
authors.initials: K
authors.lastname: Schmid
authors.forename: S
authors.initials: S
authors.lastname: Benavides
authors.forename: S
authors.initials: S
authors.lastname: Karsch
mesh_terms: D000465:Algorithms; D003198:Computer Simulation; D017076:Computer-Aided Design; D004583:Electrons; D004867:Equipment Design; D019544:Equipment Failure Analysis; D005740:Gases / Q000737:chemistry*; D006358:Hot Temperature; D007834:Lasers; D008956:Models, Chemical; D011829:Radiation Dosage; D011874:Radiometry / Q000295:instrumentation* / Q000379:methods*; D015203:Reproducibility of Results; D012542:Scattering, Radiation; D012680:Sensitivity and Specificity
chemical_list: D005740:Gases