title: Elemental sensitivity in soft x-ray imaging with a laser-plasma source and a color center detector.
abstract: Elemental sensitivity in soft x-ray imaging of thin foils with known thickness is observed using an ultrafast laser-plasma source and a LiF crystal as detector. Measurements are well reproduced by a simple theoretical model. This technique can be exploited for high spatial resolution, wide field of view imaging in the soft x-ray region, and it is suitable for the characterization of thin objects with thicknesses ranging from hundreds down to tens of nanometers.
authors.affiliation: National Laboratory for Ultrafast and Ultraintense Optical Science, CNR-INFM, Politecnico, Milan, Italy.
authors.forename: F
authors.initials: F
authors.lastname: Calegari
authors.forename: G
authors.initials: G
authors.lastname: Valentini
authors.forename: C
authors.initials: C
authors.lastname: Vozzi
authors.forename: E
authors.initials: E
authors.lastname: Benedetti
authors.forename: J
authors.initials: J
authors.lastname: Cabanillas-Gonzalez
authors.forename: A
authors.initials: A
authors.lastname: Faenov
authors.forename: S
authors.initials: S
authors.lastname: Gasilov
authors.forename: T
authors.initials: T
authors.lastname: Pikuz
authors.forename: L
authors.initials: L
authors.lastname: Poletto
authors.forename: G
authors.initials: G
authors.lastname: Sansone
authors.forename: P
authors.initials: P
authors.lastname: Villoresi
authors.forename: M
authors.initials: M
authors.lastname: Nisoli
authors.forename: S
authors.initials: S
authors.lastname: De Silvestri
authors.forename: S
authors.initials: S
authors.lastname: Stagira