title: Demonstration of high-performance compact magnetic shields for chip-scale atomic devices.
abstract: We have designed and tested a set of five miniature nested magnetic shields constructed of high-permeability material, with external volumes for the individual shielding layers ranging from 0.01 to 2.5 cm(3). We present measurements of the longitudinal and transverse shielding factors (the ratio of external to internal magnetic field) of both individual shields and combinations of up to three layers. The largest shielding factor measured was 6 x 10(6) for a nested set of three shields, and from our results we predict a shielding factor of up to 1 x 10(13) when all five shields are used. Two different techniques were used to measure the internal field: a chip-scale atomic magnetometer and a commercially available magnetoresistive sensor. Measurements with the two methods were in good agreement.
authors.affiliation: Time and Frequency Division, National Institute of Standards and Technology, Boulder, CO 80305, USA.
authors.forename: E A
authors.initials: EA
authors.lastname: Donley
authors.forename: E
authors.initials: E
authors.lastname: Hodby
authors.forename: L
authors.initials: L
authors.lastname: Hollberg
authors.forename: J
authors.initials: J
authors.lastname: Kitching
mesh_terms: D003198:Computer Simulation; D004867:Equipment Design; D019544:Equipment Failure Analysis; D008280:Magnetics / Q000295:instrumentation*; D008904:Miniaturization; D008962:Models, Theoretical; D011829:Radiation Dosage; D011835:Radiation Protection / Q000295:instrumentation* / Q000379:methods; D011874:Radiometry / Q000379:methods*