title: Atomic Force Microscope Studies of Fullerene Films: Highly Stable C60 fcc (311) Free Surfaces.
abstract: Atomic force microscopy and x-ray diffractometry were used to study 1500 A-thick films of pure C(60) grown by sublimation in ultrahigh vacuum onto a CaF(2) (111) substrate. Topographs of the films did not reveal the expected close-packed structures, but they showed instead large regions that correspond to a face-centered cubic (311) surface and distortions of this surface. The open (311) structure may have a relatively low free energy because the low packing density contributes to a high entropy of the exposed surface.
authors.forename: E J
authors.initials: EJ
authors.lastname: Snyder
authors.forename: M S
authors.initials: MS
authors.lastname: Anderson
authors.forename: W M
authors.initials: WM
authors.lastname: Tong
authors.forename: R S
authors.initials: RS
authors.lastname: Williams
authors.forename: S J
authors.initials: SJ
authors.lastname: Anz
authors.forename: M M
authors.initials: MM
authors.lastname: Alvarez
authors.forename: Y
authors.initials: Y
authors.lastname: Rubin
authors.forename: F N
authors.initials: FN
authors.lastname: Diederich
authors.forename: R L
authors.initials: RL
authors.lastname: Whetten