title: Dispersion properties of silicon nanophotonic waveguides investigated with Fourier optics.
abstract: We experimentally investigate the dispersion relation of silicon-on-insulator waveguides in the 1.5 microm wavelength range by using a technique based on far-field Fourier-space imaging. The phase information of the propagating modes is transferred into the far field either by linear probe gratings positioned 1 microm away from the waveguide core or by residual gratings located on the sidewalls of the waveguide. As a result, the dispersion curve of rectangular and slot waveguides as well as the group index dispersion are accurately determined.
authors.affiliation: Institut de Photonique et d'Electronique Quantiques, Ecole Polytechnique Fédérale de Lausanne (EPFL), CH-1015, Lausanne, Switzerland.
authors.forename: J
authors.initials: J
authors.lastname: Jágerská
authors.forename: N
authors.initials: N
authors.lastname: Le  Thomas
authors.forename: R
authors.initials: R
authors.lastname: Houdré
authors.forename: J
authors.initials: J
authors.lastname: Bolten
authors.forename: C
authors.initials: C
authors.lastname: Moormann
authors.forename: T
authors.initials: T
authors.lastname: Wahlbrink
authors.forename: J
authors.initials: J
authors.lastname: Ctyroký
authors.forename: M
authors.initials: M
authors.lastname: Waldow
authors.forename: M
authors.initials: M
authors.lastname: Först