Dispersion properties of silicon nanophotonic waveguides investigated with Fourier optics.
We experimentally investigate the dispersion relation of silicon-on-insulator waveguides in the 1.5 microm wavelength range by using a technique based on far-field Fourier-space imaging. The phase information of the propagating modes is transferred into the far field either by linear probe gratings positioned 1 microm away from the waveguide core or by residual gratings located on the sidewalls of the waveguide. As a result, the dispersion curve of rectangular and slot waveguides as well as the group index dispersion are accurately determined.
Jágerská
J
J
Institut de Photonique et d'Electronique Quantiques, Ecole Polytechnique Fédérale de Lausanne (EPFL), CH-1015, Lausanne, Switzerland.
Le  Thomas
N
N
Houdré
R
R
Bolten
J
J
Moormann
C
C
Wahlbrink
T
T
Ctyroký
J
J
Waldow
M
M
Först
M
M