Multivariate statistical analysis of three-spatial-dimension TOF-SIMS raw data sets.
Three-spatial-dimension (3D) time-of-flight-secondary ion mass spectrometry (TOF-SIMS) analysis can be performed if an X-Y image is saved at each depth of a depth profile. In this paper, we will show how images reconstructed from specified depths, depth profiles generated from specific X-Y coordinates, as well as three-spatial-dimensional rendering provide for a better understanding of the sample than traditional depth profiling where only a single spectrum is collected at each depth. We will also demonstrate, for the first time, that multivariate statistical analysis (MVSA) tools can be used to perform a rapid, unbiased analysis of the entire 3D data set. In the example shown here, retrospective analysis and MVSA revealed a more complete picture of the 3D chemical distribution of the sample than did the as-measured depth profiling alone. Color overlays of the MVSA components as well as animated movies allowing for visualization (in 3D) from various angles will be provided.
Smentkowski
V S
VS
General Electric, Global Research, Niskayuna, New York 12309, USA. smentkow@research.ge.com
Ostrowski
S G
SG
Braunstein
E
E
Keenan
M R
MR
Ohlhausen
J A
JA
Kotula
P G
PG