Baseline noise and measurement uncertainty in liquid chromatography.
The stochastic properties of baseline noise in HPLC systems with a UV photo-diode array, photo-multiplier and gamma-ray detector were examined by dividing the noise into auto-correlated random process (Markov process) and an independent process (white noise). The present work focused on the effect of the stochastic noise properties on a theoretical estimation of the standard deviation (SD) of area measurements in instrumental analyses. An estimation theory, called FUMI theory (Function of Mutual Information), was taken as an example. A computer simulation of noise was also used. It was shown that the reliability (confidence intervals) of theoretical SD estimates mainly depends on the following factors: the ratio of the white noise and Markov process occurring in the baselines; the number of data points used for the estimation; the width of a target peak for which the SD is estimated.
Kitajima
Akihito
A
Daiichi Radioisotope Laboratories, Chiba, Japan.
Kashirajima
Takeshi
T
Minamizawa
Takao
T
Sato
Hiroyasu
H
Iwaki
Kazuo
K
Ueda
Taisuke
T
Kimura
Yoshio
Y
Toyo'oka
Toshimasa
T
Maitani
Tamio
T
Matsuda
Rieko
R
Hayashi
Yuzuru
Y
D002853:Chromatography, Liquid / Q000379:methods*; D012107:Research Design; D035501:Uncertainty