title: Baseline noise and measurement uncertainty in liquid chromatography.
abstract: The stochastic properties of baseline noise in HPLC systems with a UV photo-diode array, photo-multiplier and gamma-ray detector were examined by dividing the noise into auto-correlated random process (Markov process) and an independent process (white noise). The present work focused on the effect of the stochastic noise properties on a theoretical estimation of the standard deviation (SD) of area measurements in instrumental analyses. An estimation theory, called FUMI theory (Function of Mutual Information), was taken as an example. A computer simulation of noise was also used. It was shown that the reliability (confidence intervals) of theoretical SD estimates mainly depends on the following factors: the ratio of the white noise and Markov process occurring in the baselines; the number of data points used for the estimation; the width of a target peak for which the SD is estimated.
authors: Daiichi Radioisotope Laboratories, Chiba, Japan.
authors: Akihito
authors: A
authors: Kitajima
authors: Takeshi
authors: T
authors: Kashirajima
authors: Takao
authors: T
authors: Minamizawa
authors: Hiroyasu
authors: H
authors: Sato
authors: Kazuo
authors: K
authors: Iwaki
authors: Taisuke
authors: T
authors: Ueda
authors: Yoshio
authors: Y
authors: Kimura
authors: Toshimasa
authors: T
authors: Toyo'oka
authors: Tamio
authors: T
authors: Maitani
authors: Rieko
authors: R
authors: Matsuda
authors: Yuzuru
authors: Y
authors: Hayashi
mesh_terms: D002853:Chromatography, Liquid / Q000379:methods*; D012107:Research Design; D035501:Uncertainty