title: Calibration methods for a multi-channel multi-frequency EIT system.
abstract: Multi-channel multi-frequency electrical impedance tomography (EIT) systems require a careful calibration to minimize systematic errors. We describe novel calibration methods for the recently developed KHU Mark1 EIT system. Current source calibration includes maximization of output resistance and minimization of output capacitance using multiple generalized impedance converters. Phase and gain calibrations are used for voltmeters. Phase calibration nulls out the total system phase shift in measured voltage data. Gain calibrations are performed in two steps of intra- and inter-channel calibrations. Intra-channel calibration for each voltmeter compensates frequency dependence of its voltage gain and also discrepancy between design and actual gains. Inter-channel calibration compensates channel-dependent voltage gains of all voltmeters. Using the calibration methods described in this paper, we obtained 1 MOmega minimal output impedance of the current source in the frequency range 10 Hz-500 kHz. The reciprocity error was as small as 0.05% after intra- and inter-channel voltmeter calibrations. To demonstrate effects of calibration in reconstructed images, we used a homogenous phantom from which uniform images should be produced. Reconstructed time- and frequency-difference images using uncalibrated data showed spurious anomalies. By using calibrated data, standard deviations of time- and frequency-difference images of the homogenous phantom were reduced by about 40% and 90%, respectively.
authors: College of Electronics and Information, Kyung Hee University, Korea.
authors: Tong In
authors: TI
authors: Oh
authors: Kyung Heon
authors: KH
authors: Lee
authors: Sang Min
authors: SM
authors: Kim
authors: Hwan
authors: H
authors: Koo
authors: Eung Je
authors: EJ
authors: Woo
authors: David
authors: D
authors: Holder
mesh_terms: D002138:Calibration; D017097:Electric Impedance; D019047:Phantoms, Imaging; D013997:Time Factors; D014054:Tomography / Q000379:methods*