title: Spatial effect on the interference of light propagated in a film structure.
abstract: The interference of light has been analyzed for a film structure by considering that a spatial separation exists for the two neighboring light beams to be interfered in the space. There is a significant difference between the situations of the interference with or without consideration of the spatial effect, especially around the region where the phase delay delta=pi and 2pi by taking the example of the one-layered SiO2/Si structure. It is reasonable to extract the optical parameters by neglecting the spatial effect only for the thinner film with a thickness much smaller than a wavelength, which satisfies the condition that delta<pi; otherwise, the film equation used for the periodic or nonperiodic structures will be modified by including the spatial effect in the data analysis and applications.
authors: Department of Optical Science and Engineering, State Key Laboratory of Advanced Photonic Materials and Devices, Fudan University, Shanghai, China.
authors: Ming-Yu
authors: MY
authors: Sheng
authors: Yun-Hua
authors: YH
authors: Wu
authors: Shou-Zhi
authors: SZ
authors: Feng
authors: Yue-Rui
authors: YR
authors: Chen
authors: Yu-Xiang
authors: YX
authors: Zheng
authors: Liang-Yao
authors: LY
authors: Chen