title: Enlarged atomic force microscopy scanning scope: novel sample-holder device with millimeter range.
abstract: We propose a homemade sample-holder unit used for nanopositionning in two dimensions with a millimeter traveling range. For each displacement axis, the system includes a long range traveling stage and a piezoelectric actuator for accurate positioning. Specific electronics is integrated according to metrological considerations, enhancing the repeatability performances. The aim of this work is to demonstrate that near-field microscopy at the scale of a chip is possible. For this we chose to characterize highly integrated optical structures. For this purpose, the sample holder was integrated into an atomic force microscope. A millimeter scale topographical image demonstrates the overall performances of the combined system.
authors: LISV, University of Versailles, 45 Avenue des Etats Unis, 78035 Versailles, France.
authors: A
authors: A
authors: Sinno
authors: P
authors: P
authors: Ruaux
authors: L
authors: L
authors: Chassagne
authors: S
authors: S
authors: Topçu
authors: Y
authors: Y
authors: Alayli
authors: G
authors: G
authors: Lerondel
authors: S
authors: S
authors: Blaize
authors: A
authors: A
authors: Bruyant
authors: P
authors: P
authors: Royer