title: Inspection of refractive X-ray lenses using high-resolution differential phase contrast imaging with a microfocus X-ray source.
abstract: A refractive x-ray lens was characterized using a magnifying cone beam setup for differential phase contrast imaging in combination with a microfocus x-ray tube. Thereby, the differential and the total phase shift of x rays transmitted through the lens were determined. Lens aberrations have been characterized based on these refractive properties.
authors: Siemens AG, Corporate Technology, 81739 Munich, Germany. martin.engelhardt.ext@siemens.com
authors: Martin
authors: M
authors: Engelhardt
authors: Joachim
authors: J
authors: Baumann
authors: Manfred
authors: M
authors: Schuster
authors: Christian
authors: C
authors: Kottler
authors: Franz
authors: F
authors: Pfeiffer
authors: Oliver
authors: O
authors: Bunk
authors: Christian
authors: C
authors: David