title: Fast, robust, and accurate determination of transmission electron microscopy contrast transfer function.
abstract: Transmission electron microscopy, as most imaging devices, introduces optical aberrations that in the case of thin specimens are usually modeled in Fourier space by the so-called contrast transfer function (CTF). Accurate determination of the CTF is crucial for its posterior correction. Furthermore, the CTF estimation must be fast and robust if high-throughput three-dimensional electron microscopy (3DEM) studies are to be carried out. In this paper we present a robust algorithm that fits a theoretical CTF model to the power spectrum density (PSD) measured on a specific micrograph or micrograph area. Our algorithm is capable of estimating the envelope of the CTF which is absolutely needed for the correction of the CTF amplitude changes.
authors.affiliation: Unidad de Biocomputación, Centro Nacional de Biotecnología (CSIC), Campus Universidad Autónoma s/n, 28049 Cantoblanco, Madrid, Spain. coss.eps@ceu.es
authors.forename: C O S
authors.initials: CO
authors.lastname: Sorzano
authors.forename: S
authors.initials: S
authors.lastname: Jonic
authors.forename: R
authors.initials: R
authors.lastname: Núñez-Ramírez
authors.forename: N
authors.initials: N
authors.lastname: Boisset
authors.forename: J M
authors.initials: JM
authors.lastname: Carazo
mesh_terms: D000465:Algorithms; D001251:Astigmatism / Q000175:diagnosis*; D004867:Equipment Design; D007091:Image Processing, Computer-Assisted / Q000379:methods*; D021621:Imaging, Three-Dimensional; D046529:Microscopy, Electron, Transmission / Q000379:methods*; D015233:Models, Statistical; D016011:Normal Distribution; D015203:Reproducibility of Results; D012984:Software; D013997:Time Factors