title: Microscopic investigation of the memory effect found in micropatterned nematic liquid crystal cells.
abstract: Isotropic untreated indium-tin-oxide layers can cause memory alignment of nematic liquid crystals. We have demonstrated an experimental method to characterize this effect by using a micropatterned surface. We tried to imprint a high tilt on an indium-tin-oxide substrate surface. We also investigated microscopic switching behavior of a memory-induced nematic liquid crystal cell by means of a vertical field effect.
authors.affiliation: Department of Electrical Engineering, Faculty of Engineering, Nagaoka University of Technology, 1603-1 Kamitomioka, Nagaoka, Niigata 940-2188, Japan. tno2002@stn.nagaokaut.ac.jp
authors.forename: Thet Naing
authors.initials: TN
authors.lastname: Oo
authors.forename: Yuuki
authors.initials: Y
authors.lastname: Yasu
authors.forename: Munehiro
authors.initials: M
authors.lastname: Kimura
authors.forename: Tadashi
authors.initials: T
authors.lastname: Akahane