title: Thickness difference: a new filtering tool for quantitative electron diffraction.
abstract: A new way of filtering electron diffraction patterns has been discovered. Patterns from slightly different specimen thicknesses beyond the mean free path for inelastic scattering are subtracted. Only thickness sensitive information (dominantly elastic) remains. Thermal diffuse scattering and Borrmann effects are removed in addition to the inelastic signal eliminated by conventional energy filtering. One application is quantitative convergent beam electron diffraction without an energy filter. Structure factors for alpha - Al(2)O(3) have been measured with an average uncertainty of 0.25%.
authors.affiliation: Department of Materials Engineering, Monash University, Clayton Vic 3800, Australia. Philip.Nakashima@eng.monash.edu.au
authors.forename: Philip N H
authors.initials: PN
authors.lastname: Nakashima