Approximate transient and long time limit solutions for the band broadening induced by the thin sidewall-layer in liquid chromatography columns.
Using a combination of both analytical and numerical techniques, approximate analytical expressions have been established for the transient and long time limit band broadening, originating from the presence of a thin disturbed sidewall layer in liquid chromatography columns, including packed, monolithic as well as microfabricated columns. The established expressions can be used to compare the importance of a thin disturbed sidewall layer with that of other radial heterogeneity effects (such as transcolumn packing density variations due to the relief of packing stresses). The expressions are independent of the actual velocity profile inside the layer as long as the disturbed sidewall layer occupies less than 2.5% of the column width.
Broeckhoven
Ken
K
Department of Chemical Engineering, Vrije Universiteit Brussel, Pleinlaan 2, B-1050 Brussels, Belgium.
Desmet
Gert
G
D000465:Algorithms; D002850:Chromatography, Gel / Q000592:standards; D002851:Chromatography, High Pressure Liquid / Q000295:instrumentation / Q000379:methods / Q000592:standards; D002853:Chromatography, Liquid / Q000295:instrumentation / Q000379:methods* / Q000592:standards; D004867:Equipment Design; D007700:Kinetics; D046210:Microfluidic Analytical Techniques / Q000295:instrumentation / Q000379:methods*; D010316:Particle Size; D015203:Reproducibility of Results; D012822:Silicon Dioxide / Q000737:chemistry; D012996:Solutions / Q000592:standards; D013056:Spectrophotometry, Ultraviolet / Q000379:methods; D013816:Thermodynamics
D012996:Solutions; D012822:Silicon Dioxide