title: Integrated semiconductor optical sensors for chronic, minimally-invasive imaging of brain function.
abstract: Intrinsic optical signal (IOS) imaging is a widely accepted technique for imaging brain activity. We propose an integrated device consisting of interleaved arrays of gallium arsenide (GaAs) based semiconductor light sources and detectors operating at telecommunications wavelengths in the near-infrared. Such a device will allow for long-term, minimally invasive monitoring of neural activity in freely behaving subjects, and will enable the use of structured illumination patterns to improve system performance. In this work we describe the proposed system and show that near-infrared IOS imaging at wavelengths compatible with semiconductor devices can produce physiologically significant images in mice, even through skull.
authors.affiliation: Department of Electrical Engineering, Stanford University, Stanford, CA, USA. leet@stanford.edu
authors.forename: Thomas T
authors.initials: TT
authors.lastname: Lee
authors.forename: Ofer
authors.initials: O
authors.lastname: Levi
authors.forename: Jianhua
authors.initials: J
authors.lastname: Cang
authors.forename: Megumi
authors.initials: M
authors.lastname: Kaneko
authors.forename: Michael P
authors.initials: MP
authors.lastname: Stryker
authors.forename: Stephen J
authors.initials: SJ
authors.lastname: Smith
authors.forename: Krishna V
authors.initials: KV
authors.lastname: Shenoy
authors.forename: James S
authors.initials: JS
authors.lastname: Harris
mesh_terms: D000818:Animals; D001921:Brain / Q000502:physiology*; D001931:Brain Mapping / Q000379:methods*; D003952:Diagnostic Imaging / Q000295:instrumentation* / Q000379:methods; D004867:Equipment Design; D019544:Equipment Failure Analysis; D008029:Lighting / Q000295:instrumentation* / Q000379:methods; D051379:Mice; D008810:Mice, Inbred C57BL; D018670:Monitoring, Ambulatory / Q000295:instrumentation* / Q000379:methods; D055095:Optics and Photonics / Q000295:instrumentation*; D010865:Pilot Projects; D012666:Semiconductors; D018511:Systems Integration