Benchmarking of electro-optic monitors for femtosecond electron bunches.
The longitudinal profiles of ultrashort relativistic electron bunches at the soft x-ray free-electron laser FLASH have been investigated using two single-shot detection schemes: an electro-optic (EO) detector measuring the Coulomb field of the bunch and a radio-frequency structure transforming the charge distribution into a transverse streak. A comparison permits an absolute calibration of the EO technique. EO signals as short as 60 fs (rms) have been observed, which is a new record in the EO detection of single electron bunches and close to the limit given by the EO material properties.
Berden
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FOM Institute for Plasma Physics Rijnhuizen, Edisonbaan 14, 3439 MN Nieuwegein, The Netherlands.
Gillespie
W A
WA
Jamison
S P
SP
Knabbe
E-A
EA
MacLeod
A M
AM
van der Meer
A F G
AF
Phillips
P J
PJ
Schlarb
H
H
Schmidt
B
B
Schmüser
P
P
Steffen
B
B