title: Novel x-ray multispectral imaging of ultraintense laser plasmas by a single-photon charge coupled device based pinhole camera.
abstract: Spectrally resolved two-dimensional imaging of ultrashort laser-produced plasmas is described, obtained by means of an advanced technique. The technique has been tested with microplasmas produced by ultrashort relativistic laser pulses. The technique is based on the use of a pinhole camera equipped with a charge coupled device detector operating in the single-photon regime. The spectral resolution is about 150 eV in the 4-10 keV range, and images in any selected photon energy range have a spatial resolution of 5 microm. The potential of the technique to study fast electron propagation in ultraintense laser interaction with multilayer targets is discussed and some preliminary results are shown.
authors.affiliation: Intense Laser Irradiation Laboratory, IPCF, Consiglio Nazionale delle Ricerche, Via Moruzzi 1, 56124 Pisa, Italy. luca.labate@ipcf.cnr.it
authors.forename: L
authors.initials: L
authors.lastname: Labate
authors.forename: A
authors.initials: A
authors.lastname: Giulietti
authors.forename: D
authors.initials: D
authors.lastname: Giulietti
authors.forename: P
authors.initials: P
authors.lastname: Köster
authors.forename: T
authors.initials: T
authors.lastname: Levato
authors.forename: L A
authors.initials: LA
authors.lastname: Gizzi
authors.forename: F
authors.initials: F
authors.lastname: Zamponi
authors.forename: A
authors.initials: A
authors.lastname: Lübcke
authors.forename: T
authors.initials: T
authors.lastname: Kämpfer
authors.forename: I
authors.initials: I
authors.lastname: Uschmann
authors.forename: E
authors.initials: E
authors.lastname: Förster
mesh_terms: D004867:Equipment Design; D019544:Equipment Failure Analysis; D005740:Gases / Q000032:analysis* / Q000737:chemistry*; D006358:Hot Temperature; D007089:Image Enhancement / Q000295:instrumentation* / Q000379:methods; D007090:Image Interpretation, Computer-Assisted / Q000295:instrumentation* / Q000379:methods; D007834:Lasers; D015203:Reproducibility of Results; D012666:Semiconductors; D012680:Sensitivity and Specificity; D012815:Signal Processing, Computer-Assisted / Q000295:instrumentation*; D013052:Spectrometry, X-Ray Emission / Q000295:instrumentation* / Q000379:methods
chemical_list: D005740:Gases