title: Demonstration of magnetoelectric scanning probe microscopy.
abstract: A near-field room temperature scanning magnetic probe microscope has been developed using a laminated magnetoelectric sensor. The simple trilayer longitudinal-transverse mode sensor, fabricated using Metglas as the magnetostrictive layer and polyvinylidene fluoride as the piezoelectric layer, shows an ac field sensitivity of 467+/-3 microV/Oe in the measured frequency range of 200 Hz-8 kHz. The microscope was used to image a 2 mm diameter ring carrying an ac current as low as 10(-5) A. ac fields as small as 3 x 10(-10) T have been detected.
authors.affiliation: Department of Materials Science and Engineering, University of Maryland, College Park, Maryland 20742, USA.
authors.forename: Jason R
authors.initials: JR
authors.lastname: Hattrick-Simpers
authors.forename: Liyang
authors.initials: L
authors.lastname: Dai
authors.forename: Manfred
authors.initials: M
authors.lastname: Wuttig
authors.forename: Ichiro
authors.initials: I
authors.lastname: Takeuchi
authors.forename: Eckhard
authors.initials: E
authors.lastname: Quandt
mesh_terms: D055590:Electromagnetic Phenomena / Q000295:instrumentation* / Q000379:methods; D004867:Equipment Design; D019544:Equipment Failure Analysis; D020527:Microscopy, Scanning Probe / Q000295:instrumentation* / Q000379:methods; D010865:Pilot Projects; D015203:Reproducibility of Results; D012680:Sensitivity and Specificity