title: Spatial distribution maps for atom probe tomography.
abstract: A real-space technique for finding structural information in atom probe tomographs, spatial distribution maps (SDM), is described. The mechanics of the technique are explained, and it is then applied to some test cases. Many applications of SDM in atom probe tomography are illustrated with examples including finding crystal lattices, correcting lattice strains in reconstructed images, quantifying trajectory aberrations, quantifying spatial resolution, quantifying chemical ordering, dark-field imaging, determining orientation relationships, extracting radial distribution functions, and measuring ion detection efficiency.
authors.affiliation: Imago Scientific Instruments Corporation, 5500 Nobel Drive, Madison, Wisconsin 53711-4951, USA.
authors.forename: Brian P
authors.initials: BP
authors.lastname: Geiser
authors.forename: Thomas F
authors.initials: TF
authors.lastname: Kelly
authors.forename: David J
authors.initials: DJ
authors.lastname: Larson
authors.forename: Jason
authors.initials: J
authors.lastname: Schneir
authors.forename: Jay P
authors.initials: JP
authors.lastname: Roberts