Harnessing bifurcations in tapping-mode atomic force microscopy to calibrate time-varying tip-sample force measurements.
Torsional harmonic cantilevers allow measurement of time-varying tip-sample forces in tapping-mode atomic force microscopy. Accuracy of these force measurements is important for quantitative nanomechanical measurements. Here we demonstrate a method to convert the torsional deflection signals into a calibrated force wave form with the use of nonlinear dynamical response of the tapping cantilever. Specifically the transitions between steady oscillation regimes are used to calibrate the torsional deflection signals.
Sahin
Ozgur
O
The Rowland Institute at Harvard, Harvard University, Cambridge, Massachusetts 02142, USA. sahin@rowland.harvard.edu
D002138:Calibration; D004867:Equipment Design; D019544:Equipment Failure Analysis; D007089:Image Enhancement / Q000379:methods* / Q000592:standards; D007090:Image Interpretation, Computer-Assisted / Q000379:methods* / Q000592:standards; D018625:Microscopy, Atomic Force / Q000295:instrumentation* / Q000379:methods / Q000592:standards; D015203:Reproducibility of Results; D012680:Sensitivity and Specificity; D013314:Stress, Mechanical; D014481:United States