title: Device for characterization of thermal effusivity of liquids using photothermal beam deflection.
abstract: We propose and study a novel optoelectronic device for thermal characterization of materials. It is based on monitoring the photothermal deflection of a laser beam within a slab of a thermo-optic material in thermal contact with the sample under study. An optical angle sensor is used to measure the laser deflection providing a simple and experimental arrangement. We demonstrate its principle and a simple procedure to measure thermal effusivity of liquids. The proposed device could be implemented into a compact sensor head for remote measurements using electrical and fiber optic links.
authors.affiliation: Centro de Ciencias Aplicadas y Desarrollo Tecnológico, Universidad Nacional Autónoma de México, A. P. 70-186, Distrito Federal 04510, Mexico.
authors.forename: G E
authors.initials: GE
authors.lastname: Sandoval-Romero
authors.forename: A
authors.initials: A
authors.lastname: García-Valenzuela
authors.forename: C
authors.initials: C
authors.lastname: Sánchez-Pérez
authors.forename: J
authors.initials: J
authors.lastname: Hernández-Cordero
authors.forename: Kyrill L
authors.initials: KL
authors.lastname: Muratikov
mesh_terms: D003198:Computer Simulation; D017076:Computer-Aided Design; D004867:Equipment Design; D019544:Equipment Failure Analysis; D007834:Lasers; D044085:Microfluidics / Q000295:instrumentation* / Q000379:methods; D008962:Models, Theoretical; D011829:Radiation Dosage; D011874:Radiometry / Q000295:instrumentation* / Q000379:methods; D015203:Reproducibility of Results; D012680:Sensitivity and Specificity; D013814:Thermal Conductivity; D013817:Thermography / Q000295:instrumentation* / Q000379:methods