Time-resolved synchrotron radiation excited optical luminescence: light-emission properties of silicon-based nanostructures.
The recent advances in the study of light emission from matter induced by synchrotron radiation: X-ray excited optical luminescence (XEOL) in the energy domain and time-resolved X-ray excited optical luminescence (TRXEOL) are described. The development of these element (absorption edge) selective, synchrotron X-ray photons in, optical photons out techniques with time gating coincide with advances in third-generation, insertion device based, synchrotron light sources. Electron bunches circulating in a storage ring emit very bright, widely energy tunable, short light pulses (<100 ps), which are used as the excitation source for investigation of light-emitting materials. Luminescence from silicon nanostructures (porous silicon, silicon nanowires, and Si-CdSe heterostructures) is used to illustrate the applicability of these techniques and their great potential in future applications.
Sham
Tsun-Kong
TK
Department of Chemistry, University of Western Ontario, London, ON, N6A 5B7, Canada. tsham@uwo.ca
Rosenberg
Richard A
RA
D015502:Absorptiometry, Photon / Q000379:methods; D002104:Cadmium / Q000737:chemistry; D004583:Electrons; D008027:Light; D049449:Luminescence; D053768:Metal Nanoparticles / Q000737:chemistry*; D049329:Nanostructures; D036103:Nanotechnology / Q000379:methods*; D053770:Nanowires / Q000737:chemistry; D055095:Optics and Photonics; D017785:Photons; D012825:Silicon / Q000737:chemistry*; D017356:Synchrotrons; D013997:Time Factors; D014965:X-Rays
D002104:Cadmium; D012825:Silicon