Mass and position determination of attached particles on cantilever based mass sensors.
An analytical expression relating mass and position of a particle attached on a cantilever to the resulting change in cantilever resonant frequency is derived. Theoretically, the position and mass of the attached particle can be deduced by combining measured resonant frequencies of several bending modes. This finding is verified experimentally using a microscale cantilever with and without an attached gold bead. The resonant frequencies of several bending modes are measured as a function of the bead position. The bead mass and position calculated from the measured resonant frequencies are in good agreement with the expected mass and the position measured.
Dohn
S
S
MIC, Department of Micro- and Nanotechnology, NanoDTU, Technical University of Denmark, Building 345E, DK-2800 Lyngby, Denmark. sd@mic.dtu.dk
Svendsen
W
W
Boisen
A
A
Hansen
O
O
D003198:Computer Simulation; D017076:Computer-Aided Design; D004548:Elasticity; D004867:Equipment Design; D019544:Equipment Failure Analysis; D008422:Materials Testing / Q000295:instrumentation* / Q000379:methods; D008962:Models, Theoretical; D008970:Molecular Weight; D009038:Motion; D036103:Nanotechnology / Q000295:instrumentation* / Q000379:methods; D010316:Particle Size; D015203:Reproducibility of Results; D012680:Sensitivity and Specificity; D013314:Stress, Mechanical; D014159:Transducers