title: A dose-rate effect in single-particle electron microscopy.
abstract: A low beam intensity, low electron dose imaging method has been developed for single-particle electron cryo-microscopy (cryo-EM). Experiments indicate that the new technique can reduce beam-induced specimen movement and secondary radiolytic effects, such as "bubbling". The improvement in image quality, especially for multiple-exposure data collection, will help single-particle cryo-EM to reach higher resolution.
authors.affiliation: Howard Hughes Medical Institute, Rosenstiel Center-MS029, Brandeis University, 415 South Street, Waltham, MA 02545-9110, USA.
authors.forename: James Z
authors.initials: JZ
authors.lastname: Chen
authors.forename: Carsten
authors.initials: C
authors.lastname: Sachse
authors.forename: Chen
authors.initials: C
authors.lastname: Xu
authors.forename: Thorsten
authors.initials: T
authors.lastname: Mielke
authors.forename: Christian M T
authors.initials: CM
authors.lastname: Spahn
authors.forename: Nikolaus
authors.initials: N
authors.lastname: Grigorieff
mesh_terms: D020285:Cryoelectron Microscopy / Q000379:methods*; D007091:Image Processing, Computer-Assisted / Q000379:methods*; D014027:Tobacco Mosaic Virus / Q000648:ultrastructure