title: Lateral force microscope calibration using a modified atomic force microscope cantilever.
abstract: A proof-of-concept study is presented for a prototype atomic force microscope (AFM) cantilever and associated calibration procedure that provide a path for quantitative friction measurement using a lateral force microscope (LFM). The calibration procedure is based on the method proposed by Feiler et al. [Rev. Sci. Instrum. 71, 2746 (2000)] but allows for calibration and friction measurements to be carried out in situ and with greater precision. The modified AFM cantilever is equipped with lateral lever arms that facilitate the application of normal and lateral forces, comparable to those acting in a typical LFM friction experiment. The technique allows the user to select acceptable precision via a potentially unlimited number of calibration measurements across the full working range of the LFM photodetector. A microfabricated version of the cantilever would be compatible with typical commercial AFM instrumentation and allow for common AFM techniques such as topography imaging and other surface force measurements to be performed.
authors.affiliation: Materials Science and Engineering Laboratory, National Institute of Standards and Technology, 100 Bureau Drive, Gaithersburg, Maryland 20899, USA. mark.reitsma@nist.gov
authors.forename: M G
authors.initials: MG
authors.lastname: Reitsma
mesh_terms: D000465:Algorithms; D002138:Calibration; D004867:Equipment Design; D019544:Equipment Failure Analysis; D008422:Materials Testing / Q000295:instrumentation* / Q000592:standards*; D018625:Microscopy, Atomic Force / Q000295:instrumentation* / Q000592:standards*; D015203:Reproducibility of Results; D012680:Sensitivity and Specificity; D013314:Stress, Mechanical; D014481:United States