title: Characterization of T-ray binary lenses.
abstract: Multilevel phase-shift Fresnel diffractive zone plates fabricated on silicon wafers have been used as T-ray imaging lenses. The imaging results, including spatial and temporal distribution of T-rays measured at the focal planes in the frequency range from 0.5 to 1.5 THz, indicate that the performance of the diffractive terahertz (THz) lens is comparable with or better than that of conventional refractive THz lenses. The unique properties of the T-ray binary lens make it possible to fabricate excellent optics for narrow-band THz applications.
authors.forename: S
authors.initials: S
authors.lastname: Wang
authors.forename: T
authors.initials: T
authors.lastname: Yuan
authors.forename: E D
authors.initials: ED
authors.lastname: Walsby
authors.forename: R J
authors.initials: RJ
authors.lastname: Blaikie
authors.forename: S M
authors.initials: SM
authors.lastname: Durbin
authors.forename: D R S
authors.initials: DR
authors.lastname: Cumming
authors.forename: J
authors.initials: J
authors.lastname: Xu
authors.forename: X-C
authors.initials: XC
authors.lastname: Zhang