Direction-sensitive subwavelength displacement measurements at diffraction-limited spatial resolution.
Direction-sensitive displacement measurements at diffraction-limited spatial resolution are demonstrated with an interferometric optical-feedback semiconductor laser confocal imaging system. Subwavelength axial movements of the reflecting sample, including the directions of motion, are detected within the depth of field. A comparison of theory and actual instrument performance is presented.
Rodrigo
Peter John
PJ
Lim
May
M
Saloma
Caesar
C