Determining the carrier-envelope offset frequency of 5-fs pulses with extreme nonlinear optics in ZnO.
We excite ZnO samples with two-cycle optical pulses directly from a mode-locked oscillator with average powers of several tens of milliwatts. The emitted light reveals peaks at the carrier-envelope offset frequency f(ø) and at 2f(ø) in the radio-frequency spectra. These peaks can still be detected in layers as thin as 350 nm-a step toward determining the carrier-envelope offset phase itself.
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