title: Direction-sensitive subwavelength displacement measurements at diffraction-limited spatial resolution.
abstract: Direction-sensitive displacement measurements at diffraction-limited spatial resolution are demonstrated with an interferometric optical-feedback semiconductor laser confocal imaging system. Subwavelength axial movements of the reflecting sample, including the directions of motion, are detected within the depth of field. A comparison of theory and actual instrument performance is presented.
authors.forename: Peter John
authors.initials: PJ
authors.lastname: Rodrigo
authors.forename: May
authors.initials: M
authors.lastname: Lim
authors.forename: Caesar
authors.initials: C
authors.lastname: Saloma