title: Exploring nanoscale electrical and electronic properties of organic and polymeric functional materials by atomic force microscopy based approaches.
abstract: Beyond imaging, atomic force microscopy (AFM) based methodologies enable the quantitative investigation of a variety of physico-chemical properties of (multicomponent) materials with a spatial resolution of a few nanometers. This Feature Article is focused on two AFM modes, i.e. conducting and Kelvin probe force microscopies, which allow the study of electrical and electronic properties of organic thin films, respectively. These nanotools provide a wealth of information on (dynamic) characteristics of tailor-made functional architectures, opening pathways towards their technological application in electronics, catalysis and medicine.
authors.affiliation: Istituto per la Sintesi Organica e la Fotoreattività, Consiglio Nazionale delle Ricerche, via Gobetti 101, 1-40129 Bologna, Italy.
authors.forename: Vincenzo
authors.initials: V
authors.lastname: Palermo
authors.forename: Andrea
authors.initials: A
authors.lastname: Liscio
authors.forename: Matteo
authors.initials: M
authors.lastname: Palma
authors.forename: Mathieu
authors.initials: M
authors.lastname: Surin
authors.forename: Roberto
authors.initials: R
authors.lastname: Lazzaroni
authors.forename: Paolo
authors.initials: P
authors.lastname: Samorì