title: Normal-incidence reflectance of optimized W /B(4) C x-ray multilayers in the range 1.4 nm < l > 2.4 nm.
abstract: We have fabricated W/B(4)C multilayers having periods in the range d = 0.8-1.2 nm and measured their soft-x-ray performance near normal incidence in the wavelength range 1.4<l<2.4 nm . By adjusting the fractional layer thickness of W we have produced structures having interface widths ó ~ 0.29 nm (i.e., as determined from normal-incidence reflectometry), thus having optimal soft-x-ray performance. We describe our results and discuss their implications, particularly with regard to the development of short-wavelength normal-incidence x-ray optics.
authors.forename: David L
authors.initials: DL
authors.lastname: Windt
authors.forename: Eric M
authors.initials: EM
authors.lastname: Gullikson
authors.forename: Christopher C
authors.initials: CC
authors.lastname: Walton