title: Generalized ellipsometry for biaxial absorbing materials: determination of crystal orientation and optical constants of Sb(2)S(3).
abstract: We demonstrate generalized ellipsometry for precise measurement of the principal indices of refraction, the extinction coefficients, and the orientations of the crystal a, b, and c axes of orthorhombic absorbing materials. Stibnite (Sb(2)S(3)) single crystals cut approximately parallel to (100), (010), (001), and (313) are studied at a representative wavelength of 589 nm. The (313) surface is sufficient for retrieval of all optical constants. The expected effects of surface over-layer formation are removed numerically. We propose generalized ellipsometry as a powerful tool for measurement of anisotropic optical function spectra of biaxial materials.
authors.forename: Mathias
authors.initials: M
authors.lastname: Schubert
authors.forename: Wayne
authors.initials: W
authors.lastname: Dollase