Linear and quadratic dispersion characterization of millimeter-length fibers and waveguides using common-path interferometry.
We measured linear and quadratic dispersion on millimeter-length fibers, waveguides, and nanowires based on common-path spectral interferometry. We obtained the linear dispersion parameter, beta', with a relative precision of 1.45 x 10(-4), and extracted the quadratic dispersion parameter, beta'', from the Taylor expansion of beta' x beta'' values show a discrepancy of < 1% when compared with simulation as well as with measurement results obtained by a conventional Michelson interferometer. Using this method, we experimentally confirmed the sign inversion of the group velocity dispersion of AlGaAs nanowires for what is believed to be the first time.
Mohammed
W
W
Department of Electrical and Computer Engineering, University of Toronto, 10 King's College Road, Toronto, Ontario M5S 3G4, Canada. waleed.mohammed@utoronto.ca
Meier
J
J
Galle
M
M
Qian
L
L
Aitchison
J S
JS
Smith
P W E
PW