title: Determining the carrier-envelope offset frequency of 5-fs pulses with extreme nonlinear optics in ZnO.
abstract: We excite ZnO samples with two-cycle optical pulses directly from a mode-locked oscillator with average powers of several tens of milliwatts. The emitted light reveals peaks at the carrier-envelope offset frequency f(ø) and at 2f(ø) in the radio-frequency spectra. These peaks can still be detected in layers as thin as 350 nm-a step toward determining the carrier-envelope offset phase itself.
authors.forename: O D
authors.initials: OD
authors.lastname: Mücke
authors.forename: T
authors.initials: T
authors.lastname: Tritschler
authors.forename: M
authors.initials: M
authors.lastname: Wegener
authors.forename: U
authors.initials: U
authors.lastname: Morgner
authors.forename: F X
authors.initials: FX
authors.lastname: Kärtner