title: Linear and quadratic dispersion characterization of millimeter-length fibers and waveguides using common-path interferometry.
abstract: We measured linear and quadratic dispersion on millimeter-length fibers, waveguides, and nanowires based on common-path spectral interferometry. We obtained the linear dispersion parameter, beta', with a relative precision of 1.45 x 10(-4), and extracted the quadratic dispersion parameter, beta'', from the Taylor expansion of beta' x beta'' values show a discrepancy of < 1% when compared with simulation as well as with measurement results obtained by a conventional Michelson interferometer. Using this method, we experimentally confirmed the sign inversion of the group velocity dispersion of AlGaAs nanowires for what is believed to be the first time.
authors.affiliation: Department of Electrical and Computer Engineering, University of Toronto, 10 King's College Road, Toronto, Ontario M5S 3G4, Canada. waleed.mohammed@utoronto.ca
authors.forename: W
authors.initials: W
authors.lastname: Mohammed
authors.forename: J
authors.initials: J
authors.lastname: Meier
authors.forename: M
authors.initials: M
authors.lastname: Galle
authors.forename: L
authors.initials: L
authors.lastname: Qian
authors.forename: J S
authors.initials: JS
authors.lastname: Aitchison
authors.forename: P W E
authors.initials: PW
authors.lastname: Smith