Shear force control for a terahertz near field microscope.
We report on the advancement of apertureless terahertz microscopy by active shear force control of the scanning probe. Extreme subwavelength spatial resolution and a maximized image contrast are achieved by maintaining a tip-surface distance of about 20 nm. The constant distance between scanning tip and surface results in terahertz images that mirror the dielectric permittivity of the surface.
Photonics and Optoelectronics Group, University of Munich, Amalienstr. 54, 80799 Munich, Germany.
F
F
Buersgens
G
G
Acuna
C H
CH
Lang
S I
SI
Potrebic
S
S
Manus
R
R
Kersting
D004867:Equipment Design; D019544:Equipment Failure Analysis; D005246:Feedback; D007089:Image Enhancement / Q000295:instrumentation* / Q000379:methods; D007259:Infrared Rays; D020527:Microscopy, Scanning Probe / Q000295:instrumentation* / Q000379:methods; D008872:Microwaves; D015203:Reproducibility of Results; D012680:Sensitivity and Specificity; D033081:Shear Strength