Ellipsometric measurements by use of photon pairs generated by spontaneous parametric downconversion.
We present a novel interferometric technique for performing ellipsometric measurements. This technique relies on the use of a nonclassical optical source, namely, polarization-entangled twin photons generated by spontaneous parametric downconversion from a nonlinear crystal, in conjunction with a coincidence-detection scheme. Ellipsometric measurements acquired with this scheme are absolute; i.e., they do not require source and detector calibration.
Abouraddy
A F
AF
Toussaint
K C
KC
Sergienko
A V
AV
Saleh
B E
BE
Teich
M C
MC