Shear force control for a terahertz near field microscope.
We report on the advancement of apertureless terahertz microscopy by active shear force control of the scanning probe. Extreme subwavelength spatial resolution and a maximized image contrast are achieved by maintaining a tip-surface distance of about 20 nm. The constant distance between scanning tip and surface results in terahertz images that mirror the dielectric permittivity of the surface.
Buersgens
F
F
Photonics and Optoelectronics Group, University of Munich, Amalienstr. 54, 80799 Munich, Germany.
Acuna
G
G
Lang
C H
CH
Potrebic
S I
SI
Manus
S
S
Kersting
R
R
D004867:Equipment Design; D019544:Equipment Failure Analysis; D005246:Feedback; D007089:Image Enhancement / Q000295:instrumentation* / Q000379:methods; D007259:Infrared Rays; D020527:Microscopy, Scanning Probe / Q000295:instrumentation* / Q000379:methods; D008872:Microwaves; D015203:Reproducibility of Results; D012680:Sensitivity and Specificity; D033081:Shear Strength