title: Interferometric phase-dispersion microscopy.
abstract: We describe a new scanning microscopy technique, phase-dispersion microscopy (PDM). The technique is based on measuring the phase difference between the fundamental and the second-harmonic light in a novel interferometer. PDM is highly sensitive to subtle refractive-index differences that are due to dispersion (differential optical path sensitivity, 5 nm). We apply PDM to measure minute amounts of DNA in solution and to study biological tissue sections. We demonstrate that PDM performs better than conventional phase-contrast microscopy in imaging dispersive and weakly scattering samples.
authors: George Harrison Spectroscopy Laboratory, Massachusetts Institute of Technology, Cambridge, Massachusetts 02139, USA.
authors: C
authors: C
authors: Yang
authors: A
authors: A
authors: Wax
authors: I
authors: I
authors: Georgakoudi
authors: E B
authors: EB
authors: Hanlon
authors: K
authors: K
authors: Badizadegan
authors: R R
authors: RR
authors: Dasari
authors: M S
authors: MS
authors: Feld