Frequency-domain interferometric second-harmonic spectroscopy.
We report a new spectroscopic technique to measure simultaneously the intensity and the phase of second-harmonic (SH) radiation over a broad spectral range without laser tuning. Temporally separated SH pulses from two sources, excited by the same broad-bandwidth 15-fs Ti:sapphire fundamental pulse, interfere in a spectrometer to yield frequency-domain interference fringes. We demonstrate the technique by measuring the strongly bias-dependent phase of SH radiation from a Si/SiO(2)/Cr metal-oxide-semiconductor capacitor in the spectral range of the SiE(1) critical point.
Wilson
P T
PT
Jiang
Y
Y
Aktsipetrov
O A
OA
Mishina
E D
ED
Downer
M C
MC