X-ray photoelectron spectrometry depth profiling of organic thin films using C60 sputtering.
A buckminsterfullerene (C(60)) ion beam was used for X-ray photoelectron spectrometry depth profiling of various organic thin films. Specimens representing different interfaces in organic light-emitting diode devices, including hole-conducting poly(ethylenedioxythiophene), poly(styrenesulfonic acid) (PEDOT:PSS) thin films on ITO with and without polysilicic acid doping, light-emitting Ir-containing 4,4'-bis(carbazol-9-yl)biphenyl (CBP) molecules on PEDOT:PSS, and electron-conducting 2,2',2' '(1,3,5-benzinetriyl)tris(1-phenyl-1-H-benzimidazole) (TPBi) molecules on CBP, were studied. In all cases, a clear multilayer structure was observed. The chemical composition and elemental state were preserved after C(60+) ion sputtering. The sputter rate was found to decrease with sputtering time. This is due to the deposition of amorphous carbon on the surface, with the rate of implantation highly dependent on the surface interacting with the ion beam.
Chen
Ying-Yu
YY
Research Center for Applied Sciences, Academia Sinica, Taipei 115, Taiwan, Republic of China.
Yu
Bang-Ying
BY
Wang
Wei-Ben
WB
Hsu
Mao-Feng
MF
Lin
Wei-Chun
WC
Lin
Yu-Chin
YC
Jou
Jwo-Huei
JH
Shyue
Jing-Jong
JJ