title: Near-field scanning optical microscope probe analysis.
abstract: In this article results of a comparison of two NSOM probe characterization methods are presented. Scanning electron microscopy analysis combined with electromagnetic field modeling using the finite difference in time domain method are compared with measured far-field radiation diagrams of NSOM probes. It is shown that measurement of far-field radiation diagrams can be an efficient tool for daily checking of the NSOM probes quality. Moreover, it is shown that the inner probe geometry has large influence on the directional radiation of an NSOM probe and the far-field radiation diagram can be used as a simple method to distinguish between different probe geometries.
authors: Czech Metrology Institute, Okruzní 31, 638 00 Brno, Czech Republic. klapetek@physics.muni.cz <klapetek@physics.muni.cz>
authors: Petr
authors: P
authors: Klapetek
authors: Jirí
authors: J
authors: Bursík
authors: Miroslav
authors: M
authors: Valtr
authors: Jan
authors: J
authors: Martinek