Subwavelength depth resolution in near-field microscopy.
A generalized Radon transform is presented that relates, for the case of an evanescent wave that is incident upon a weakly scattering medium, the homogeneous components of the scattered field to the three-dimensional Fourier transform of the dielectric susceptibility. This relationship is used within the context of total internal reflection microscopy to reconstruct the depth structure of the dielectric susceptibility from simulated scattered field data.
Fischer
D G
DG
National Center for Microgravity Research on Fluids and Combustion, NASA Glenn Research Center, MS 110-3, 21000 Brookpark Road, Cleveland, Ohio 44135, USA.