Planar diffracted-beam interferometry/holography.
A method to interfere planar electron diffracted beams that have been created by a primary electron beam passing through a crystal specimen has been invented and referred to as planar diffracted-beam interferometry/holography (planar DBI/H). Planar DBI/H is able to measure the intensity and coherence properties of the diffracted electron beams. When the diffracted electron beams are energy filtered, planar DBI/H is also able to measure the intensity and coherence properties of the zero-loss electrons, phonon-loss electrons and plasmon-loss electrons. These coherence properties are useful to help our understanding of the Stobbs factor and the properties of advanced materials, necessary for our understanding of nanoscience and the development of nanotechnology.
Herring
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Department of Mechanical Engineering, Center for Advanced Materials and Related Technology, University of Victoria, Victoria, Canada V8W 3P6. rherring@uvic.ca <rherring@uvic.ca>