title: Localization and characterization of simple defects in finite-sized photonic crystals.
abstract: Structured materials like photonic crystals require for optimal use a high degree of precision with respect to both position and optical characteristics of their components. Here we present a simple tomographic algorithm, based on a specific Green's function together with a first-order Born approximation, which enables us to localize and characterize identical defects in finite-sized photonic crystals. This algorithm is proposed as a first step to the monitoring of such materials. Illustrative numerical results show in particular the possibility of focalization beyond the Rayleigh criterion.
authors.affiliation: Centre de Mathématiques Appliquées, UMR7641 CNRS/Ecole Polytechnique, Route de Saclay, Palaiseau F-91128, France. groby@lss.supelec.fr
authors.forename: Jean-Philippe
authors.initials: JP
authors.lastname: Groby
authors.forename: Dominique
authors.initials: D
authors.lastname: Lesselier