title: Temperature-dependent refractive index measurements of wafer-shaped InAs and InSb.
abstract: An experimental method is introduced to measure the refractive index and its temperature dependence for wafer-shaped infrared materials over a continuous temperature range. Using a combination of Michelson interferometry, Fabry-Perot interferometry, and a temperature-controlled cryostat in a laser micrometer, refractive index values and their temperature coefficients can be measured for any specific temperature within a desired temperature range. Measurements are reported for InAs and InSb for a laser wavelength of 10.59 microm.
authors.affiliation: Department of Physics, California Polytechnic State University, San Luis Obispo, California 93407, USA. ggillen@calpoly.edu
authors.forename: Glen D
authors.initials: GD
authors.lastname: Gillen
authors.forename: Chris
authors.initials: C
authors.lastname: Dirocco
authors.forename: Peter
authors.initials: P
authors.lastname: Powers
authors.forename: Shekhar
authors.initials: S
authors.lastname: Guha