Ultrafast x-ray diffraction using a streak-camera detector in averaging mode.
We demonstrate an apparatus for measuring time-dependent x-ray diffraction. X-ray pulses from a synchrotron are diffracted by a pair of Si(111) crystals and detected with an x-ray streak camera that has single-shot resolution of better than 1 ps. The streak camera is driven by a photoconductive switch, which is triggered by 100-fs laser pulses at a repetition rate of 1 kHz. The laser and the streak camera are synchronized with the synchrotron pulses. In the averaging mode, trigger jitter results in 2-ps temporal resolution. We measured the duration of 5-keV pulses from the Advanced Light Source synchrotron to be 70ps.
Larsson
J
J
Chang
Z
Z
Judd
E
E
Schuck
P J
PJ
Falcone
R W
RW
Heimann
P A
PA
Padmore
H A
HA
Kapteyn
H C
HC
Bucksbaum
P H
PH
Murnane
M M
MM
Lee
R W
RW
Machacek
A
A
Wark
J S
JS
Liu
X
X
Shan
B
B