Probing molecules in integrated silicon-molecule-metal junctions by inelastic tunneling spectroscopy.
Molecular electronics has drawn significant attention for nanoelectronic and sensing applications. A hybrid technology where molecular devices are integrated with traditional semiconductor microelectronics is a particularly promising approach for these applications. Key challenges in this area include developing devices in which the molecular integrity is preserved, developing in situ characterization techniques to probe the molecules within the completed devices, and determining the physical processes that influence carrier transport. In this study, we present the first experimental report of inelastic electron tunneling spectroscopy of integrated metal-molecule-silicon devices with molecules assembled directly to silicon contacts. The results provide direct experimental confirmation that the chemical integrity of the monolayer is preserved and that the molecules play a direct role in electronic conduction through the devices. Spectra obtained under varying measurement conditions show differences related to the silicon electrode, which can provide valuable information about the physics influencing carrier transport in these molecule/Si hybrid devices.
Wang
Wenyong
W
Semiconductor Electronics Division, National Institute of Standards and Technology, Gaithersburg, Maryland 20899, USA.
Scott
Adina
A
Gergel-Hackett
Nadine
N
Hacker
Christina A
CA
Janes
David B
DB
Richter
Curt A
CA
D004548:Elasticity; D019544:Equipment Failure Analysis / Q000379:methods; D008422:Materials Testing / Q000379:methods; D008670:Metals / Q000737:chemistry*; D008839:Microelectrodes; D016252:Microscopy, Scanning Tunneling / Q000379:methods*; D015336:Molecular Probe Techniques; D049329:Nanostructures / Q000737:chemistry / Q000648:ultrastructure; D036103:Nanotechnology / Q000295:instrumentation / Q000379:methods*; D010316:Particle Size; D012825:Silicon / Q000737:chemistry*; D013057:Spectrum Analysis / Q000379:methods*; D018511:Systems Integration
D008670:Metals; D012825:Silicon