Spatial resolution and information transfer in scanning transmission electron microscopy.
The relation between image resolution and information transfer is explored. It is shown that the existence of higher frequency transfer in the image is just a necessary but not sufficient condition for the achievement of higher resolution. Adopting a two-point resolution criterion, we suggest that a 10% contrast level between two features in an image should be used as a practical definition of resolution. In the context of scanning transmission electron microscopy, it is shown that the channeling effect does not have a direct connection with image resolution because sharp channeling peaks do not move with the scanning probe. Through a quantitative comparison between experimental image and simulation, a Fourier-space approach is proposed to estimate defocus and sample thickness. The effective atom size in Z-contrast imaging depends on the annular detector's inner angle. Therefore, an optimum angle exists for the highest resolution as a trade-off between reduced atom size and reduced signal with limited information transfer due to noise.
Peng
Yiping
Y
Materials Science and Technology Division, Oak Ridge National Laboratory, Oak Ridge, TN 37831-6031, USA.
Oxley
Mark P
MP
Lupini
Andrew R
AR
Chisholm
Matthew F
MF
Pennycook
Stephen J
SJ
D007089:Image Enhancement; D008433:Mathematics; D017348:Microscopy, Electron, Scanning Transmission / Q000379:methods*