title: Femtosecond carrier-induced screening of dc electric-field-induced second-harmonic generation at the Si(001) SiO(2) interface.
abstract: Carrier-induced screening of the dc electric field at the Si(001)-SiO(2) interface is observed by intensity-dependent and femtosecond-time-resolved second-harmonic spectroscopy. The screening occurs on a time scale of ~?(p)(-1) , the reciprocal plasma frequency of the generated carriers.
authors.forename: J I
authors.initials: JI
authors.lastname: Dadap
authors.forename: P T
authors.initials: PT
authors.lastname: Wilson
authors.forename: M H
authors.initials: MH
authors.lastname: Anderson
authors.forename: M C
authors.initials: MC
authors.lastname: Downer
authors.forename: M
authors.initials: M
authors.lastname: Ter Beek