title: Ultrafast x-ray diffraction using a streak-camera detector in averaging mode.
abstract: We demonstrate an apparatus for measuring time-dependent x-ray diffraction. X-ray pulses from a synchrotron are diffracted by a pair of Si(111) crystals and detected with an x-ray streak camera that has single-shot resolution of better than 1 ps. The streak camera is driven by a photoconductive switch, which is triggered by 100-fs laser pulses at a repetition rate of 1 kHz. The laser and the streak camera are synchronized with the synchrotron pulses. In the averaging mode, trigger jitter results in 2-ps temporal resolution. We measured the duration of 5-keV pulses from the Advanced Light Source synchrotron to be 70ps.
authors.forename: J
authors.initials: J
authors.lastname: Larsson
authors.forename: Z
authors.initials: Z
authors.lastname: Chang
authors.forename: E
authors.initials: E
authors.lastname: Judd
authors.forename: P J
authors.initials: PJ
authors.lastname: Schuck
authors.forename: R W
authors.initials: RW
authors.lastname: Falcone
authors.forename: P A
authors.initials: PA
authors.lastname: Heimann
authors.forename: H A
authors.initials: HA
authors.lastname: Padmore
authors.forename: H C
authors.initials: HC
authors.lastname: Kapteyn
authors.forename: P H
authors.initials: PH
authors.lastname: Bucksbaum
authors.forename: M M
authors.initials: MM
authors.lastname: Murnane
authors.forename: R W
authors.initials: RW
authors.lastname: Lee
authors.forename: A
authors.initials: A
authors.lastname: Machacek
authors.forename: J S
authors.initials: JS
authors.lastname: Wark
authors.forename: X
authors.initials: X
authors.lastname: Liu
authors.forename: B
authors.initials: B
authors.lastname: Shan