title: Photometric measurement of linear crystallization velocity on a microscale.
abstract: Use of a photometer-equipped polarizing microscope permits the measurement of linear crystallization velocity in a flexible manner. Ease of sample preparation and manipulation compared with conventional methods for measuring crystallization velocity are among the advantages of the method reported here. A simple barrier layer silicon photodetector in short-circuit operation gives the fast response necessary to follow the moving solid-liquid interface. Sample results on the crystallization of alpha- and beta-resorcinol illustrate the utility of this method.
authors.affiliation: Simmon College, Chemistry Department, Boston, Massachusetts 02115, USA.
authors.forename: L J
authors.initials: LJ
authors.lastname: Soltzberg
authors.forename: Y M
authors.initials: YM
authors.lastname: Dick
authors.forename: J M
authors.initials: JM
authors.lastname: Stowe