title: Refractive-index dispersion for BaF2-GdF3-ZrF4-AlF3 glasses.
abstract: Refractive-index dispersion measurements were performed on bulk specimens of 2-, 4-, or 6-mol % AlF(3) doped 33BaF(2)-4GdF(3)-63ZrF(4) (mol %) glass and 4-mol % LiF, CsF, YF(3), CdF(2), SnF(2), or PbF(2) doped 31.68BaF(2)-3.84GdF(3)-60.48ZrF(4)-4AIF(3) (mol %) glass in the wavelength region from 0.4047 to 5.3036 microm. The material dispersion curve and zero material dispersion wavelength were estimated on the basis of refractive- index dispersion measurements. The slope of the material dispersion curve for these fluoride glasses was less steep than that for SiO2 glass in the wavelength range estimated. The zero material wavelength lambda(0) shifted to a shorter wavelength with increasing AlF3 concentration. The lambda(0) is 1.675 microm for 31.68BaF(2)- 3.84GdF(3)-60.48ZrF(4)-4AlF(3) (mol %) glass. When 4-mol % LiF, CsF, YF(3), CdF(2), SnF(2), or PbF(2) were doped into these glasses, each lambda(0) shifted from 1.675 to 1.670, 1.668, 1.673, 1.681, 1.683, or 1.704 microm, respectively. The temperature dependence values of the refractive-index dispersion and material dispersion for 31.68BaF(2)-3.84GdF(3) -60.48ZrF(4)-4AIF(3) (mol %) glass were also obtained. The temperature coefficients of the refractive index were negative values (dn/dT(relative) = -1.0 X 10(-5)/degrees C) and the wavelength dependence of dn/dT was small. The wavelength lambda(0) shifted from 1.675 to 1.605 microm, due to the rise in the measurement temperature from 25 degrees C to 250 degrees C.
authors.affiliation: NTT Ibaraki Electrical Communication Laboratory, Tokai, Ibaraki-ken 319-11, Japan.
authors.forename: S
authors.initials: S
authors.lastname: Mitachi
authors.forename: T
authors.initials: T
authors.lastname: Miyashita