Nanotribology and nanomechanics in nano/biotechnology.
Owing to larger surface area in micro/nanoelectromechanical systems (MEMS/NEMS), surface forces such as adhesion, friction, and meniscus and viscous drag forces become large when compared with inertial and electromagnetic forces. There is a need to develop lubricants and identify lubrication methods that are suitable for MEMS/NEMS. For BioMEMS/BioNEMS, adhesion between biological molecular layers and the substrate, and friction and wear of biological layers may be important, and methods to enhance adhesion between biomolecules and the device surface need to be developed. There is a need for development of a fundamental understanding of adhesion, friction/stiction, wear, the role of surface contamination and environment, and lubrication. MEMS/NEMS materials need to exhibit good mechanical and tribological properties on the micro/nanoscale. Most mechanical properties are known to be scale dependent. Therefore, the properties of nanoscale structures need to be measured. Component-level studies are required to provide a better understanding of the tribological phenomena occurring in MEMS/NEMS. The emergence of micro/nanotribology and atomic force microscopy-based techniques has provided researchers with a viable approach to address these problems. This paper presents an overview of micro/nanoscale adhesion, friction, and wear studies of materials and lubrication studies for MEMS/NEMS and BioMEMS/BioNEMS. It also presents a review of scale-dependent mechanical properties, and stress and deformation analysis of nanostructures.
Bhushan
Bharat
B
Nanotribology Laboratory for Information Storage and MEMS/NEMS, The Ohio State University, 201 West 19th Avenue, Columbus, OH 43210-1142, USA. bhushan.2@osu.edu
D015374:Biosensing Techniques; D001709:Biotechnology / Q000295:instrumentation / Q000379:methods*; D004563:Electrochemistry; D004581:Electronics; D004867:Equipment Design; D046228:Microarray Analysis; D036103:Nanotechnology / Q000295:instrumentation / Q000379:methods*; D012825:Silicon; D013672:Technology / Q000295:instrumentation / Q000379:methods
D012825:Silicon