Curve tracking for rapid imaging in AFM.
A high-level feedback control approach for rapid imaging in atomic force microscopy is presented. The algorithms are designed for samples which are string-like, such as biopolymers, and for boundaries. Rather than the simple raster-scan pattern, data from the microscope are used in real-time to steer the tip along the sample, drastically reducing the area to be imaged. An order-of-magnitude reduction in the time to acquire an image is possible. The technique is illustrated through simulations and through physical experiments.
Andersson
Sean B
SB
Department of Aerospace and Mechanical Engineering, Boston University, Boston, MA 02215, USA. sanderss@bu.edu
D001704:Biopolymers / Q000737:chemistry*; D044962:Data Compression / Q000379:methods; D004548:Elasticity; D005246:Feedback; D007091:Image Processing, Computer-Assisted / Q000379:methods*; D018625:Microscopy, Atomic Force / Q000379:methods*; D010363:Pattern Recognition, Automated / Q000379:methods; D012680:Sensitivity and Specificity; D013499:Surface Properties; D014941:Work Simplification
D001704:Biopolymers