title: Monitoring the arbitrary thickness of optical thin films and their error simulation: a method.
abstract: This paper was the method of monitoring the absolute value for film layer transmittance to monitor the thickness of optical thin film. For this purpose, a 2S3G double-color three-path monitoring apparatus was built. Simulation analyses of monitoring errors have been conducted and a flow diagram is given. Using this method and apparatus, 9-, 15-, and 23-layer broadband neutral dichroic filters, cold light coatings, edge filters, and polarizers have been plated; good reproducibility and satisfactory results have been obtained, thereby achieving the preparation of the non-lambda/4 multilayer system
authors.affiliation: North China Research Institute of Electro-Optics, P.O. Box 8511, Beijing, China.
authors.forename: Z
authors.initials: Z
authors.lastname: Zhu
authors.forename: W
authors.initials: W
authors.lastname: Li
authors.forename: Y
authors.initials: Y
authors.lastname: Hua