Reflection-wavelength control method for layer-by-layer controlled x-ray multilayer mirrors.
A reflection-wavelength control method for a layer-by-layer controlled x-ray multilayer mirror without interface roughness is proposed. The reflection wavelength of the multiperiodic mirror is found to be simply determined by a combination ratio of periodic layers. Multiperiodic x-ray mirrors with reflectance wavelengths at 3.374 nm (C VI 1s-2p) and 3.950 nm (Ca XVIII 3d-5f) are successfully designed.
Ishii
M
M
Iwai
S
S
Ueki
T
T
Aoyagi
Y
Y