title: Domain sensitive contrast in photoelectron emission microscopy.
abstract: We have investigated the adsorption of cesium on the Si(100) surface with photoelectron emission microscopy using linearly polarized green laser light. We observe a polarization dependent contrast between the (2 x 1) or (1 x 2) reconstructed terraces. Density-functional calculations reveal the geometric and electronic structure of the Cs/Si(100) surface. The contrast between the (2 x 1) or (1 x 2) reconstructed domains is explained on the basis of dipole selection rules for the photoemission matrix elements.
authors.affiliation: Fachbereich Physik und CeNiDE, Universität Duisburg-Essen, Campus Duisburg, 47057, Duisburg, Germany. dagmar.thien@uni-due.de
authors.forename: D
authors.initials: D
authors.lastname: Thien
authors.forename: P
authors.initials: P
authors.lastname: Kury
authors.forename: M
authors.initials: M
authors.lastname: Horn-von Hoegen
authors.forename: F-J
authors.initials: FJ
authors.lastname: Meyer Zu Heringdorf
authors.forename: J
authors.initials: J
authors.lastname: van Heys
authors.forename: M
authors.initials: M
authors.lastname: Lindenblatt
authors.forename: E
authors.initials: E
authors.lastname: Pehlke