Optical monitoring of nonquarterwave stacks.
The planning of an optical monitoring process for nonquarterwave stacks, using standard equipment for turning value monitoring, is a rather complicated procedure. It is shown that by using a computer program together with some simple rules the planning becomes a more straightforward task. Detailed examples are presented.
van der Laan
C J
CJ
Delft University of Technology, Department of Applied Physics, P.O. Box 5046, 2600 GA Delft, The Netherlands.