title: Optical monitoring of nonquarterwave stacks.
abstract: The planning of an optical monitoring process for nonquarterwave stacks, using standard equipment for turning value monitoring, is a rather complicated procedure. It is shown that by using a computer program together with some simple rules the planning becomes a more straightforward task. Detailed examples are presented.
authors.affiliation: Delft University of Technology, Department of Applied Physics, P.O. Box 5046, 2600 GA Delft, The Netherlands.
authors.forename: C J
authors.initials: CJ
authors.lastname: van der Laan