High-resolution digital two-color holographic metrology.
An algorithm designed for digital color holography is presented. It is based on a filter bank allowing full object reconstruction with a pixel pitch being invariant along each wavelength. Its application to high-resolution simultaneous two-wavelength metrology is described.
Picart
Pascal
P
LAUM, CNRS, Université du Maine, Le Mans, France. pascal.picart@univ-lemans.fr
Mounier
Denis
D
Desse
Jean Michel
JM