title: Subdiffraction resolution in total internal reflection fluorescence microscopy with a grating substrate.
abstract: We propose a fluorescence surface imaging system that presents a power of resolution beyond that of the diffraction limit without resorting to saturation effects or probe scanning. This is achieved by depositing the sample on an optimized periodically nanostructured substrate in a standard total internal reflection fluorescence microscope. The grating generates a high-spatial-frequency light grid that can be moved throughout the sample by changing the incident angle. An appropriate reconstruction procedure permits one to recover the fluorescence amplitude from the images obtained for various incidences. Simulations of this imaging system show that the resolution is not limited by diffraction but by the period of the grating.
authors.affiliation: Institut Fresnel (CNRS UMR 6133), Université d'Aix-Marseille I & III, Marseille Cedex, France. anne.sentenac@fresnel.fr
authors.forename: Anne
authors.initials: A
authors.lastname: Sentenac
authors.forename: Kamal
authors.initials: K
authors.lastname: Belkebir
authors.forename: Hugues
authors.initials: H
authors.lastname: Giovannini
authors.forename: Patrick C
authors.initials: PC
authors.lastname: Chaumet
mesh_terms: D004058:Diffusion; D004867:Equipment Design; D007091:Image Processing, Computer-Assisted; D018613:Microscopy, Confocal / Q000379:methods*; D008856:Microscopy, Fluorescence / Q000295:instrumentation* / Q000379:methods*; D015233:Models, Statistical; D008962:Models, Theoretical; D053758:Nanoparticles; D049329:Nanostructures; D036103:Nanotechnology / Q000295:instrumentation / Q000379:methods*; D055095:Optics and Photonics; D013499:Surface Properties