Domain sensitive contrast in photoelectron emission microscopy.
We have investigated the adsorption of cesium on the Si(100) surface with photoelectron emission microscopy using linearly polarized green laser light. We observe a polarization dependent contrast between the (2 x 1) or (1 x 2) reconstructed terraces. Density-functional calculations reveal the geometric and electronic structure of the Cs/Si(100) surface. The contrast between the (2 x 1) or (1 x 2) reconstructed domains is explained on the basis of dipole selection rules for the photoemission matrix elements.
Thien
D
D
Fachbereich Physik und CeNiDE, Universität Duisburg-Essen, Campus Duisburg, 47057, Duisburg, Germany. dagmar.thien@uni-due.de
Kury
P
P
Horn-von Hoegen
M
M
Meyer Zu Heringdorf
F-J
FJ
van Heys
J
J
Lindenblatt
M
M
Pehlke
E
E