A simple method for producing flattened atomic force microscopy tips.
We describe a simple and reliable procedure for obtaining a flat plateau on top of standard silicon nitride atomic force microscopy tips by scanning them over the focus of a high-numerical-aperture objective illuminated by near-infrared ultrashort laser pulses. Flattened tips produced this way exhibit a plateau that is parallel to the substrate when the cantilever is mounted. They represent a valid and cost-effective alternative to commercially available plateau tips.
Biagioni
P
P
Nano-Optics Group, National Center of Competence for Research in Nanoscale Science, Institute of Physics, University of Basel, Klingelbergstrasse 82, CH-4056 Basel, Switzerland. paolo.biagioni@polimi.it
Farahani
J N
JN
Mühlschlegel
P
P
Eisler
H-J
HJ
Pohl
D W
DW
Hecht
B
B
D004867:Equipment Design / Q000295:instrumentation* / Q000379:methods*; D019544:Equipment Failure Analysis; D018625:Microscopy, Atomic Force / Q000295:instrumentation* / Q000379:methods; D036103:Nanotechnology / Q000295:instrumentation* / Q000379:methods; D015203:Reproducibility of Results; D012680:Sensitivity and Specificity; D014159:Transducers