title: A simple method for producing flattened atomic force microscopy tips.
abstract: We describe a simple and reliable procedure for obtaining a flat plateau on top of standard silicon nitride atomic force microscopy tips by scanning them over the focus of a high-numerical-aperture objective illuminated by near-infrared ultrashort laser pulses. Flattened tips produced this way exhibit a plateau that is parallel to the substrate when the cantilever is mounted. They represent a valid and cost-effective alternative to commercially available plateau tips.
authors.affiliation: Nano-Optics Group, National Center of Competence for Research in Nanoscale Science, Institute of Physics, University of Basel, Klingelbergstrasse 82, CH-4056 Basel, Switzerland. paolo.biagioni@polimi.it
authors.forename: P
authors.initials: P
authors.lastname: Biagioni
authors.forename: J N
authors.initials: JN
authors.lastname: Farahani
authors.forename: P
authors.initials: P
authors.lastname: Mühlschlegel
authors.forename: H-J
authors.initials: HJ
authors.lastname: Eisler
authors.forename: D W
authors.initials: DW
authors.lastname: Pohl
authors.forename: B
authors.initials: B
authors.lastname: Hecht
mesh_terms: D004867:Equipment Design / Q000295:instrumentation* / Q000379:methods*; D019544:Equipment Failure Analysis; D018625:Microscopy, Atomic Force / Q000295:instrumentation* / Q000379:methods; D036103:Nanotechnology / Q000295:instrumentation* / Q000379:methods; D015203:Reproducibility of Results; D012680:Sensitivity and Specificity; D014159:Transducers