A Hadamard transform electron ionization time-of-flight mass spectrometer.
We describe the first Hadamard transform time-of-flight mass spectrometer (HT-TOFMS) that incorporates an electron (impact) ionization source. This implementation was realized in an existent TOF instrument using commercially available components and simple modifications to the ion source. In the present apparatus, a Hadamard mask is expressed by modulating the ion generation process within the ion source; thus, the present approach differs from previous designs that use external electrostatic devices to modulate a continuous ion stream. The present implementation may be operated in conventional TOF mode at 12.5 kHz and in HT-TOF mode at 20-40 MHz. In Hadamard mode the design can operate using any circulant simplex code, allowing the operator much flexibility for optimizing resolution and mass range and for eliminating nonstochastic fluctuations, e.g., encoding errors and signal hum. We demonstrate typical performance of the HT-TOFMS in standard and reflectron geometries using sequences of three constructions and of varied length, generating HT-TOF mass spectra of molecules that match conventional reference spectra. The auxiliary material includes an electrical schematic for the floating high-speed encoding amplifier, which is also of use in other high-speed electrostatic optics applications, and a list of 537 validated vectors comprising the first row of each circulant simplex sequence (S(n)=3-8219) derived using maximal shift register (n=2(m)-1), quadratic residue (n=4m-3), and twin prime constructions [n=p(p+2)].
Hudgens
Jeffrey W
JW
National Institute of Standards and Technology, Physical and Chemical Properties Division, 100 Bureau Drive, Stop 8380, Gaithersburg, Maryland 20899-8380, USA. hudgens@nist.gov
Bergeron
Denis E
DE