title: Precise measuring method for detecting the in situ distortion profile of a high-heat-load mirror for synchrotron radiation by use of a pentaprism long trace profiler.
abstract: A precise measuring method for detecting the in situ distortion profile of a high-heat-load mirror for synchrotron radiation by use of a pentaprism long trace profiler (LTP) is presented. A maximum distortion of 0.47 microm across a length of 180 mm was measured for an internally water-cooled mirror on an undulator beam line at ELETTRA while exposed to a total emitted power of 600 W. This first successfully tested in situ distortion profile points out the importance and need for this method. Two configurations for performing in situ LTP tests are discussed. For this measurement the configuration with all the equipment external to the vacuum chamber was used. The experiment has an accuracy and a repeatability of 0.04 microm. Suggestions for improving the accuracy and stability are presented.
authors.forename: S
authors.initials: S
authors.lastname: Qian
authors.forename: W
authors.initials: W
authors.lastname: Jark
authors.forename: G
authors.initials: G
authors.lastname: Sostero
authors.forename: A
authors.initials: A
authors.lastname: Gambitta
authors.forename: F
authors.initials: F
authors.lastname: Mazzolini
authors.forename: A
authors.initials: A
authors.lastname: Savoia