title: [Development of a high resolution simultaneous microwave plasma torch spectrometer].
abstract: A unique high resolution simultaneous microwave plasma torch (MPT) atomic emission spectrometer was developed and studied preliminarily. Some advanced technologies were applied to the spectrometer, such as echelle grating, UV-intensified CCD array detector, adjustable microwave generator, and water cooling system for the generator, etc. The detection limits of the spectrometer for some elements were determined, the spectral resolution and pixel resolution of the spectrometer were calculated, and an analysis of a practical sample was carried out. The preliminary results demonstrate that such simultaneous spectrometer has advantages of saving sample and time, possessing high sensitivity and resolution, and low-cost for the purchase and maintenance. Taking analytical figures of merit into consideration, the high resolution simultaneous MPT spectrometer will have extended application areas and greater competition potential as compared with sequential MPT spectrometers.
authors.affiliation: College of Chemistry, Jilin University, Jilin Province Research Center for Engineering and Technology of Spectral Analytical Instruments, Changchun 130023, China.
authors.forename: Jie
authors.initials: J
authors.lastname: Jiang
authors.forename: Yan-Fu
authors.initials: YF
authors.lastname: Huan
authors.forename: Wei
authors.initials: W
authors.lastname: Jin
authors.forename: Guo-Dong
authors.initials: GD
authors.lastname: Feng
authors.forename: Qiang
authors.initials: Q
authors.lastname: Fei
authors.forename: Yan-Bo
authors.initials: YB
authors.lastname: Cao
authors.forename: Qin-Han
authors.initials: QH
authors.lastname: Jin