Tandem triple-pass Fabry-Perot interferometer for applications in the near infrared.
A standard tandem triple-pass scanning Fabry-Perot interferometer of the Vernier type for applications in the near infrared is described. The Fabry-Perot etalons have been coated with a specially designed dielectric multilayer stack with low loss factors and a uniform reflectivity of (92.5 +/- 1.0)% between 730 and 860 nm. The performances of the instrument, such as resolution, total transmission, and contrast, are equivalent to conventional tandem Fabry-Perot spectrometers but over the whole near-infrared wavelength range. Applications of the system to Brillouin scattering on semiconductors in the transparent wavelength regime and high-resolution spectroscopy of vertical cavity surface-emitting lasers are given.
Gehrsitz
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S
Paul Scherrer Institute Zurich, Badenerstrasse 569, CH-8048 Zurich, Switzerland.
Sigg
H
H
Siegwart
H
H
Krieger
M
M
Heine
C
C
Morf
R
R
Reinhart
F K
FK
Martin
W
W
Rudigier
H
H