title: Effect of swift heavy ions in Ni-Al nanocrystalline films studied by X-ray absorption spectroscopy.
abstract: X-ray absorption spectroscopic measurements have been used to compare the electronic structures of swift heavy ions (100 MeV Si ions) irradiated and pristine Ni-Al nanocrystalline films. Results from X-ray diffraction (XRD), X-ray absorption near-edge structure (XANES) spectra at Al K-, and Ni L(2,3)-edges and extended X-ray absorption fine structure (EXAFS) at Ni K-edges are discussed. The observed XRD peaks indicate the improvement of crystalline nature and Al(111) clustering after the swift heavy ion interactions. While the XANES spectra at Ni L(2,3)-edges show decrease in the intensity of white line strength, the Al K-edge shows increase in intensity after irradiation. Above results imply that swift heavy ions induce low Z (i.e., Al) ion mass transport, changes in Al sp-Ni-d hybridization, and charge transfer. EXAFS results show that crystalline nature is improved after swift heavy irradiation which is consistent with XRD results.
authors.affiliation: Inter-University Accelerator Centre, Aruna Asaf Ali Marg, New Delhi 110067, India. asokan@IUAC.ernet.in
authors.forename: K
authors.initials: K
authors.lastname: Asokan
authors.forename: H M
authors.initials: HM
authors.lastname: Tsai
authors.forename: C W
authors.initials: CW
authors.lastname: Bao
authors.forename: J W
authors.initials: JW
authors.lastname: Chiou
authors.forename: W F
authors.initials: WF
authors.lastname: Pong
authors.forename: G
authors.initials: G
authors.lastname: Sonia
authors.forename: T J S
authors.initials: TJ
authors.lastname: Anand
mesh_terms: D000535:Aluminum / Q000737:chemistry*; D005583:Fourier Analysis; D020450:Heavy Ions; D053758:Nanoparticles / Q000737:chemistry*; D009532:Nickel / Q000737:chemistry*; D013057:Spectrum Analysis / Q000379:methods*; D014961:X-Ray Diffraction
chemical_list: D009532:Nickel; D000535:Aluminum