Raman spectroscopy and X-ray diffraction studies of stress effects in PbTiO3 thin films.
A systematic study of domain structure and residual stress evolution with film thickness and of phase transition in c/a epitaxial PbTiO(3)/LaAlO(3) films using X-ray diffraction and Raman spectroscopy is reported. Both techniques revealed that the films are under tensile residual stress in the film plane and that a-domains are more stressed than c-domains. The two components of the large A(1)(TO) Ramanmodes are associated with a- and c-domains and their intensity ratio correlates to the volume fraction of a-domains. The evolution of the Raman signature with temperature revealed that the spectrum of a-domains disappears around 480 degrees C, whereas c-domains present an anomaly in their spectrum at 500 degrees C but maintain a well-defined Raman signature up to 600 degrees C.
Bartasyte
Ausrine
A
Laboratoire des Matériaux et du Génie Physique (CNRS-INP Grenoble-Minatec), France. ausrine.bartasyte@gmail.com
Chaix-Pluchery
Odette
O
Kreisel
Jens
J
Santiso
José
J
Margueron
Samuel
S
Boudard
Michel
M
Jiménez
Carmen
C
Abrutis
Adulfas
A
Weiss
François
F
D003198:Computer Simulation; D004548:Elasticity; D007854:Lead / Q000737:chemistry*; D008422:Materials Testing; D008567:Membranes, Artificial; D008956:Models, Chemical; D008958:Models, Molecular; D008968:Molecular Conformation; D013059:Spectrum Analysis, Raman; D013314:Stress, Mechanical; D014025:Titanium / Q000737:chemistry*; D014961:X-Ray Diffraction
D008567:Membranes, Artificial; C481719:lead titanate; D007854:Lead; D014025:Titanium