title: Structural disorder and diffusional pathway of oxide ions in a doped Pr2NiO4-based mixed conductor.
abstract: MEM nuclear density analysis from neutron diffraction data measured in situ at 1015.6 degrees C has indicated the two-dimensional network of curved O2-O3-O2 oxide-ion diffusion paths on the (Pr,La)-O layer in a K2NiF4-type structured oxide-ionic and electronic mixed conductor (Pr0.9La0.1)2(Ni0.74Cu0.21Ga0.05)O4+delta.
authors.affiliation: Department of Materials Science and Engineering, Interdisciplinary Graduate School of Science and Engineering, Tokyo Institute of Technology, Nagatsuta-cho 4259, Midori-Ku, Yokohama, Kanagawa 226-8502, Japan. yashima@materia.titech.ac.jp
authors.forename: Masatomo
authors.initials: M
authors.lastname: Yashima
authors.forename: Makiko
authors.initials: M
authors.lastname: Enoki
authors.forename: Takahiro
authors.initials: T
authors.lastname: Wakita
authors.forename: Roushown
authors.initials: R
authors.lastname: Ali
authors.forename: Yoshitaka
authors.initials: Y
authors.lastname: Matsushita
authors.forename: Fujio
authors.initials: F
authors.lastname: Izumi
authors.forename: Tatsumi
authors.initials: T
authors.lastname: Ishihara