Effect of swift heavy ions in Ni-Al nanocrystalline films studied by X-ray absorption spectroscopy.
X-ray absorption spectroscopic measurements have been used to compare the electronic structures of swift heavy ions (100 MeV Si ions) irradiated and pristine Ni-Al nanocrystalline films. Results from X-ray diffraction (XRD), X-ray absorption near-edge structure (XANES) spectra at Al K-, and Ni L(2,3)-edges and extended X-ray absorption fine structure (EXAFS) at Ni K-edges are discussed. The observed XRD peaks indicate the improvement of crystalline nature and Al(111) clustering after the swift heavy ion interactions. While the XANES spectra at Ni L(2,3)-edges show decrease in the intensity of white line strength, the Al K-edge shows increase in intensity after irradiation. Above results imply that swift heavy ions induce low Z (i.e., Al) ion mass transport, changes in Al sp-Ni-d hybridization, and charge transfer. EXAFS results show that crystalline nature is improved after swift heavy irradiation which is consistent with XRD results.
Asokan
K
K
Inter-University Accelerator Centre, Aruna Asaf Ali Marg, New Delhi 110067, India. asokan@IUAC.ernet.in
Tsai
H M
HM
Bao
C W
CW
Chiou
J W
JW
Pong
W F
WF
Sonia
G
G
Anand
T J S
TJ
D000535:Aluminum / Q000737:chemistry*; D005583:Fourier Analysis; D020450:Heavy Ions; D053758:Nanoparticles / Q000737:chemistry*; D009532:Nickel / Q000737:chemistry*; D013057:Spectrum Analysis / Q000379:methods*; D014961:X-Ray Diffraction
D009532:Nickel; D000535:Aluminum