Structural disorder and diffusional pathway of oxide ions in a doped Pr2NiO4-based mixed conductor.
MEM nuclear density analysis from neutron diffraction data measured in situ at 1015.6 degrees C has indicated the two-dimensional network of curved O2-O3-O2 oxide-ion diffusion paths on the (Pr,La)-O layer in a K2NiF4-type structured oxide-ionic and electronic mixed conductor (Pr0.9La0.1)2(Ni0.74Cu0.21Ga0.05)O4+delta.
Yashima
Masatomo
M
Department of Materials Science and Engineering, Interdisciplinary Graduate School of Science and Engineering, Tokyo Institute of Technology, Nagatsuta-cho 4259, Midori-Ku, Yokohama, Kanagawa 226-8502, Japan. yashima@materia.titech.ac.jp
Enoki
Makiko
M
Wakita
Takahiro
T
Ali
Roushown
R
Matsushita
Yoshitaka
Y
Izumi
Fujio
F
Ishihara
Tatsumi
T