Recordable depth of view and allowable farthest far-field distance of in-line far-field holography for micro-object analysis.
We have obtained, based on the general irradiance distribution of in-line far-field holography, analytical solutions of the recordable depth of view (RDV) and the allowable farthest far-field distance (AFFD) of the in-line far-field holography for different illumination modes. The analytical solutions of RDV and AFFD show that AFFD cannot be limited if micro-objects are positioned in one special space and illuminated with convergent beams, but the RDV is not improved simultaneously. When micro-objects are placed in another special space and illuminated with a divergent beam, the RDV and AFFD can be improved simultaneously, but the recordable object space is split into two subspaces. These results are important in the design of a holographic recording system.
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