[Estimation of spectral reflectance using color scanner].
To obtain accurate and device-independent color, the scanner needs to be characterized. Considering that the behavior of color scanner always deviates from linear reflectance model and that the color distribution of training samples has considerable effect on the color estimation accuracy, a new spectral characterization method is proposed. This method can estimate accurate high-dimensional spectral reflectance from low-dimensional scanner responses, based on limited sample selection and weighted training. Experimental results indicate that the performance of the proposed method is obviously better than that of previous method, in both color difference error and spectral reflectance error.
Shen
Hui-Liang
HL
Department of Information and Electronic Engineering, Zhejiang University, Hangzhou 310027, China. shenhl@zju.edu.cn
Mou
Tong-Sheng
TS
Yang
Dong-Xiao
DX