Transient deformation analysis by a carrier method of pulsed electronic speckle-shearing pattern interferometry.
The introduction of a pulsed laser into an electronic speckle-shearing pattern interferometer allows high-speed transient deformations to be measured. We report on a computerized system that permits automatic data reduction by introducing carrier fringes through the translation of a diverging lens. The quantitative determination of the phase map that is due to deformation is carried out by the spatial synchronous detection method. Experimental results obtained for a metal plate transiently deformed by an electromagnetic hammer illustrate the advantages of the proposed system.
Dávila
A
A
Kaufmann
G H
GH
Pérez-López
C
C