title: Two-wavelength interferometry that uses a fourier-transform method.
abstract: Two-wavelength interferometry that is based on a Fourier-transform method has been investigated. A phase profile at a synthetic wavelength has been measured from a two-wavelength interferogram with two spatial carrier frequencies. A phase error caused by the difference between modulation intensities at two wavelengths has been theoretically and numerically analyzed. A phase map without the error can be obtained from a power-spectrum adjustment in the two-wavelength interferogram.
authors.forename: R
authors.initials: R
authors.lastname: Onodera
authors.forename: Y
authors.initials: Y
authors.lastname: Ishii