title: Correlations between AFM and SEM imaging of acid-etched tooth enamel.
abstract: Enamel bond strength is an important factor in restorative dentistry and crucially depends on the enamel roughness. To increase roughness, different etching procedures are employed and profilometric estimations, with probe profilometers, including atomic force microscopy (AFM), have been made. However, no correlation between roughness and bond strength has been found. To search for a possible error source leading to the underestimation of enamel roughness when utilizing probe profilometers, the authors compared scanning electron microscopy and AFM images of acid-etched tooth enamel. The results showed that AFM imaging cannot correctly depict the acid-etched enamel surface, because of the high steepness of the enamel crystallites and the generation of convolute images. This leads to a large underestimation of the profilometric parameters measured with AFM, or other profilometers, on acid-etched tooth enamel surfaces.
authors.affiliation: Department of Operative Dentistry & Periodontology, Medical University of Innsbruck, Innsbruck, Austria. lvitkov@yahoo.com
authors.forename: Ljubomir
authors.initials: L
authors.lastname: Vitkov
authors.forename: Markus
authors.initials: M
authors.lastname: Kastner
authors.forename: Ferry
authors.initials: F
authors.lastname: Kienberger
authors.forename: Peter
authors.initials: P
authors.lastname: Hinterdorfer
authors.forename: Kurt
authors.initials: K
authors.lastname: Schilcher
authors.forename: Ingrid
authors.initials: I
authors.lastname: Grunert
authors.forename: Herbert
authors.initials: H
authors.lastname: Dumfahrt
authors.forename: Wolf Dietrich
authors.initials: WD
authors.lastname: Krautgartner
mesh_terms: D000134:Acid Etching, Dental; D001840:Dental Bonding; D003743:Dental Enamel / Q000648:ultrastructure*; D006801:Humans; D018625:Microscopy, Atomic Force; D008855:Microscopy, Electron, Scanning; D008964:Molar, Third / Q000648:ultrastructure*; D013499:Surface Properties