Determination of refractive index, thickness, and the optical losses of thin films from prism-film coupling measurements.
We present a method of analysis of prism-film coupler spectroscopy based on the use of transfer matrix and genetic algorithm, which allows the simultaneous determination of refractive index, thickness, and optical losses of the measured layer.
Cardin
Julien
J
SIFCOM, CNRS UMR 6176, ENSICAEN, 6 Boulevard du Maréchal-Juin, F-14050 Caen Cedex, France. julien.cardin@ensicaen.fr
Leduc
Dominique
D