title: Determination of refractive index, thickness, and the optical losses of thin films from prism-film coupling measurements.
abstract: We present a method of analysis of prism-film coupler spectroscopy based on the use of transfer matrix and genetic algorithm, which allows the simultaneous determination of refractive index, thickness, and optical losses of the measured layer.
authors.affiliation: SIFCOM, CNRS UMR 6176, ENSICAEN, 6 Boulevard du Maréchal-Juin, F-14050 Caen Cedex, France. julien.cardin@ensicaen.fr
authors.forename: Julien
authors.initials: J
authors.lastname: Cardin
authors.forename: Dominique
authors.initials: D
authors.lastname: Leduc