title: Beyond lock-in analysis for volumetric imaging in apertureless scanning near-field optical microscopy.
abstract: Conventional apertureless scanning near-field optical microscopy uses lock-in demodulation techniques to filter higher harmonics from the periodically modulated optical signal. On the one hand, this signal notoriously may contain contaminating mechanical contributions; on the other, it reduces the available data to one number per pixel. Realizing that the vertically oscillating near-field probe actually traverses a whole volume above the sample surface, we discuss a model to extend the data analysis in an attempt to better extract the optical information and to recover its three-dimensional spatial distribution.
authors.affiliation: Max Planck Institut für Festkörperforschung, 70569 Stuttgart, Germany. r.vogelgesang@fkf.mpg.de
authors.forename: R
authors.initials: R
authors.lastname: Vogelgesang
authors.forename: R
authors.initials: R
authors.lastname: Esteban
authors.forename: K
authors.initials: K
authors.lastname: Kern