title: Transient deformation analysis by a carrier method of pulsed electronic speckle-shearing pattern interferometry.
abstract: The introduction of a pulsed laser into an electronic speckle-shearing pattern interferometer allows high-speed transient deformations to be measured. We report on a computerized system that permits automatic data reduction by introducing carrier fringes through the translation of a diverging lens. The quantitative determination of the phase map that is due to deformation is carried out by the spatial synchronous detection method. Experimental results obtained for a metal plate transiently deformed by an electromagnetic hammer illustrate the advantages of the proposed system.
authors.forename: A
authors.initials: A
authors.lastname: Dávila
authors.forename: G H
authors.initials: GH
authors.lastname: Kaufmann
authors.forename: C
authors.initials: C
authors.lastname: Pérez-López