title: In-plane rotation analysis by two-wavelength electronic speckle interferometry.
abstract: A simple method is presented for the measurement of in-plane rotation (angle and sign) of an object by use of the conventional in-plane sensitive electronic speckle pattern interferometry technique combined with the two-wavelength laser diode method. The advantage of this method is that it can be used to measure the angle of rotation in a simple way by determination of fringe tilt. The experimental setup is described, and results are presented.
authors.affiliation: Laboratoire d'Optique Appliquée, Universit Catholique de Louvain, Unité de Physique Atomique, Moleculaire et Optique, Chemin du cyclotron 2, B-1348 Louvain-La-Neuve, Belgium.
authors.forename: A K
authors.initials: AK
authors.lastname: Nassim
authors.forename: L
authors.initials: L
authors.lastname: Joannes
authors.forename: A
authors.initials: A
authors.lastname: Cornet