title: Two-dimensional index profiling of fibers and waveguides.
abstract: We have constructed a two-dimensional refracted-ray scanner that can resolve index-of-refraction increments of approximately 4 x 10(-5). This resolution is an order of magnitude finer than the uncertainty of the measurement. The scanner can be adapted to evaluate either fibers or planar waveguides. The two-dimensional scan and the high precision allow visualization of features, such as deposition layers, that are difficult if not impossible to see in conventional one-dimensional scans.
authors.affiliation: Optoelectronics Division, National Institute of Standards and Technology, 325 Broadway, Boulder, Colorado 80303, USA.
authors.forename: N H
authors.initials: NH
authors.lastname: Fontaine
authors.forename: M
authors.initials: M
authors.lastname: Young