Interpolation of the spectral responsivity of silicon photodetectors in the near ultraviolet.
We improve the methods used to interpolate the responsivity of unbiased silicon photodetectors in the near-ultraviolet region. This improvement is achieved by the derivation of an interpolation function for the quantum yield of silicon and by consideration of this function in the interpolation of the internal quantum efficiency of photodiodes. The calculated quantum-yield and spectral-responsivity values are compared with measurement results obtained by the study of a silicon trap detector and with values reported by other research groups. The comparisons show agreement with a standard deviation of 0.4% between our measured and modeled values for both the quantum yield and the spectral responsivity within the wavelength region from 260 to 400 nm. The proposed methods thus extend the predictability of the spectral responsivity of silicon photodetectors to the wavelength region from 260 to 950 nm. Furthermore, an explanation is proposed for the change in the spectral responsivity of silicon photodiodes that is due to UV radiation. In our improved quantum efficiency model the spectral change can be accounted for completely by the adjustment of just one parameter, i.e., the collection efficiency near the SiO(2)/Si interface.
Kübarsepp
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Metrology Research Institute, Helsinki University of Technology, PO Box 3000, Espoo FIN-02015 HUT, Finland. toomas@metrology
Kärhä
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Ikonen
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