title: Measurement of absolute displacement by a double-modulation technique based on a Michelson interferometer.
abstract: A novel method is presented for of measuring absolute displacement with a synthesized wavelength interferometer. The optical phase of the interferometer is simultaneously modulated with a frequency-modulated laser diode and optical path-length difference. The error signal originating from the intensity modulation of the source is eliminated by a signal processing circuit. In addition, a lock-in technique is used to demodulate the envelope of the interferometric signal. The displacement signal is derived by the self-mixing technique.
authors.affiliation: Institute of Optical Sciences, National Central University, Chung-Li, Taiwan.
authors.forename: L W
authors.initials: LW
authors.lastname: Chang
authors.forename: P Y
authors.initials: PY
authors.lastname: Chien
authors.forename: C T
authors.initials: CT
authors.lastname: Lee