title: Determination of the refractive indices of layers in a multilayer stack by a guided-wave technique.
abstract: The m-lines technique is used to measure the refractive indices and thicknesses of layers embedded in a multilayer stack. The multilayer considered is deposited by ion plating. Its formula is silica-H-L-H-L-H-air, where H and L denote Ta(2)O(5) and SiO(2)lambda/4 layers, respectively, with lambda = 514.5 nm. Measurements indicate that the refractive index of Ta(2)O(5) is 5 x 10(-3) greater when the layer is close to air than when the layer is inside the coating and that the Ta(2)O(5) is slightly more birefringent.
authors.affiliation: Laboratoire d'Optique des Surfaces et des Couches Minces, Ecole Nationale Supérieure de Physique de Marseille, Domaine Universitaire de St Jérôme, 13397 Marseille Cedex 20, France.
authors.forename: J
authors.initials: J
authors.lastname: Massaneda
authors.forename: F
authors.initials: F
authors.lastname: Flory
authors.forename: E
authors.initials: E
authors.lastname: Pelletier