Analysis and characterization of alignment for free-space optical interconnects based on singular-value decomposition.
We propose a theoretical method to analyze and characterize the alignment of optical systems by using a singular-value decomposition (SVD) technique. One application of this method is to identify critical parameters for alignment systematically during alignment of two-dimensional device arrays. Another example application is to characterize the sensitivity or the accuracy of the misalignment-detection capability by evaluation of the singular values of optical systems. The information obtained through SVD-based techniques yields critical insights into the analysis of alignment.
Naruse
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M
Department of Mathematical Engineering and Information Physics, Graduate School of Engineering, University of Tokyo, Bunkyo-ku, Tokyo 113-8656, Japan. naruse@k2.t.u-tokyo.ac.jp
Ishikawa
M
M