Calculation of error propagation by use of total reflection geometry for evaluating third-order nonlinear optical materials.
The intrinsic error propagation in a technique that uses total reflection geometry for the measurement of chi(3) is calculated. The results show how accurately the parameters should be measured to obtain the chi(3) value with the required precision. The film thickness should be slightly less than the fundamental wavelength to reduce the chi(3) error that propagates from other parameters.
Kiguchi
M
M
Advanced Research Laboratory, Hitachi, Ltd., Hatoyama, Saitama 350-0395, Japan. kiguchi@harl.hitachi.co.jp