title: Single-shot time-resolved measurements of nanosecond-scale spin-transfer induced switching: stochastic versus deterministic aspects.
abstract: Using high bandwidth resistance measurements, we study the single-shot response of tunnel junctions subjected to spin torque pulses. After the pulse onset, the switching proceeds by a ns-scale incubation delay during which the resistance is quiet, followed by a 400 ps transition terminated by a large ringing that is damped progressively. While the incubation delay fluctuates significantly, the resistance traces are reproducible once this delay is passed. After switching, the time-resolved resistance traces indicate micromagnetic configurations that are rather spatially coherent.
authors: Institut d'Electronique Fondamentale, CNRS UMR 8622, Bât. 220, université Paris-Sud, 91405 Orsay, France.
authors: T
authors: T
authors: Devolder
authors: J
authors: J
authors: Hayakawa
authors: K
authors: K
authors: Ito
authors: H
authors: H
authors: Takahashi
authors: S
authors: S
authors: Ikeda
authors: P
authors: P
authors: Crozat
authors: N
authors: N
authors: Zerounian
authors: Joo-Von
authors: JV
authors: Kim
authors: C
authors: C
authors: Chappert
authors: H
authors: H
authors: Ohno