title: Combined low-temperature scanning tunneling/atomic force microscope for atomic resolution imaging and site-specific force spectroscopy.
abstract: We present the design and first results of a low-temperature, ultrahigh vacuum scanning probe microscope enabling atomic resolution imaging in both scanning tunneling microscopy (STM) and noncontact atomic force microscopy (NC-AFM) modes. A tuning-fork-based sensor provides flexibility in selecting probe tip materials, which can be either metallic or nonmetallic. When choosing a conducting tip and sample, simultaneous STM/NC-AFM data acquisition is possible. Noticeable characteristics that distinguish this setup from similar systems providing simultaneous STM/NC-AFM capabilities are its combination of relative compactness (on-top bath cryostat needs no pit), in situ exchange of tip and sample at low temperatures, short turnaround times, modest helium consumption, and unrestricted access from dedicated flanges. The latter permits not only the optical surveillance of the tip during approach but also the direct deposition of molecules or atoms on either tip or sample while they remain cold. Atomic corrugations as low as 1 pm could successfully be resolved. In addition, lateral drifts rates of below 15 pm/h allow long-term data acquisition series and the recording of site-specific spectroscopy maps. Results obtained on Cu(111) and graphite illustrate the microscope's performance.
authors: Department of Mechanical Engineering and Center for Research on Interface Structures and Phenomena, Yale University, P.O. Box 208284, New Haven, Connecticut 06520-8284, USA.
authors: Boris J
authors: BJ
authors: Albers
authors: Marcus
authors: M
authors: Liebmann
authors: Todd C
authors: TC
authors: Schwendemann
authors: Mehmet Z
authors: MZ
authors: Baykara
authors: Markus
authors: M
authors: Heyde
authors: Miquel
authors: M
authors: Salmeron
authors: Eric I
authors: EI
authors: Altman
authors: Udo D
authors: UD
authors: Schwarz