title: Serial section scanning electron microscopy of adult brain tissue using focused ion beam milling.
authors: Centre Interdisciplinaire de Microscopie Electronique, Ecole Polytechnique Federale de Lausanne, 1015 Lausanne, Switzerland. Graham.Knott@effl.ch
authors: Graham
authors: G
authors: Knott
authors: Herschel
authors: H
authors: Marchman
authors: David
authors: D
authors: Wall
authors: Ben
authors: B
authors: Lich
mesh_terms: D000818:Animals; D001921:Brain / Q000648:ultrastructure*; D005260:Female; D007091:Image Processing, Computer-Assisted; D007477:Ions; D051379:Mice; D008810:Mice, Inbred C57BL; D008855:Microscopy, Electron, Scanning / Q000379:methods*; D013048:Specimen Handling; D013569:Synapses / Q000648:ultrastructure
chemical_list: D007477:Ions