Particle-size analysis by laser diffraction with a complementary metal-oxide semiconductor pixel array.
Existing laser-diffraction instruments that use photodiode detectors have a limited resolution for particle sizing. We attempt the implementation of a complementary metal-oxide semiconductor pixel sensor for particle-size measurement by laser diffraction. The sensor has unique features: high resolution, no blooming, and a wide dynamic range (i.e., direct measurement of the scattering pattern). The calibration of the sensor is based on each pixel. The signal-processing and the inversion schemes for obtaining the particle-size distribution are described. The results indicate an improved size resolution and an increased flexibility of application.
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Particle Technology Group, Delft University of Technology, Julianalaan 136, 2628 BL Delft, The Netherlands. z.ma@tnw.tudelft.nl
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Scarlett
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