Experimental study on nonuniformity of line jitter in CCD images.
The line jitter of CCD images can considerably influence the precision and resolution of a high-accuracy vision-based automated inspection system. We report the experimental studies on the line jitter of CCD images. By use of a method of Harr wavelet transform, correlation, and statistics analysis to detect the line jitter of subpixels, the experiment reveals that the line jitter exhibits inherent nonuniformity and that different CCD cameras have different jitter characteristics. It was commonly thought that the jitter could be eliminated by detection of the jitter level and performing compensation. However, the nonuniformity revealed in the experiment makes jitter compensation much harder.
Luo
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School of Electrical and Electronic Engineering, Nanyang Technological University, Singapore 639798. luogang68@yahoo.com
Chutatape
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Fang
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