Hollow-core waveguide characterization by optically induced particle transport.
We introduce a method for optical characterization of hollow-core optical waveguides. Radiation pressure exerted by the waveguide modes on dielectric microspheres is used to analyze salient properties such as propagation loss and waveguide mode profiles. These quantities were measured for quasi-single-mode and multimode propagation in on-chip liquid-filled hollow-core antiresonant reflecting optical waveguides. Excellent agreement with analytical and numerical models is found, demonstrating that optically induced particle transport provides a simple, inexpensive, and nondestructive alternative to other characterization methods.
Measor
Philip
P
School of Engineering, University of California, Santa Cruz, Santa Cruz, CA 95064, USA. pmeasor@soe.ucsc.edu
Kühn
Sergei
S
Lunt
Evan J
EJ
Phillips
Brian S
BS
Hawkins
Aaron R
AR
Schmidt
Holger
H
D004867:Equipment Design; D007700:Kinetics; D008863:Microspheres; D015233:Models, Statistical; D008962:Models, Theoretical; D055095:Optics and Photonics; D011312:Pressure; D012542:Scattering, Radiation; D013997:Time Factors