title: Thickness measurements with electron energy loss spectroscopy.
abstract: Measurements of thickness using electron energy loss spectroscopy (EELS) are revised. Absolute thickness values can be quickly and accurately determined with the Kramers-Kronig sum method. The EELS data analysis is even much easier with the log-ratio method, however, absolute calibration of this method requires knowledge of the mean free path of inelastic electron scattering lambda. The latter has been measured here in a wide range of solids and a scaling law lambda approximately rho(-0.3) versus mass density rho has been revealed. EELS measurements critically depend on the excitation and collection angles. This dependence has been studied experimentally and theoretically and an efficient model has been formulated.
authors.affiliation: Quantum Dot Research Center, National Institute for Materials Science, Tsukuba 305-0005, Japan. iakoubovskii.konstantin@nims.go.jp
authors.forename: K
authors.initials: K
authors.lastname: Iakoubovskii
authors.forename: K
authors.initials: K
authors.lastname: Mitsuishi
authors.forename: Y
authors.initials: Y
authors.lastname: Nakayama
authors.forename: K
authors.initials: K
authors.lastname: Furuya
mesh_terms: D008962:Models, Theoretical; D046590:Spectroscopy, Electron Energy-Loss / Q000379:methods*