title: Characterization of low losses in optical thin films and materials.
abstract: Residual absorption in optical coatings and materials is directly measured by means of the laser-induced deflection (LID) technique. For transmissive coatings a measurement strategy is introduced that allows for the separation of different absorptions of the investigated sample (bulk, coating, surface) by use of only one sample. Laser irradiation yields absorption values between 2 x 10(-3) and 2.9 x 10(-2) for antireflecting and highly reflecting (HR) coatings at 193 nm and 30.6 x 10(-6) for a HR mirror at 527 nm. Use of laser-induced fluorescence at 193 nm excitation reveals trivalent cerium and prasodymium and hydrocarbons in different single layers and coatings. In addition to correlation with absorption data, the influence of a high fluorescence quantum yield on the absorption measurement is discussed.
authors.affiliation: Institute of Photonic Technology, Albert-Einstein-Strasse 9, 07745 Jena, Germany. christian.muehlig@ipht-jena.de
authors.forename: Christian
authors.initials: C
authors.lastname: Mühlig
authors.forename: Wolfgang
authors.initials: W
authors.lastname: Triebel
authors.forename: Siegfried
authors.initials: S
authors.lastname: Kufert
authors.forename: Simon
authors.initials: S
authors.lastname: Bublitz