Electrochemical aspects and structure characterization of VA-VIA compound semiconductor Bi2Te3/Sb2Te3 superlattice thin films via electrochemical atomic layer epitaxy.
This paper concerns the electrochemical atom-by-atom growth of VA-VIA compound semiconductor thin film superlattice structures using electrochemical atomic layer epitaxy. The combination of the Bi2Te3 and Sb2Te3 programs and Bi2Te3/Sb2Te3 thin film superlattice with 18 periods, where each period involved 21 cycles of Bi2Te3 followed by 21 cycles of Sb2Te3, is reported here. According to the angular distance between the satellite and the Bragg peak, a period of 23 nm for the superlattice was indicated from the X-ray diffraction (XRD) spectrum. An overall composition of Bi 0.25Sb0.16Te0.58, suggesting the 2:3 stoichiometric ratio of total content of Bi and Sb to Te, as expected for the format of the Bi2Te3/Sb2Te3 compound, was further verified by energy dispersive X-ray quantitative analysis. Both field-emission scanning electron microscopy and XRD data indicated the deposit grows by a complex mechanism involving some 3D nucleation and growth in parallel with underpotential deposition. The optical band gap of the deposited superlattice film was determined as 0.15 eV by Fourier transform infrared spectroscopy and depicts an allowed direct type of transition. Raman spectrum observation with annealed and unannealed superlattice sample showed that the LIF mode has presented, suggesting a perfect AB/CB bonding in the superlattice interface.
Zhu
Wen
W
State Key Laboratory of Material Processing and Die & Mould Technology, Wuhan 430074, People's Republic of China. wennarhust@yahoo.com.cn
Yang
Jun-You
JY
Zhou
Dong-Xiang
DX
Xiao
Chen-Jin
CJ
Duan
Xin-Kai
XK
D004563:Electrochemistry; D008567:Membranes, Artificial; D008855:Microscopy, Electron, Scanning; D012666:Semiconductors; D017550:Spectroscopy, Fourier Transform Infrared; D013499:Surface Properties; D014961:X-Ray Diffraction
D008567:Membranes, Artificial