Dual chopped photoreflectance spectroscopy for nondestructive characterization of semiconductors and semiconductor nanostructures.
Photoreflectance (PR) spectroscopy unaffected by photoluminescence and light scattering has been developed for performing precise characterization of the electronic band structure of semiconductors and semiconductor nanostructures. Dual chopping of both the pump and probe lights eliminates the unexpected components included in the signal when detecting the sum frequency or difference frequency component by using a lock-in detection system. The obtained PR signal contains no background and is considered to be an ideal electromodulated reflectance.
Kita
Takashi
T
Department of Electrical and Electronics Engineering, Graduate School of Engineering, Kobe University, Rokkodai 1-1, Nada, Kobe 657-8501, Japan. kita@eedept.kobe-u.ac.jp
Yamada
Masahiro
M
Wada
Osamu
O