title: DNA markers linked to a T10 loose smut resistance gene in wheat (Triticum aestivum L.).
abstract: Screening for loose smut resistance in wheat is difficult. Selecting lines with DNA markers linked to loose smut resistance would be more reliable and less costly. Molecular markers linked to a race T10 loose smut resistance gene were identified using a F6 single seed descent segregating population. A RAPD marker and a RFLP marker were located on opposite flanks of the resistance gene and were shown to be loosely linked. The RAPD marker was converted to a user friendly polymorphic SCAR marker that represented a single genetically defined locus in hexaploid wheat. Using these two bracketing markers simultaneously, the error rate for T10 resistance selection due to crossing-over was reduced to 4%. These markers can be used for a faster and more reliable selection of T10 resistant plants than previous conventional loose smut ratings.
authors.forename: J D
authors.initials: JD
authors.lastname: Procunier
authors.forename: M A
authors.initials: MA
authors.lastname: Gray
authors.forename: N K
authors.initials: NK
authors.lastname: Howes
authors.forename: R E
authors.initials: RE
authors.lastname: Knox
authors.forename: A M
authors.initials: AM
authors.lastname: Bernier