title: From angle-resolved ellipsometry of light scattering to imaging in random media.
abstract: A procedure is described to allow selective cancellation of polarized scattering within optical substrates and multilayers. It is shown how bulk scattering (respectively surface) can be directly eliminated while the remaining roughness (respectively bulk) signal is still measurable. The same procedure can be applied to isolate a single interface or bulk within a stack or to detect slight departure from perfect correlation within multilayers. Experiments and a procedure for selective imaging in random media are described.
authors.affiliation: Institut Fresnel, Unité Mixte de Recherche, Centre National de la Recherche Scientifique ST2I 6133, Université Paul Cézanne, Université de Provence, Faculté des Sciences et Techniques de St Jérôme, Marseille Cedex 20, France. gaelle.georges@fresnel.fr
authors.forename: Gaelle
authors.initials: G
authors.lastname: Georges
authors.forename: Laurent
authors.initials: L
authors.lastname: Arnaud
authors.forename: Laure
authors.initials: L
authors.lastname: Siozade
authors.forename: Nora
authors.initials: N
authors.lastname: Le Neindre
authors.forename: Frédéric
authors.initials: F
authors.lastname: Chazallet
authors.forename: Myriam
authors.initials: M
authors.lastname: Zerrad
authors.forename: Carole
authors.initials: C
authors.lastname: Deumié
authors.forename: Claude
authors.initials: C
authors.lastname: Amra