title: Chromatographic determination of the differential isosteric adsorption enthalpies and differential entropies on ordered silica materials.
abstract: The adsorption properties of the ordered mesoporous siliceous materials: MCM-41C16 (denoted as C16), MCM-41C16-SH and MCM-41C16-NH(2) (known as MCMs) having different surface functionalities were studied by inverse gas chromatography to assess their suitability for adsorption of analytes from gas and liquid phases. Polar and non-polar adsorbates were employed. The differential isosteric enthalpies, -DeltaH(ads), and differential entropies, -DeltaS(ads), of adsorption of different 'molecular probes' were determined chromatographically. A mathematical link between the -DeltaH(ads), and -DeltaS(ads) magnitudes and experimental data was derived through an Antoine-type equation. The present studies have been entirely restricted to the region of low adsorbate concentration. The problem of the interrelationship between the -DeltaH(ads), and -DeltaS(ads) values, known as the 'thermodynamic compensation effect', and interpretation of chromatographic data for the adsorption of different adsorbates on the MCMs have been considered in the light of both experimental data obtained in the present studies and the data available in the literature for siliceous adsorbents with randomly ordered structures. It was shown chromatographically that there is substantial parallelism between the magnitudes of the differential isosteric enthalpy and differential entropy for some 'molecular probes' chromatographed on C16 and its derivatives. Complementary information was obtained by atomic-force microscopy (AFM), X-ray photoelectron spectroscopy and X-ray diffraction (XRD) spectroscopy.
authors.affiliation: Institute of Chemistry, Military University of Technology, Warsaw, Poland. hgrajek@wat.edu.pl
authors.forename: H
authors.initials: H
authors.lastname: Grajek
authors.forename: J
authors.initials: J
authors.lastname: Paciura-Zadrozna
authors.forename: Z
authors.initials: Z
authors.lastname: Witkiewicz
mesh_terms: D000327:Adsorption; D018625:Microscopy, Atomic Force; D012822:Silicon Dioxide / Q000737:chemistry*; D013057:Spectrum Analysis / Q000379:methods; D013816:Thermodynamics; D014965:X-Rays
chemical_list: D012822:Silicon Dioxide