title: Application of EBSD to the analysis of interface planes: evolution over the last two decades.
abstract: Over the last two decades, several methods, of increasing sophistication, have evolved to measure boundary plane orientation by electron backscatter diffraction. Originally, metallographic sectioning was used to obtain the location of the boundary plane. The most recently designed approach allows the relative frequency distribution of boundary misorientation and boundary plane types to be obtained, for very large sample populations, by a stereological method. In this review, the progress in measuring boundary planes by electron backscatter diffraction is charted. Each technique is described in chronological order, illustrated by a series of examples, all relating to boundary plane reorientation.
authors.affiliation: Materials Research Centre, Swansea University, Swansea SA2 8PP, United Kingdom. v.randle@swansea.ac.uk
authors.forename: V
authors.initials: V
authors.lastname: Randle
mesh_terms: D003461:Crystallography; D008163:Luminescent Measurements; D008855:Microscopy, Electron, Scanning; D008962:Models, Theoretical