title: Direct determination of the experimentally observed penetration depth of the evanescent field via near-infrared absorptions enhanced by the off-resonance of surface plasmons.
abstract: Recently, absorption-sensitive surface plasmon resonance (SPR) techniques have attracted much attention. SPR near-infrared spectroscopy (SPR-NIRS) based on the Kretschmann configuration is one of the techniques for absorption enhancement. The enhanced spectrum obtained by SPR-NIRS basically corresponds to the measurement of an NIR absorption spectrum with a very short path length. However, the path length cannot be applied for Lambert's law due to the enhanced evanescent field. A direct determination of the penetration depth of the evanescent field is carried out via NIR absorptions enhanced by the off-resonance of surface plasmons, which is a principle of SPR-NIRS. The signal intensities of the enhanced NIR spectra of micrometer-thick polymer films having various thicknesses are compared with the classic theory of penetration depth. It is confirmed that the effective depth of the SPR-NIRS measurement can be expressed by the classic theory of penetration depth of the evanescent field proposed by Harrick.
authors.affiliation: Department of Chemistry and Research Center for Near Infrared Spectroscopy, School of Science and Technology, Kwansei Gakuin University, 2-1 Gakuen, Sanda 669-1337, Japan. a.ikehata@gmail.com
authors.forename: Akifumi
authors.initials: A
authors.lastname: Ikehata
authors.forename: Kazuaki
authors.initials: K
authors.lastname: Ohara
authors.forename: Yukihiro
authors.initials: Y
authors.lastname: Ozaki