Spectroscopic THz near-field microscope.
We demonstrate a scattering-type scanning near-field optical microscope (s-SNOM) with broadband THz illumination. A cantilevered W tip is used in tapping AFM mode. The direct scattering spectrum is obtained and optimized by asynchronous optical sampling (ASOPS), while near-field scattering is observed by using a space-domain delay stage and harmonic demodulation of the detector signal. True near-field interaction is determined from the approach behavior of the tip to Au samples. Scattering spectra of differently doped Si are presented.
von Ribbeck
H-G
HG
Max-Planck-Institut für Biochemie and Center for Nanoscience, 82152 Martinsried (München), Germany. ribbeck@biochem.mpg.de
Brehm
M
M
van der Weide
D W
DW
Winnerl
S
S
Drachenko
O
O
Helm
M
M
Keilmann
F
F
D004867:Equipment Design; D019544:Equipment Failure Analysis; D007089:Image Enhancement / Q000295:instrumentation*; D018625:Microscopy, Atomic Force / Q000295:instrumentation*; D008872:Microwaves; D013057:Spectrum Analysis / Q000295:instrumentation*