Exact determination of the phase in time-resolved X-ray reflectometry.
An exact solution of the phase retrieval problem is described as applied to in-situ X-ray reflectometry of a growing layered film. The following statement is proved: if the reflectivity R and the derivative dR/dt are known at the time t, then the real and the imaginary parts of the amplitude reflectivity r(t) are found uniquely at this point t.
Kozhevnikov
Igor
I
Institute of Crystallography, Leninsky prospect 59, Moscow 119333, Russia.
Peverini
Luca
L
Ziegler
Eric
E
D000465:Algorithms; D003198:Computer Simulation; D008962:Models, Theoretical; D044367:Phase Transition; D011829:Radiation Dosage; D011874:Radiometry / Q000379:methods*; D013052:Spectrometry, X-Ray Emission / Q000379:methods*