Demonstration of a tunable two-frequency projected fringe pattern with acousto-optic deflectors.
We report on a fringe projector for three-dimensional shape measurement. The developed instrument is able to project a two-frequency fringe pattern, each frequency is independently controlled by electronics. Moreover, each phase of the two fringe patterns is also independently adjusted. The projection system is based on the use of a pair of custom large bandwidth (40 MHz) and high efficiency (60%) TeO2 deflectors. The developed instrument offers the combined advantages of a static two-frequency fringe projector and of a tunable single frequency fringe projector.
IEMN-DOAE, UMR 8520, le Mont Houy, 59313 Valenciennes cedex 09, France. samuel.dupont@univ-valenciennes.fr
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Kastelik