Modeling of the damage dynamics of nanospheres exposed to x-ray free-electron-laser radiation.
Atomic-resolution diffraction imaging of biological particles using x-ray free-electron lasers (XFELs) at 1 A wavelength requires a detailed understanding of the photon-induced damage processes. We discuss how several aspects of existing continuum damage models can be tested during early operation of XFELs at lower x-ray energies in the range of 0.8-5 keV and low fluences, focusing particularly on macroscopic collective effects such as particle charging, expansion, and average ionization of nanospheres.
Hau-Riege
Stefan P
SP
Lawrence Livermore National Laboratory, Livermore, CA 94551, USA. hauriege1@linl.gov
Chapman
Henry N
HN
D003198:Computer Simulation; D004583:Electrons; D007834:Lasers; D008954:Models, Biological; D054118:Nanospheres / Q000528:radiation effects*; D010316:Particle Size; D011827:Radiation; D014961:X-Ray Diffraction; D014965:X-Rays