Depth magnetization profile of a perpendicular exchange coupled system by soft-x-ray resonant magnetic reflectivity.
The magnetic profile across the interface of a perpendicular exchange coupled [NiO/CoO]3/Pt-Co/Pt(111) system is investigated. The magneto-optic Kerr effect reveals a strong coupling between the antiferromagnetic (AFM) oxide and the ferromagnetic (FM) Pt-Co layer, by an increasing coercivity and a rotation of the easy magnetization axis of the FM layer along the AFM spins. Soft x-ray resonant magnetic reflectivity is used to probe the spatial distribution of the out-of-plane magnetization inside the oxide above its ordering temperature. It extends over 1 nm and exhibits a change of sign.
Tonnerre
J M
JM
Institut Néel, CNRS & Université Joseph Fourier, Grenoble Cedex 9, France.
De Santis
M
M
Grenier
S
S
Tolentino
H C N
HC
Langlais
V
V
Bontempi
E
E
García-Fernández
M
M
Staub
U
U