THz emission microscopy with sub-wavelength broadband source.
A versatile THz/IR near field microscope is demonstrated. Collecting the scattered light from a THz in-situ subwavelength source, this microscope provides images with resolution better than lambda/10. The physical origin of the contrast is explained by a Mie scattering diffraction model. Owing to the classical nature of this microscope working in the near field, resolution of THz/IR images is improved using deconvolution process.
Lecaque
Romain
R
Laboratoire Photons Et Matière, UPR5 CNRS and University P. et M. Curie-ESPCI, 10 rue Vauquelin 75231, Paris Cedex 05, France.
Grésillon
Samuel
S
Boccara
Claude
C
D004867:Equipment Design; D019544:Equipment Failure Analysis; D007259:Infrared Rays; D008029:Lighting / Q000295:instrumentation* / Q000379:methods; D008853:Microscopy / Q000295:instrumentation*; D008872:Microwaves