A simple technique for the estimation of the voltage of a transmission electron microscope.
A convergent beam electron diffraction (CBED) technique has been described for the determination of the voltage of a transmission electron microscope (TEM). It involves observing the intersections of HOLZ lines, (1 3 13), (3 1 13), (10 10 8) and (10 10 8), in the transmitted disc of the CBED pattern obtained along the [37 37 4] zone axis of silicon. It is suitable for the TEMs with operational voltage in the range of 200 kV, and is also free from the tilt limitations.
Rao
Duggi V Sridhara
DV
D046529:Microscopy, Electron, Transmission / Q000379:methods*; D012825:Silicon / Q000737:chemistry*; D014961:X-Ray Diffraction / Q000379:methods*
D012825:Silicon