Inducing dendrite formation using an atomic force microscope tip.
Atomic force microscope (AFM) tip-induced nucleation, and dendrite growth of vapor deposited PETN films on Si (100) have been investigated at room temperature. The AFM tip induces a change from smooth and flat morphology to islands and dendrites, which is owing to the lowering and vanishing of 2-D nucleation barrier at the tip contact area; this action gives rise to the formation of large islands in the scanned area and dendrite growth along the scanning boundary.
Chemical Engineering Department, Texas Tech University, Lubbock, TX 79409, USA.
Gengxin
G
Zhang
Brandon L
BL
Weeks