Electron backscatter diffraction as a domain analysis technique in BiFeO(3)-PbTiO(3) single crystals.
xBiFeO(3)-(1-x)PbTiO(3) single crystals were grown via a flux method for a range of compositions. Presented here is a study of the domain configuration in the 0.5BiFeO(3)-0.5PbTiO(3) composition using electron backscatter diffraction to demonstrate the ability of the technique to map ferroelastic domain structures at the micron and submicron scale. The micron-scale domains exhibit an angle of approximately 85 degrees between each variant, indicative of a ferroelastic domain wall in a tetragonal system with a spontaneous strain, c/a - 1 of 0.10, in excellent agreement with the lattice parameters derived from x-ray diffraction. Contrast seen in forescatter images is attributed to variations in the direction of the electrical polarization vector, providing images of ferroelectric domain patterns.
Institute for Materials Research, University of Leeds, Leeds, LS2 9JT, UK. pre0tlb@leeds.ac.uk
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Burnett
T P
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Comyn
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Merson
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Bell
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Mingard
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Hegarty
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Cain
D017610:Calcium Compounds / Q000737:chemistry*; D004583:Electrons; D010087:Oxides / Q000737:chemistry*; D011829:Radiation Dosage; D012031:Refractometry / Q000379:methods*; D012542:Scattering, Radiation; D013499:Surface Properties; D014025:Titanium / Q000737:chemistry*
D017610:Calcium Compounds; D010087:Oxides; C059910:perovskite; D014025:Titanium