Electron backscatter diffraction as a domain analysis technique in BiFeO(3)-PbTiO(3) single crystals.
xBiFeO(3)-(1-x)PbTiO(3) single crystals were grown via a flux method for a range of compositions. Presented here is a study of the domain configuration in the 0.5BiFeO(3)-0.5PbTiO(3) composition using electron backscatter diffraction to demonstrate the ability of the technique to map ferroelastic domain structures at the micron and submicron scale. The micron-scale domains exhibit an angle of approximately 85 degrees between each variant, indicative of a ferroelastic domain wall in a tetragonal system with a spontaneous strain, c/a - 1 of 0.10, in excellent agreement with the lattice parameters derived from x-ray diffraction. Contrast seen in forescatter images is attributed to variations in the direction of the electrical polarization vector, providing images of ferroelectric domain patterns.
Burnett
T L
TL
Institute for Materials Research, University of Leeds, Leeds, LS2 9JT, UK. pre0tlb@leeds.ac.uk
Comyn
T P
TP
Merson
E
E
Bell
A J
AJ
Mingard
K
K
Hegarty
T
T
Cain
M
M
D017610:Calcium Compounds / Q000737:chemistry*; D004583:Electrons; D010087:Oxides / Q000737:chemistry*; D011829:Radiation Dosage; D012031:Refractometry / Q000379:methods*; D012542:Scattering, Radiation; D013499:Surface Properties; D014025:Titanium / Q000737:chemistry*
D017610:Calcium Compounds; D010087:Oxides; C059910:perovskite; D014025:Titanium