Broadband enhanced backscattering spectroscopy of strongly scattering media.
We report on a new experimental method for enhanced backscattering spectroscopy (EBS) of strongly scattering media over a bandwidth from 530-1000 nm. The instrument consists of a supercontinuum light source and an angle-dependent detection system using a fiber-coupled grating spectrometer. Using a combination of two setups, the backscattered intensity is obtained over a large angular range and using circularly polarized light. We present broadband EBS of a TiO(2) powder and of a strongly scattering porous GaP layer. In combination with theoretical model fits, the EBS system yields the optical transport mean free path over the available spectral window.
Center for Nanophotonics, FOM Institute for Atomic and Molecular Physics AMOLF, Kruislaan 407, 1098 SJ Amsterdam, The Netherlands. muskens@amolf.nl
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D004867:Equipment Design; D019544:Equipment Failure Analysis; D008027:Light; D008872:Microwaves; D049329:Nanostructures / Q000737:chemistry*; D036103:Nanotechnology / Q000295:instrumentation* / Q000379:methods; D012542:Scattering, Radiation; D013057:Spectrum Analysis / Q000295:instrumentation* / Q000379:methods*