SEM analysis of enamel surface treated by Er:YAG laser: influence of irradiation distance.
BACKGROUND
Depending on the distance of laser tip to dental surface a specific morphological pattern should be expected. However, there have been limited reports that correlate the Er:YAG irradiation distance with dental morphology.


OBJECTIVE
To assess the influence of Er:YAG laser irradiation distance on enamel morphology, by means of scanning electron microscopy (SEM).


METHODS
Sixty human third molars were employed to obtain discs (approximately =1 mm thick) that were randomly assigned to six groups (n=10). Five groups received Er:YAG laser irradiation (80 mJ/2 Hz) for 20 s, according to the irradiation distance: 11, 12, 14, 16, or 17 mm and the control group was treated with 37% phosphoric acid for 15 s. The laser-irradiated discs were bisected. One hemi-disc was separated for superficial analysis without subsequent acid etching, and the other one, received the phosphoric acid for 15 s. Samples were prepared for SEM.


RESULTS
Laser irradiation at 11 and 12 mm provided an evident ablation of enamel, with evident fissures and some fused areas. At 14, 16 and 17 mm the superficial topography was flatter than in the other distances. The subsequent acid etching on the lased-surface partially removed the disorganized tissue.


CONCLUSIONS
Er:YAG laser in defocused mode promoted slight morphological alterations and seems more suitable for enamel conditioning than focused irradiation. The application of phosphoric acid on lased-enamel surface, regardless of the irradiation distance, decreased the superficial irregularities.
Souza-Gabriel
A E
AE
Department of Restorative Dentistry, Ribeirão Preto School of Dentistry, University of São Paulo, São Paulo, Brazil. aline.gabriel@gmail.com
Chinelatti
M A
MA
Borsatto
M C
MC
Pécora
J D
JD
Palma-Dibb
R G
RG
Corona
S A M
SA
D000134:Acid Etching, Dental; D003743:Dental Enamel / Q000528:radiation effects* / Q000648:ultrastructure*; D006801:Humans; D053685:Laser Therapy / Q000379:methods*; D008855:Microscopy, Electron, Scanning / Q000295:instrumentation; D008964:Molar, Third / Q000528:radiation effects / Q000648:ultrastructure*; D011897:Random Allocation