Exact determination of the phase in time-resolved X-ray reflectometry.
An exact solution of the phase retrieval problem is described as applied to in-situ X-ray reflectometry of a growing layered film. The following statement is proved: if the reflectivity R and the derivative dR/dt are known at the time t, then the real and the imaginary parts of the amplitude reflectivity r(t) are found uniquely at this point t.
Institute of Crystallography, Leninsky prospect 59, Moscow 119333, Russia.
Igor
I
Kozhevnikov
Luca
L
Peverini
Eric
E
Ziegler
D000465:Algorithms; D003198:Computer Simulation; D008962:Models, Theoretical; D044367:Phase Transition; D011829:Radiation Dosage; D011874:Radiometry / Q000379:methods*; D013052:Spectrometry, X-Ray Emission / Q000379:methods*