Near-field imaging of Bloch surface waves on silicon nitride one-dimensional photonic crystals.
We perform a near-field mapping of Bloch Surface Waves excited at the truncation interface of a planar silicon nitride multilayer. We directly determine the field distribution of Bloch Surface Waves along the propagation direction and normally to the surface. Furthermore, we present a direct measurement of a near-field enhancement effect under particular coupling conditions. Experimental evidence demonstrates that a approximately 10(2) near-field intensity enhancement can be realistically attained, thus confirming predictions from rigorous calculations.
Descrovi
Emiliano
E
Dipartimento di Fisica, Politecnico di Torino, corso Duca degli Abruzzi 24, 10129 Torino, Italy. emiliano.descrovi@polito.it
Sfez
Tristan
T
Dominici
Lorenzo
L
Nakagawa
Wataru
W
Michelotti
Francesco
F
Giorgis
Fabrizio
F
Herzig
Hans-Peter
HP
D003198:Computer Simulation; D017076:Computer-Aided Design; D003460:Crystallization / Q000379:methods*; D004867:Equipment Design; D019544:Equipment Failure Analysis; D016252:Microscopy, Scanning Tunneling / Q000379:methods*; D008962:Models, Theoretical; D055095:Optics and Photonics / Q000295:instrumentation*; D017785:Photons; D017655:Silicon Compounds / Q000737:chemistry*
D017655:Silicon Compounds; C032734:silicon nitride