Continuous wave terahertz spectrometer as a noncontact thickness measuring device.
We present a low cost terahertz (THz) spectrometer with coherent detection based on two simple and robust dipole antennas driven by two laser diodes. The spectrometer covers frequencies up to 1 THz, with a peak signal-to-noise ratio exceeding 40 dB for a lock-in integration time of 30 ms. We demonstrate that the thickness profile of a sample can be reconstructed from an acquired THz image.
Institute for High-Frequency Technology, Schleinitzstrasse, Braunschweig, Germany. r.wilk@menlosystems.com
Rafał
R
Wilk
Falk
F
Breitfeld
Martin
M
Mikulics
Martin
M
Koch
D004566:Electrodes; D055590:Electromagnetic Phenomena; D004867:Equipment Design; D007834:Lasers; D055095:Optics and Photonics; D020959:Polyethylene / Q000737:chemistry; D011786:Quality Control; D012107:Research Design; D013053:Spectrophotometry / Q000379:methods*; D013696:Temperature; D013997:Time Factors
D020959:Polyethylene