Broadband enhanced backscattering spectroscopy of strongly scattering media.
We report on a new experimental method for enhanced backscattering spectroscopy (EBS) of strongly scattering media over a bandwidth from 530-1000 nm. The instrument consists of a supercontinuum light source and an angle-dependent detection system using a fiber-coupled grating spectrometer. Using a combination of two setups, the backscattered intensity is obtained over a large angular range and using circularly polarized light. We present broadband EBS of a TiO(2) powder and of a strongly scattering porous GaP layer. In combination with theoretical model fits, the EBS system yields the optical transport mean free path over the available spectral window.
Muskens
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Center for Nanophotonics, FOM Institute for Atomic and Molecular Physics AMOLF, Kruislaan 407, 1098 SJ Amsterdam, The Netherlands. muskens@amolf.nl
Lagendijk
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D004867:Equipment Design; D019544:Equipment Failure Analysis; D008027:Light; D008872:Microwaves; D049329:Nanostructures / Q000737:chemistry*; D036103:Nanotechnology / Q000295:instrumentation* / Q000379:methods; D012542:Scattering, Radiation; D013057:Spectrum Analysis / Q000295:instrumentation* / Q000379:methods*