Investigation of CdS thin films by a near-field microwave microprobe.
Cadmium sulphide (CdS) thin films with different microstructures and morphologies were measured by using a near-field microwave microprobe (NFMM). The NFMM system was coupled to a dielectric resonator with a distance regulation system at an operating frequency f=4.1 GHz. The changes in dielectric permittivity of CdS thin films due to different annealing temperatures were investigated by measuring the reflection coefficient S(11). CdS thin films with different microstructures and morphology were characterized by X-ray diffraction, atomic force microscopy and NFMM.
Sargsyan
Tigran
T
Department of Physics and Interdisciplinary Program of Integrated Biotechnology, Sogang University, Seoul 121-742, Republic of Korea.
Hovsepyan
Artur
A
Melikyan
Harutyun
H
Yoon
Youngwoon
Y
Lee
Huneung
H
Babajanyan
Arsen
A
Kim
Mijung
M
Cha
Deokjoon
D
Lee
Kiejin
K