Absolute phase-assisted three-dimensional data registration for a dual-camera structured light system.
For a three-dimensional shape measurement system with a single projector and multiple cameras, registering patches from different cameras is crucial. Registration usually involves a complicated and time-consuming procedure. We propose a new method that can robustly match different patches via absolute phase without significantly increasing its cost. For y and z coordinates, the transformations from one camera to the other are approximated as third-order polynomial functions of the absolute phase. The x coordinates involve only translations and scalings. These functions are calibrated and only need to be determined once. Experiments demonstrated that the alignment error is within RMS 0.7 mm.
Mathematics Department, Harvard University, One Oxford Street, Cambridge, Massachusetts 02138, USA. szhang77@gmail.com
Song
S
Zhang
Shing-Tung
ST
Yau