An examination of mass thickness measurements with X-ray sources.
A method using X-rays to measure mass thickness is discussed. The method utilizes a filter to absorb low energy and characteristic photons so that the hardened X-ray spectra have a peaked energy distribution. An equivalent X-ray energy, which defines the attenuation in a material of interest can be used. The effect on the X-ray spectra of different filters is examined with Monte Carlo simulation using the EGSnrc package. A theoretical model for X-ray absorption that shows that the method can achieve good precision for a certain range of mass thicknesses is advanced. Experimental results agree well with the theoretical analysis. It is found that for a certain range of mass thicknesses, the relative error can be less than 1% for the aluminum alloy sample at the tube voltage of 30 or 45 kV.
Mincong
Chen
C
Department of Modern Physics, University of Science and Technology of China, Jin Zhai Road, Hefei 230026, China.
Hongmei
Li
L
Ziyu
Chen
C
Ji
Shen
S
D015502:Absorptiometry, Photon / Q000379:methods*; D000465:Algorithms; D000497:Alloys / Q000737:chemistry*; D003198:Computer Simulation; D008422:Materials Testing / Q000379:methods*; D015233:Models, Statistical; D009010:Monte Carlo Method
D000497:Alloys