Small-phase retrieval with a single far-field image.
A method to retrieve small phase aberration from a single far-field image is proposed. It is found that in small phase condition, the odd and even parts of phase aberration can be obtained with a simple linear calculation method. The difference between a single measured image with aberration and the calibrated image with inherent aberration are used in the calculation process. It is proved that the most part of the inherent phase aberration of the imaging system must be of even type, such as defocus, astigmatism, etc., to keep the method working. Results of numerical simulations on atmosphere disturbed phase aberrations show that the proposed small phase retrieval method works well when the RMS phase error is less than 1 rad. It is also shown that the method is valid in noise condition when SNR>100.
Institute of Optics and Electronics, Chinese Academy of Sciences, P.O. Box 350, Chengdu, Sichuan 610209, China.
Min
M
Li
Xin-Yang
XY
Li
Wen-Han
WH
Jiang
D003198:Computer Simulation; D017076:Computer-Aided Design; D004867:Equipment Design; D019544:Equipment Failure Analysis; D008962:Models, Theoretical; D012031:Refractometry / Q000295:instrumentation* / Q000379:methods*