An examination of mass thickness measurements with X-ray sources.
A method using X-rays to measure mass thickness is discussed. The method utilizes a filter to absorb low energy and characteristic photons so that the hardened X-ray spectra have a peaked energy distribution. An equivalent X-ray energy, which defines the attenuation in a material of interest can be used. The effect on the X-ray spectra of different filters is examined with Monte Carlo simulation using the EGSnrc package. A theoretical model for X-ray absorption that shows that the method can achieve good precision for a certain range of mass thicknesses is advanced. Experimental results agree well with the theoretical analysis. It is found that for a certain range of mass thicknesses, the relative error can be less than 1% for the aluminum alloy sample at the tube voltage of 30 or 45 kV.
Department of Modern Physics, University of Science and Technology of China, Jin Zhai Road, Hefei 230026, China.
Chen
C
Mincong
Li
L
Hongmei
Chen
C
Ziyu
Shen
S
Ji
D015502:Absorptiometry, Photon / Q000379:methods*; D000465:Algorithms; D000497:Alloys / Q000737:chemistry*; D003198:Computer Simulation; D008422:Materials Testing / Q000379:methods*; D015233:Models, Statistical; D009010:Monte Carlo Method
D000497:Alloys