Structural order in perfluoropentacene thin films and heterostructures with pentacene.
Synchrotron x-ray diffraction reciprocal space mapping was performed on perfluoropentacene (PFP) thin films on SiO2 in order to determine the crystal structure of a novel, substrate-induced thin film phase to be monoclinic with unit cell parameters of a = 15.76 +/- 0.02 A, b = 4.51 +/- 0.02 A, c = 11.48 +/- 0.02 A, and beta = 90.4 +/- 0.1 degrees . Moreover, layered and co-deposited heterostructures of PFP and pentacene (P) were investigated by specular and grazing-incidence x-ray diffraction, atomic force microscopy, and Fourier-transform infrared spectroscopy. For a ca. three-monolayers-thick PFP film grown on a P underlayer, slightly increased lattice spacing was found. In contrast, co-deposited P/PFP films form a new mixed-crystal structure with no detectable degree of phase separation. These results highlight the structural complexity of these technically relevant molecular heterojunctions for use in organic electronics.
Humboldt-Universitat zu Berlin, Institut fur Physik, Newtonstrasse 15, D-12489 Berlin, Germany.
Ingo
I
Salzmann
Steffen
S
Duhm
Georg
G
Heimel
Jürgen P
JP
Rabe
Norbert
N
Koch
Martin
M
Oehzelt
Youichi
Y
Sakamoto
Toshiyasu
T
Suzuki