Tip-modulation scanned gate microscopy.
We introduce a technique that improves the sensitivity and resolution and eliminates the nonlocal background of scanned gate microscopy (SGM). In conventional SGM, a voltage bias is applied to the atomic force microscope tip and the sample conductance is measured as the tip is scanned. In the new technique, which we call tip-modulation SGM (tmSGM), the biased tip is oscillated and the induced oscillation of the sample conductance is measured. Applied to single-walled carbon nanotube network devices, tmSGM gives sharp, low-noise and background-free images.
Wilson
Neil R
NR
Department of Physics, University of Warwick, Coventry, CV4 7AL, UK. Neil.Wilson@warwick.ac.uk
Cobden
David H
DH