title: Sample cell for EXAFS measurements on molten materials at elevated temperatures.
abstract: We describe the design, fabrication, and utilization of a simple sample cell for extended x-ray absorption fine structure (EXAFS) measurements at elevated temperature. The cell is rigid, inert, easy to fabricate, cheap and effective in maintaining the critical specimen dimensions of both solid and liquid samples up to 1000 degrees C.
authors.affiliation: Xerox Palo Alto Research Center, Palo Alto, California 94304, USA.
authors.forename: J C
authors.initials: JC
authors.lastname: Mikkelsen
authors.forename: J B
authors.initials: JB
authors.lastname: Boyce
authors.forename: R
authors.initials: R
authors.lastname: Allen
mesh_terms: D003300:Copper / Q000737:chemistry; D004867:Equipment Design; D006371:Helium / Q000737:chemistry; D044367:Phase Transition; D012107:Research Design; D012834:Silver / Q000737:chemistry; D013052:Spectrometry, X-Ray Emission / Q000295:instrumentation* / Q000379:methods; D013696:Temperature; D014965:X-Rays
chemical_list: D006371:Helium; D012834:Silver; D003300:Copper