Some modifications of electric circuitry for internal friction measurements of U-shape specimens.
Some modifications of the electric circuitry are described for the apparatus of the internal friction measurement of thin wire specimens; the apparatus has been developed by Franklin et al. The improved apparatus has been successfully used in the internal friction measurements of cold-worked vanadium specimens.
Yoshinari
O
O
Graduate School, Tohoku University, Sendai 980, Japan.
Koiwa
M
M
Sugawara
H
H
Satoh
I
I