title: Some modifications of electric circuitry for internal friction measurements of U-shape specimens.
abstract: Some modifications of the electric circuitry are described for the apparatus of the internal friction measurement of thin wire specimens; the apparatus has been developed by Franklin et al. The improved apparatus has been successfully used in the internal friction measurements of cold-worked vanadium specimens.
authors.affiliation: Graduate School, Tohoku University, Sendai 980, Japan.
authors.forename: O
authors.initials: O
authors.lastname: Yoshinari
authors.forename: M
authors.initials: M
authors.lastname: Koiwa
authors.forename: H
authors.initials: H
authors.lastname: Sugawara
authors.forename: I
authors.initials: I
authors.lastname: Satoh