title: Robust single-nanoparticle probe for contact-mode analysis and dip-pen nanolithography.
authors.affiliation: School of Physics, Seoul National University NS50 Shilim-Dong, Kwanak-Gu, Seoul 151-742, Korea.
authors.forename: Taekyeong
authors.initials: T
authors.lastname: Kim
authors.forename: Sung
authors.initials: S
authors.lastname: Myung
authors.forename: Tae Hyun
authors.initials: TH
authors.lastname: Kim
authors.forename: Seunghun
authors.initials: S
authors.lastname: Hong
mesh_terms: D004548:Elasticity; D006046:Gold; D053768:Metal Nanoparticles / Q000648:ultrastructure; D018625:Microscopy, Atomic Force / Q000295:instrumentation* / Q000379:methods*; D008855:Microscopy, Electron, Scanning / Q000295:instrumentation* / Q000379:methods; D015335:Molecular Probes / Q000648:ultrastructure; D036103:Nanotechnology / Q000295:instrumentation; D012822:Silicon Dioxide; D013499:Surface Properties
chemical_list: D015335:Molecular Probes; D006046:Gold; D012822:Silicon Dioxide