Phase-shifting interferometer based on changing the direction of linear polarization orthogonally.
We present a new type of phase-shifting interferometer, which utilizes a polarizing prism to form quadrature phase-shifted fringe patterns onto a single imaging sensor. By changing the direction of linear polarization of the incident light orthogonally, four phase-shifted fringe patterns in quadrature are obtained by taking images twice; thus it is possible to reduce phase errors caused by mechanical vibrations and air turbulence that occur in temporal phase-shifting interferometers. We present the principle of this interferometer with its theoretical analysis, using the Jones matrix, along with experimental results.
Kiire
Tomohiro
T
Department of Media Engineering, Graduate School of Engineering, Tokyo Polytechnic University, 1583 Iiyama, Atsugi, Kanagawa 243-0297, Japan. d0681001@st.t-kougei.ac.jp
Nakadate
Suezou
S
Shibuya
Masato
M