title: High-performance electronics using dense, perfectly aligned arrays of single-walled carbon nanotubes.
abstract: Single-walled carbon nanotubes (SWNTs) have many exceptional electronic properties. Realizing the full potential of SWNTs in realistic electronic systems requires a scalable approach to device and circuit integration. We report the use of dense, perfectly aligned arrays of long, perfectly linear SWNTs as an effective thin-film semiconductor suitable for integration into transistors and other classes of electronic devices. The large number of SWNTs enable excellent device-level performance characteristics and good device-to-device uniformity, even with SWNTs that are electronically heterogeneous. Measurements on p- and n-channel transistors that involve as many as approximately 2,100 SWNTs reveal device-level mobilities and scaled transconductances approaching approximately 1,000 cm(2) V(-1) s(-1) and approximately 3,000 S m(-1), respectively, and with current outputs of up to approximately 1 A in devices that use interdigitated electrodes. PMOS and CMOS logic gates and mechanically flexible transistors on plastic provide examples of devices that can be formed with this approach. Collectively, these results may represent a route to large-scale integrated nanotube electronics.
authors.affiliation: Department of Materials Science and Engineering, University of Illinois at Urbana Champaign, Urbana, Illinois 61801, USA.
authors.forename: Seong Jun
authors.initials: SJ
authors.lastname: Kang
authors.forename: Coskun
authors.initials: C
authors.lastname: Kocabas
authors.forename: Taner
authors.initials: T
authors.lastname: Ozel
authors.forename: Moonsub
authors.initials: M
authors.lastname: Shim
authors.forename: Ninad
authors.initials: N
authors.lastname: Pimparkar
authors.forename: Muhammad A
authors.initials: MA
authors.lastname: Alam
authors.forename: Slava V
authors.initials: SV
authors.lastname: Rotkin
authors.forename: John A
authors.initials: JA
authors.lastname: Rogers
mesh_terms: D003460:Crystallization / Q000379:methods*; D004553:Electric Conductivity; D004581:Electronics / Q000295:instrumentation*; D004867:Equipment Design; D019544:Equipment Failure Analysis; D046911:Macromolecular Substances / Q000737:chemistry; D008422:Materials Testing; D008968:Molecular Conformation; D036103:Nanotechnology / Q000379:methods*; D037742:Nanotubes, Carbon / Q000737:chemistry* / Q000648:ultrastructure*; D010316:Particle Size; D012666:Semiconductors; D013499:Surface Properties
chemical_list: D046911:Macromolecular Substances; D037742:Nanotubes, Carbon