title: A capacitance-based micropositioning system for x-ray rocking curve measurements.
abstract: Certain types of x-ray experiments require very precise angular positioning of crystals in the vicinity of the Bragg reflection condition. A system applicable to some measurement of this type is described which achieves a long-term angular stability of approximately 10(-7) radians, coupled with a linear angular readout. This is achieved through a novel capacitance sensing system which provides angle measurement, together with the use of an auxilliary servo loop based on the Bragg condition to ensure long-term overall angular stability.
authors.affiliation: Bell Laboratories, Murray Hill, New Jersey 07974, USA.
authors.forename: G L
authors.initials: GL
authors.lastname: Miller
authors.forename: R A
authors.initials: RA
authors.lastname: Boie
authors.forename: P L
authors.initials: PL
authors.lastname: Cowan
authors.forename: J A
authors.initials: JA
authors.lastname: Golovchenko
authors.forename: R W
authors.initials: RW
authors.lastname: Kerr
authors.forename: D A
authors.initials: DA
authors.lastname: Robinson