title: X-ray reflectometer for optical efficiency and scatter measurements.
abstract: An instrument has been developed to determine the reflection efficiency and scatter characteristics of optical samples at x-ray wavelengths from 1.5 to 113 A. The reflectometer operates in an oil-free vacuum chamber and measures the reflection efficiency and scatter characteristics as a function of the angle of incidence. The reflection efficiency is given for lambda=8.34 A incident on a fused silica sample finished to a flatness of lambda/10. The experimental reflection efficiency is compared to the theoretical data. The scatter curves are given for the direct x-ray beam and for the beam reflected from the fused silica sample at theta=50 arc minutes. The full-width-at-half-maximum (FWHM) resolution of the instrument is approximately 13 arc seconds as determined by a least-squares smoothing of the experimental data.
authors.affiliation: Space Sciences Laboratory, NASA/Marshall Space Flight Center, AL 35812, USA.
authors.forename: J M
authors.initials: JM
authors.lastname: Reynolds
authors.forename: S A
authors.initials: SA
authors.lastname: Fields
authors.forename: R L
authors.initials: RL
authors.lastname: Holland