title: Thermal conductivity comparison method based on silicon diode thermometry.
abstract: A room-temperature thermal conductivity comparison method is described which does not required calibrated thermometers and which involves temperature rises <1 K. The method is based on silicon diode thermometry, and the results obtained on three unknowns measured against alumina are presented. For the short samples measured, the uncertainty is approximately +/-5%. Methods for applying the technique at other temperatures and for improving the accuracy are discussed.
authors.affiliation: Lake Shore Cryotronics, Inc., 64 E. Walnut St., Westerville, Ohio 43081, USA.
authors.forename: W N
authors.initials: WN
authors.lastname: Lawless
authors.forename: C F
authors.initials: CF
authors.lastname: Clark