title: Reflection-time-of-flight spectrometer for two-electron (e,2e) coincidence spectroscopy on surfaces.
abstract: In this article, a novel time-of-flight spectrometer for two-electron-emission (e,2egamma,2e) correlation spectroscopy from surfaces at low electron energies is presented. The spectrometer consists of electron optics that collect emitted electrons over a solid angle of approximately 1 sr and focus them onto a multichannel plate using a reflection technique. The flight time of an electron with kinetic energy of Ekin approximately 25 eV is around 100 ns. The corresponding time- and energy resolution are typically approximately 1 ns and approximately 0.65 eV, respectively. The first (e,2e) data obtained with the present setup from a LiF film are presented.
authors.affiliation: Max-Planck-Institut fur Mikrostrukturphysik, Weinberg 2, D-06120 Halle (Saale), Germany.
authors.forename: J
authors.initials: J
authors.lastname: Kirschner
authors.forename: G
authors.initials: G
authors.lastname: Kerhervé
authors.forename: C
authors.initials: C
authors.lastname: Winkler