title: Monte Carlo simulations of microchannel plate detectors. I. Steady-state voltage bias results.
abstract: X-ray detectors based on straight-channel microchannel plates (MCPs) are a powerful diagnostic tool for two-dimensional, time-resolved imaging and time-resolved x-ray spectroscopy in the fields of laser-driven inertial confinement fusion and fast Z-pinch experiments. Understanding the behavior of microchannel plates as used in such detectors is critical to understanding the data obtained. The subject of this paper is a Monte Carlo computer code we have developed to simulate the electron cascade in a MCP under a static applied voltage. Also included in the simulation is elastic reflection of low-energy electrons from the channel wall, which is important at lower voltages. When model results were compared to measured MCP sensitivities, good agreement was found. Spatial resolution simulations of MCP-based detectors were also presented and found to agree with experimental measurements.
authors.affiliation: National Security Technologies, 182 East Gate Drive, Los Alamos, New Mexico 87544, USA. wum@nv.doe.gov
authors.forename: Ming
authors.initials: M
authors.lastname: Wu
authors.forename: Craig A
authors.initials: CA
authors.lastname: Kruschwitz
authors.forename: Dane V
authors.initials: DV
authors.lastname: Morgan
authors.forename: Jiaming
authors.initials: J
authors.lastname: Morgan