Phase sensitive optical near-field mapping using frequency-shifted laser optical feedback interferometry.
The use of laser optical feedback Imaging (LOFI) for scattering-type scanning near-field optical microscopy (sSNOM) is proposed and investigated. We implement this sensitive imaging method by combining a sSNOM with optical heterodyne interferometry and the dynamic properties of a B class laser source which is here used both as source and detector. Compared with previous near field optical heterodyne experiments, this detection scheme provides an optical amplification that is several orders of magnitude higher, while keeping a low noise phase-sensitive detection. Successful demonstration of this complex field imaging technique is done on Silicon on Insulator (SOI) optical waveguides revealing phase singularities and directional leakage.
Blaize
Sylvain
S
Institut Charles Delaunay, CNRS(FRE2848), Laboratoire de Nanotechnologie et d'instrumentation Optique, Université de Technologie de Troyes, 12 rue Marie-Curie, BP 2060, 10010 Troyes, France. blaize@utt.fr
Bérenguier
Baptiste
B
Stéfanon
Ilan
I
Bruyant
Aurélien
A
Lérondel
Gilles
G
Royer
Pascal
P
Hugon
Olivier
O
Jacquin
Olivier
O
Lacot
Eric
E
D004867:Equipment Design; D019544:Equipment Failure Analysis; D007368:Interferometry / Q000295:instrumentation*; D008858:Microscopy, Phase-Contrast / Q000295:instrumentation*; D020527:Microscopy, Scanning Probe / Q000295:instrumentation*; D055095:Optics and Photonics / Q000295:instrumentation*