Determining the angles of incidence in a LEED experiment.
A new method for determining the angles of incidence in a back-reflection, post-acceleration, fluorescent display LEED apparatus is presented which uses the angles between the diffraction spots on a photograph of the LEED pattern. Absolute accuracies better than 0.1 degrees for both incidence angles should be routinely available.
Cunningham
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SL
Division of Chemistry and Chemical Engineering, California Institute of Technology, Pasadena, California 91125.
Weinberg
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WH