title: Low-dose aberration corrected cryo-electron microscopy of organic specimens.
abstract: Spherical aberration (C(s)) correction in the transmission electron microscope has enabled sub-angstrom resolution imaging of inorganic materials. To achieve similar resolution for radiation-sensitive organic materials requires the microscope to be operated under hybrid conditions: low electron dose illumination of the specimen at liquid nitrogen temperature and low defocus values. Initial images from standard inorganic and organic test specimens have indicated that under these conditions C(s)-correction can provide a significant improvement in resolution (to less than 0.16nm) for direct imaging of organic samples.
authors.affiliation: Molecular and Cellular Biology, University of California, Davis, CA 95616, USA. JEEvans@ucdavis.edu
authors.forename: James E
authors.initials: JE
authors.lastname: Evans
authors.forename: Crispin
authors.initials: C
authors.lastname: Hetherington
authors.forename: Angus
authors.initials: A
authors.lastname: Kirkland
authors.forename: Lan-Yun
authors.initials: LY
authors.lastname: Chang
authors.forename: Henning
authors.initials: H
authors.lastname: Stahlberg
authors.forename: Nigel
authors.initials: N
authors.lastname: Browning
mesh_terms: D020285:Cryoelectron Microscopy / Q000379:methods*; D046529:Microscopy, Electron, Transmission / Q000379:methods*