title: High-pressure in situ density measurement of low-Z noncrystalline materials with a diamond-anvil cell by an x-ray absorption method.
abstract: We have developed techniques for high-pressure in situ density measurement of low-Z noncrystalline materials with a diamond-anvil cell (DAC) by an x-ray absorption method. In DAC experiments, accurate determination of the sample thickness is difficult. Moreover, since the sample in a DAC is thin and the interaction between low-Z materials and x rays is small, not the sample but the anvils absorb most of x rays. This makes the measurement quite difficult. We have overcome such difficulties and have successfully measured the density of SiO2 glass, a low-Z noncrystalline material, as a function of pressure up to 35 GPa.
authors.affiliation: Department of Earth and Planetary Science, University of Tokyo, Tokyo 113-0033, Japan.
authors.forename: Tomoko
authors.initials: T
authors.lastname: Sato
authors.forename: Nobumasa
authors.initials: N
authors.lastname: Funamori