title: Phase sensitive optical near-field mapping using frequency-shifted laser optical feedback interferometry.
abstract: The use of laser optical feedback Imaging (LOFI) for scattering-type scanning near-field optical microscopy (sSNOM) is proposed and investigated. We implement this sensitive imaging method by combining a sSNOM with optical heterodyne interferometry and the dynamic properties of a B class laser source which is here used both as source and detector. Compared with previous near field optical heterodyne experiments, this detection scheme provides an optical amplification that is several orders of magnitude higher, while keeping a low noise phase-sensitive detection. Successful demonstration of this complex field imaging technique is done on Silicon on Insulator (SOI) optical waveguides revealing phase singularities and directional leakage.
authors.affiliation: Institut Charles Delaunay, CNRS(FRE2848), Laboratoire de Nanotechnologie et d'instrumentation Optique, Université de Technologie de Troyes, 12 rue Marie-Curie, BP 2060, 10010 Troyes, France. blaize@utt.fr
authors.forename: Sylvain
authors.initials: S
authors.lastname: Blaize
authors.forename: Baptiste
authors.initials: B
authors.lastname: Bérenguier
authors.forename: Ilan
authors.initials: I
authors.lastname: Stéfanon
authors.forename: Aurélien
authors.initials: A
authors.lastname: Bruyant
authors.forename: Gilles
authors.initials: G
authors.lastname: Lérondel
authors.forename: Pascal
authors.initials: P
authors.lastname: Royer
authors.forename: Olivier
authors.initials: O
authors.lastname: Hugon
authors.forename: Olivier
authors.initials: O
authors.lastname: Jacquin
authors.forename: Eric
authors.initials: E
authors.lastname: Lacot
mesh_terms: D004867:Equipment Design; D019544:Equipment Failure Analysis; D007368:Interferometry / Q000295:instrumentation*; D008858:Microscopy, Phase-Contrast / Q000295:instrumentation*; D020527:Microscopy, Scanning Probe / Q000295:instrumentation*; D055095:Optics and Photonics / Q000295:instrumentation*