title: Streak camera measurement of subnanosecond plastic scintillator properties.
abstract: A streak camera technique with temporal resolution of 20 ps has been used to measure the fluorescence properties of several subnanosecond plastic scintillators. The method employs a vacuum light pipe coupled to an optical streak camera. The scintillators are excited by a 200-ps x-ray pulse generated by a 1.06-microm Nd:YAG laser focused onto an iron target. The time history of the low-energy x-ray pulse is measured with an x-ray streak camera. Results are given for NElll plastic scintillators doped with benzophenone or acetophenone, for PVT doped with butyl-PBD, and for a ZnO phosphor doped with Ga.
authors.affiliation: Lawrence Livermore Laboratory, University of California, Livermore, CA 94550, USA.
authors.forename: J C
authors.initials: JC
authors.lastname: Cheng
authors.forename: K G
authors.initials: KG
authors.lastname: Tirsell
authors.forename: G R
authors.initials: GR
authors.lastname: Tripp
authors.forename: E M
authors.initials: EM
authors.lastname: Lent
authors.forename: R A
authors.initials: RA
authors.lastname: Lerche
mesh_terms: D004307:Dose-Response Relationship, Radiation; D008422:Materials Testing / Q000295:instrumentation* / Q000379:methods; D036103:Nanotechnology / Q000295:instrumentation* / Q000379:methods; D010969:Plastics / Q000737:chemistry* / Q000528:radiation effects*; D011829:Radiation Dosage; D011874:Radiometry / Q000295:instrumentation* / Q000379:methods*; D012588:Scintillation Counting / Q000295:instrumentation* / Q000379:methods; D012680:Sensitivity and Specificity; D014965:X-Rays
chemical_list: D010969:Plastics