Improved sectioning in a slit scanning confocal microscope.
We describe a simple implementation of a slit scanning confocal microscope to obtain an axial resolution better than that of a point-scanning confocal microscope. Under slit illumination, images of a fluorescent object are captured using an array detector instead of a line detector so that out-of-focus light is recorded and then subtracted from the adjacent images. Axial resolution after background subtraction is 2.2 times better than the slit confocal resolution, and out-of-focus image suppression is calculated to attenuate with defocus faster by 1 order of magnitude than in the point confocal case.
Poher
Vincent
V
Photonics Group, Blackett Laboratory, Department of Chemistry, Imperial College London, London, UK. vincent.poher03@imperial.ac.uk
Kennedy
Gordon T
GT
Manning
Hugh B
HB
Owen
Dylan M
DM
Zhang
Haoxiang X
HX
Gu
Erdan
E
Dawson
Martin D
MD
French
Paul M W
PM
Neil
Mark A A
MA
D000465:Algorithms; D004867:Equipment Design; D005453:Fluorescence; D005456:Fluorescent Dyes / Q000494:pharmacology; D007091:Image Processing, Computer-Assisted / Q000379:methods*; D018613:Microscopy, Confocal / Q000295:instrumentation* / Q000379:methods*; D015233:Models, Statistical; D011058:Pollen / Q000737:chemistry; D015203:Reproducibility of Results; D013382:Subtraction Technique
D005456:Fluorescent Dyes