title: Nanometre resolution using high-resolution scanning electron microscopy corroborated by atomic force microscopy.
abstract: The resolving power of high-resolution scanning electron microscopy was judged using topographical height data from atomic force microscopy in order to assess the technique as a tool for understanding nanoporous crystal growth.
authors: Centre for Nanoporous Materials, School of Chemistry, The University of Manchester, Chemistry Building, Oxford Road, Manchester, UK. sammichaelstevens@mac.com
authors: Sam M
authors: SM
authors: Stevens
authors: Pablo
authors: P
authors: Cubillas
authors: Kjell
authors: K
authors: Jansson
authors: Osamu
authors: O
authors: Terasaki
authors: Michael W
authors: MW
authors: Anderson
authors: Paul A
authors: PA
authors: Wright
authors: María
authors: M
authors: Castro