title: Structure and properties of small molecule-polymer blend semiconductors for organic thin film transistors.
abstract: A comprehensive structural and electrical characterization of solution-processed blend films of 6,13-bis(triisopropylsilylethynyl) pentacene (TIPS-pentacene) semiconductor and poly(alpha-methylstyrene) (PalphaMS) insulator was performed to understand and optimize the blend semiconductor films, which are very attractive as the active layer in solution-processed organic thin-film transistors (OTFTs). Our study, based on careful measurements of specular neutron reflectivity and grazing-incidence X-ray diffraction, showed that the blends with a low molecular-mass PalphaMS exhibited a strong segregation of TIPS-pentacene only at the air interface, but surprisingly the blends with a high molecular-mass PalphaMS showed a strong segregation of TIPS-pentacene at both air and bottom substrate interfaces with high crystallinity and desired orientation. This finding led to the preparation of a TIPS-pentacene/PalphaMS blend active layer with superior performance characteristics (field-effect mobility, on/off ratio, and threshold voltage) over those of neat TIPS-pentacene, as well as the solution-processability of technologically attractive bottom-gate/bottom-contact OTFT devices.
authors: Department of Chemistry, Seoul National University, Seoul, 151-747, Korea.
authors: Jihoon
authors: J
authors: Kang
authors: Nayool
authors: N
authors: Shin
authors: Do Young
authors: DY
authors: Jang
authors: Vivek M
authors: VM
authors: Prabhu
authors: Do Y
authors: DY
authors: Yoon
mesh_terms: D017646:Organosilicon Compounds / Q000737:chemistry*; D011137:Polystyrenes / Q000737:chemistry*; D013329:Structure-Activity Relationship; D013343:Styrenes / Q000737:chemistry; D014173:Transistors, Electronic; D014961:X-Ray Diffraction
chemical_list: D017646:Organosilicon Compounds; D011137:Polystyrenes; D013343:Styrenes; C522282:bis(triisopropylsilylethynyl)pentacene; C027142:vinyltoluene