Nanometre resolution using high-resolution scanning electron microscopy corroborated by atomic force microscopy.
The resolving power of high-resolution scanning electron microscopy was judged using topographical height data from atomic force microscopy in order to assess the technique as a tool for understanding nanoporous crystal growth.
Stevens
Sam M
SM
Centre for Nanoporous Materials, School of Chemistry, The University of Manchester, Chemistry Building, Oxford Road, Manchester, UK. sammichaelstevens@mac.com
Cubillas
Pablo
P
Jansson
Kjell
K
Terasaki
Osamu
O
Anderson
Michael W
MW
Wright
Paul A
PA
Castro
María
M