title: Improved sectioning in a slit scanning confocal microscope.
abstract: We describe a simple implementation of a slit scanning confocal microscope to obtain an axial resolution better than that of a point-scanning confocal microscope. Under slit illumination, images of a fluorescent object are captured using an array detector instead of a line detector so that out-of-focus light is recorded and then subtracted from the adjacent images. Axial resolution after background subtraction is 2.2 times better than the slit confocal resolution, and out-of-focus image suppression is calculated to attenuate with defocus faster by 1 order of magnitude than in the point confocal case.
authors: Photonics Group, Blackett Laboratory, Department of Chemistry, Imperial College London, London, UK. vincent.poher03@imperial.ac.uk
authors: Vincent
authors: V
authors: Poher
authors: Gordon T
authors: GT
authors: Kennedy
authors: Hugh B
authors: HB
authors: Manning
authors: Dylan M
authors: DM
authors: Owen
authors: Haoxiang X
authors: HX
authors: Zhang
authors: Erdan
authors: E
authors: Gu
authors: Martin D
authors: MD
authors: Dawson
authors: Paul M W
authors: PM
authors: French
authors: Mark A A
authors: MA
authors: Neil
mesh_terms: D000465:Algorithms; D004867:Equipment Design; D005453:Fluorescence; D005456:Fluorescent Dyes / Q000494:pharmacology; D007091:Image Processing, Computer-Assisted / Q000379:methods*; D018613:Microscopy, Confocal / Q000295:instrumentation* / Q000379:methods*; D015233:Models, Statistical; D011058:Pollen / Q000737:chemistry; D015203:Reproducibility of Results; D013382:Subtraction Technique
chemical_list: D005456:Fluorescent Dyes