Removal of the eye-blink artifacts from EEGs via STF-TS modeling and robust minimum variance beamforming.
A novel scheme for the removal of eye-blink (EB) artifacts from electroencephalogram (EEG) signals based on a novel space-time-frequency (STF) model of EEGs and robust minimum variance beamformer (RMVB) is proposed. In this method, in order to remove the artifact, the RMVB is provided with a priori information, namely, an estimation of the steering vector corresponding to the point source EB artifact. The artifact-removed EEGs are subsequently reconstructed by deflation. The a priori knowledge, the vector corresponding to the spatial distribution of the EB factor, is identified using the STF model of EEGs, provided by the parallel factor analysis (PARAFAC) method. In order to reduce the computational complexity present in the estimation of the STF model using the three-way PARAFAC, the time domain is subdivided into a number of segments, and a four-way array is then set to estimate the STF-time/segment (TS) model of the data using the four-way PARAFAC. The correct number of the factors of the STF model is effectively estimated by using a novel core consistency diagnostic- (CORCONDIA-) based measure. Subsequently, the STF-TS model is shown to closely approximate the classic STF model, with significantly lower computational cost. The results confirm that the proposed algorithm effectively identifies and removes the EB artifact from raw EEG measurements.
Nazarpour
Kianoush
K
Centre of Digital Signal Processing, School of Engineering, Cardiff University, Cardiff CF24 3AA, UK. NazarpourK@cf.ac.uk
Wongsawat
Yodchanan
Y
Sanei
Saeid
S
Chambers
Jonathon A
JA
Oraintara
Soontorn
S
D000465:Algorithms; D016477:Artifacts; D001767:Blinking / Q000502:physiology*; D003198:Computer Simulation; D003936:Diagnosis, Computer-Assisted / Q000379:methods*; D004569:Electroencephalography / Q000379:methods*; D006801:Humans; D008954:Models, Biological; D008959:Models, Neurological; D015203:Reproducibility of Results; D012680:Sensitivity and Specificity; D012815:Signal Processing, Computer-Assisted