Near-edge x-ray absorption fine-structure investigation of graphene.
We report the near-edge x-ray absorption fine-structure (NEXAFS) spectrum of a single layer of graphite (graphene) obtained by micromechanical cleavage of highly ordered pyrolytic graphite on a SiO2 substrate. We utilized a photoemission electron microscope to separately study single-, double-, and few-layers graphene samples. In single-layer graphene we observe a splitting of the pi resonance and a clear signature of the predicted interlayer state. The NEXAFS data illustrate the rapid evolution of the electronic structure with the increased number of layers.
Pacilé
D
D
Istituto Nazionale di Fisica Nucleare (INFN) and Dipartimento di Fisica Università della Calabria, 87036 Arcavacata di Rende, Cosenza, Italy. dpacile@fis.unical.it
Papagno
M
M
Rodríguez
A Fraile
AF
Grioni
M
M
Papagno
L
L
Girit
C O
CO
Meyer
J C
JC
Begtrup
G E
GE
Zettl
A
A