title: Near-edge x-ray absorption fine-structure investigation of graphene.
abstract: We report the near-edge x-ray absorption fine-structure (NEXAFS) spectrum of a single layer of graphite (graphene) obtained by micromechanical cleavage of highly ordered pyrolytic graphite on a SiO2 substrate. We utilized a photoemission electron microscope to separately study single-, double-, and few-layers graphene samples. In single-layer graphene we observe a splitting of the pi resonance and a clear signature of the predicted interlayer state. The NEXAFS data illustrate the rapid evolution of the electronic structure with the increased number of layers.
authors.affiliation: Istituto Nazionale di Fisica Nucleare (INFN) and Dipartimento di Fisica Università della Calabria, 87036 Arcavacata di Rende, Cosenza, Italy. dpacile@fis.unical.it
authors.forename: D
authors.initials: D
authors.lastname: Pacilé
authors.forename: M
authors.initials: M
authors.lastname: Papagno
authors.forename: A Fraile
authors.initials: AF
authors.lastname: Rodríguez
authors.forename: M
authors.initials: M
authors.lastname: Grioni
authors.forename: L
authors.initials: L
authors.lastname: Papagno
authors.forename: C O
authors.initials: CO
authors.lastname: Girit
authors.forename: J C
authors.initials: JC
authors.lastname: Meyer
authors.forename: G E
authors.initials: GE
authors.lastname: Begtrup
authors.forename: A
authors.initials: A
authors.lastname: Zettl