Dynamic fatigue behavior of dental porcelain modified by surface deposition of a YSZ thin film.
OBJECTIVE
The objective of this study was to evaluate the basic fatigue parameters of a dental porcelain modified by deposition of a yttria-stabilized zirconia (YSZ) thin film and to compare the data to that of an unmodified control.


METHODS
Two hundred bars (2 x 2 x 15 mm(3)) were cut from ProCAD blocks. Specimens were wet-polished with 1200-grit SiC abrasive. One surface of each bar was sandblasted with 50 microm Al2O3 abrasive (50 psi). Half the specimens were further modified through deposition of a 3-microm YSZ thin film on the sandblasted surface. Depositions were performed using an radio frequency magnetron sputter system (working pressure of 15 mT, 150 degrees C, 30:1 Ar:O2 gas ratio). Specimens were tested at different stressing rates: 5.0, 0.1, and 0.01 MPa/s (n = 25/group) in deionized water (37 degrees C), and inert strength was determined in air (25 degrees C, 70 MPa/s). All strength measurements were carried out by three-point bending (span = 10 mm) in a servo-electric test system.


RESULTS
The mean flexural strength values (MPa) and standard deviation for the uncoated sandblasted group were: 98.6 (5.5), 90.7 (5.9), and 84.2 (8.5), and for the sandblasted + YSZ thin film group: 125 (9.4), 119.3 (7.8), and 102.8 (7.0), for the highest to the lowest stressing rates, respectively. The fatigue parameters n and lnB were calculated by linear regression of dynamic fatigue data. For the uncoated group, n = 38 and lnB = 4.7 MPa(2)/s, and for the coated group, n = 33 and lnB = 10.8 MPa(2)/s. Weibull analysis was also performed showing that the characteristic parameter (sigma(o)) was 113.3 and 125.7 MPa for the uncoated and coated group, respectively.


CONCLUSIONS
There was an increase in strength for specimens modified by application of a YSZ thin film. It is hypothesized that thin-film application modifies flaws or residual surface stress states.
Teixeira
Erica C
EC
Curriculum in Applied and Materials Sciences, University of North Carolina, Chapel Hill, NC, USA.
Piascik
Jeffrey R
JR
Stoner
Brian R
BR
Thompson
Jeffrey Y
JY